A phase-resolved heterodyne shearing interferometer has been developed for high-rate, whole field observations of transient surface motion. The sensor utilizes polarization multiplexing and multiple carrier frequencies to separate each segment of a shearing Mach-Zehnder interferometer. Post-processing routines have been developed to recombine the segments by extracting the scattered object phase from Doppler shifted intermediate carrier frequencies, providing quantitative relative phase changes and information to create variable shear, phase resolved shearographic fringe patterns without temporal or spatial phase shifting.

A light sensing device, according to an embodiment, for sensing light emitted from a light source, and reflected or scattered from an object comprises: a light transmitting member; and a light sensing unit disposed on the light transmitting member, wherein the light sensing unit comprises: a light transmitting region; a first electrode layer; a semiconductor layer; and a second electrode layer, wherein the semiconductor layer comprises: a first semiconductor layer disposed around the light-transmitting region; and a second semiconductor layer disposed outside the first semiconductor layer.

A characterization device, system, and method for characterizing reflective elements from the light beams reflected in it. The device has two variable-gain detectors on a common structure, which can be portable or fixed, and for capturing light beams reflected by a reflective element, and from at least one processor characterizing the quality of the reflected light beams and evaluating the quality of the reflective element from its reflective capacity. Each detector has a lens for increasing the signal-to-noise ratio of the reflected beam or beams, a light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor, and a data communication device associated with the device itself. A characterization system and a characterization method for characterizing reflective elements from the quality of the light beams reflected in at least one reflective element or heliostat.

A characterization device, system, and method for characterizing reflective elements from the light beams reflected in it. The device has two variable-gain detectors on a common structure, which can be portable or fixed, and for capturing light beams reflected by a reflective element, and from at least one processor characterizing the quality of the reflected light beams and evaluating the quality of the reflective element from its reflective capacity. Each detector has a lens for increasing the signal-to-noise ratio of the reflected beam or beams, a light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor, and a data communication device associated with the device itself. A characterization system and a characterization method for characterizing reflective elements from the quality of the light beams reflected in at least one reflective element or heliostat.

An optical apparatus includes a diffractive optical element (DOE), having at least one optical surface, a side surface, which is not parallel to the at least one optical surface of the DOE, and a grating, which is formed on the at least one optical surface so as to receive and diffract first radiation from a primary radiation source that is incident on the grating. The apparatus further includes at least one secondary radiation source, which is configured to direct second radiation to impinge on the side surface, causing at least part of the second radiation to propagate within the DOE while diffracting internally from the grating and to exit through the side surface. The apparatus also includes at least one radiation detector, which is positioned so as to receive and sense an intensity of the second radiation that has exited through the side surface.

Provided is an interferometer for inspecting a test sample. The interferometer includes: a light source for providing a light beam; a beam splitting element, splitting the light beam into first and second incident light, wherein the first incident light is reflected by the test sample into first reflection light; a reflecting element, reflecting the second incident light into second reflection light; an optical detection element, receiving the first and the second reflection light into an interference signal; and a signal processing module, coupled to the optical detection element, for performing spatial differential calculation on the interference signal to generate a demodulation image of the test sample.

Provided is an interferometer for inspecting a test sample. The interferometer includes: a light source for providing a light beam; a beam splitting element, splitting the light beam into first and second incident light, wherein the first incident light is reflected by the test sample into first reflection light; a reflecting element, reflecting the second incident light into second reflection light; an optical detection element, receiving the first and the second reflection light into an interference signal; and a signal processing module, coupled to the optical detection element, for performing spatial differential calculation on the interference signal to generate a demodulation image of the test sample.

The present disclosure relates to a method for imaging an optical signal received by a graded index (GRIN) optical element to account for known variations in a graded index distribution of the GRIN optical element. The method may involve using a plurality of optical detector elements to receive optical rays received by the GRIN optical element at a plane, where the plane forms a part of the GRIN optical element or is downstream of the GRIN optical element relative to a direction of propagation of the optical rays. The optical rays are then traced to a plurality of additional specific locations on the plane based on the known variations in the graded index distribution of the GRIN optical element. A processor may be used to determine information on both an intensity and an angle of the received optical rays at each one of the plurality of specific locations on the plane of the GRIN optical element.

An optical wavefront testing system includes a light source, an image capturing unit and a processing unit. The image capturing unit includes a lens array and a sensor module that is configured to detect light rays passing through an optical element and the lens array. The processing unit controls the sensor module to detect the light rays under a plurality exposure conditions for generating a plurality of images each including a plurality of light spots, obtains a plurality of light spot datasets corresponding to the light spots and each including a plurality of pixel coordinate sets and a plurality of pixel values, and obtains wavefront information associated with the light spots based on the light spot datasets of at least two of the images.

An optical module applied to a fiber optic sensor. The optical module comprises a housing (11), a circuit board (12) installed in the housing (11) and a digital-to-analog conversion circuit (121), a light source control circuit (122) and an electro-optic conversion unit (123) installed on the circuit board (12) and sequentially and electrically connected. Also installed on the circuit board (12) and sequentially and electrically connected are an opto-electronic conversion unit (124), a signal filter amplification circuit (125) and an analog-to-digital conversion circuit (126), and a circuit interface (127) installed on the circuit board (12) is separately and electrically connected to the digital-to-analog conversion circuit (121) and the analog-to-digital conversion circuit (126) respectively. The optical module enables control of a fiber optic sensor and modularization of acquisition circuits, thus providing an application system for a fiber optic sensor with a simple and low-cost structure.