The present invention relates to a scraper (14) for scraping a surface of a machine tool having a wear-indicating device (18, 20, 24, 30) for the scraper lip (16) of the scraper. At least one signal line (18) is embedded in the scraper lip (16) in such a manner that, upon reaching the wear limit (G), at least one section of the signal line (18) is exposed.

The present invention relates to a scraper (14) for scraping a surface of a machine tool having a wear-indicating device (18, 20, 24, 30) for the scraper lip (16) of the scraper. At least one signal line (18) is embedded in the scraper lip (16) in such a manner that, upon reaching the wear limit (G), at least one section of the signal line (18) is exposed.

A reconditioning apparatus for an endoscope including a controller configured to: supply an interior of the endoscope with a fluid at a predefined pressure; supply one or more channels of the endoscope and an exterior of the endoscope with a rinsing liquid to carry out a reconditioning process using the rinsing liquid; concurrently with the supplying of the rinsing liquid, determine a temperature and a pressure in the interior of the endoscope during the reconditioning process; and when the determined pressure decreases lower than a predetermined pressure: identify the endoscope as not defective, when the decrease in the determined pressure is preceded by a corresponding decrease in the determined temperature, and identify the endoscope as defective, when the decrease in the determined pressure is not preceded by a corresponding decrease in the determined temperature.

A reconditioning apparatus for an endoscope including a controller configured to: supply an interior of the endoscope with a fluid at a predefined pressure; supply one or more channels of the endoscope and an exterior of the endoscope with a rinsing liquid to carry out a reconditioning process using the rinsing liquid; concurrently with the supplying of the rinsing liquid, determine a temperature and a pressure in the interior of the endoscope during the reconditioning process; and when the determined pressure decreases lower than a predetermined pressure: identify the endoscope as not defective, when the decrease in the determined pressure is preceded by a corresponding decrease in the determined temperature, and identify the endoscope as defective, when the decrease in the determined pressure is not preceded by a corresponding decrease in the determined temperature.

An embodiment provides a deposition apparatus, including: a process chamber; a residual gas analyzer connected to the process chamber; a cleansing gas supplier connected to the process chamber; and a driver that is connected to the residual gas analyzer and the cleansing gas supplier and controls the residual gas analyzer and the cleansing gas supplier.

An embodiment provides a deposition apparatus, including: a process chamber; a residual gas analyzer connected to the process chamber; a cleansing gas supplier connected to the process chamber; and a driver that is connected to the residual gas analyzer and the cleansing gas supplier and controls the residual gas analyzer and the cleansing gas supplier.

A self-vibrating pH probe comprise a housing containing an electronic assembly to which is coupled a vibration source element so that at least a portion of vibrations caused by the vibration source element propagate to the electronic assembly, the vibration source element being controllable for at least on/off operation. The self-vibrating pH probe further comprising a pH probe member having a probe tip at a first end, the probe member extending from the housing and mechanically and electrically coupled by a second end to the electronic assembly so that at least a portion of vibrations propagating to the electronic assembly further propagate to the probe tip; and further including a processor coupled to the electronic assembly for coordinating operation of the vibration source element and operation of the pH probe member.

A self-vibrating pH probe comprise a housing containing an electronic assembly to which is coupled a vibration source element so that at least a portion of vibrations caused by the vibration source element propagate to the electronic assembly, the vibration source element being controllable for at least on/off operation. The self-vibrating pH probe further comprising a pH probe member having a probe tip at a first end, the probe member extending from the housing and mechanically and electrically coupled by a second end to the electronic assembly so that at least a portion of vibrations propagating to the electronic assembly further propagate to the probe tip; and further including a processor coupled to the electronic assembly for coordinating operation of the vibration source element and operation of the pH probe member.

A system may monitor usage of a cleaning chemical and indicate when the chemical has expired and needs to be replaced. In some examples, the system includes a reservoir containing the chemical and a sensor associated with the reservoir that can detect user interaction with the chemical in the reservoir. The system may track an amount of time until the chemical in the reservoir is deemed to have expired and provide a user alert indicating expiration of the chemical. The system can control the amount of time remaining until the chemical is deemed to have expired based on the detected addition of the object to the reservoir.

A plasma system and a filter device are provided. In the system, an area surrounded by a dielectric window is configured as a first chamber for accommodating plasma. A first adapter is arranged under the dielectric window. An area surrounded by the first adapter is configured as a second chamber. A lower electrode platform is placed in the second chamber to carry a workpiece. A filter member of the filter device is placed at an intersection of the first chamber and the second chamber. The filter member includes through-holes configured to filter ions from the plasma. A first extension member extends from the filter member in a first direction and is placed over the first adapter. A second extension member extends from a position of the filter member adjacent to the first extension member to an inner side of the first adapter.