A classification apparatus includes: a specifying unit integrated with a neural network that has been trained to classify a state of a space using information indicating a light projection pattern and information indicating a light reception pattern; a light projection information acquisition unit configured to acquire information indicating a light projection pattern of light projected into a predetermined space, and output the acquired information to the specifying unit; and a light receiving unit configured to acquire information indicating a light reception pattern of light received from the predetermined space, and output the acquired information to the specifying unit, wherein the specifying unit outputs a classification result of classifying a state of the predetermined space, based on the information indicating the light projection pattern acquired by the light projection information acquisition unit and on the information indicating the light reception pattern of the light received by the light receiving unit.

The invention presented utilizes laser points and/or lines and one or more rear-view optical sensors. The points and lines are projected on the front face of the trailer. The optical sensors capture images of the projected laser points and lines. A controller with memory holding logics processes them to find position and orientation of the trailer front face. The laser device projects laser points or lines on the front face of the trailer or the desired structure. The optical sensors capture images of the laser points and lines. The images are read by a controller that extracts the laser lines and points from the images, The controller then estimates the position and orientation of the trailer or the desired structure from the extracted points and lines. In addition, the system analyzes image of the front face of the trailer and determine the trailer type to determine if any adjustment to backward driving is needed or even if the hauler is compatible with trailer and capable of hitching the trailer at all. The presented invention is a non-invasive technique and so, the trailer face front is left intact.

An eyeball detection unit of the present disclosure includes an irradiator that projects substantially parallel illumination light toward a cornea of an eyeball, a detector that detects light intensity of reflected light from the cornea, and a detection controller that identifies a centroid offset in an angular direction of the light intensity of the reflected light from the cornea with respect to a reference optical axis on the basis of a detected value by the detector, and thereafter calculates a positional offset of a cornea position with respect to the reference optical axis.

A parameter adjustment device (500) adjusts a parameter relating to control of laser light emitted from a measurement sensor (210) onto an object. A parameter calculator (520) calculates the parameter by applying, to a trained model generated through machine learning using training data sets each including waveform data of an amount of light received by the measurement sensor (210) and data indicating the parameter used to acquire the waveform data, waveform data newly acquired in a new state. The parameter calculated by the parameter calculator (520) enables measurement of the object using the measurement sensor (210) in the new state. A parameter outputter (530) outputs data indicating the parameter calculated by the parameter calculator (520).

It is an object of the present invention to provide a measuring apparatus capable of easily restoring the tracking state when the tracking state of the target is interrupted. One aspect of the present invention is a measuring apparatus that emits a light beam toward a target, captures and tracks the target, and measures the three-dimensional coordinates of the target. The measuring apparatus includes: a light source for emitting light beam; an angle control unit for controlling the emission angle of the light beam emitted from the light source so as to track the moving target; an imaging unit for capturing the target or the vicinity of the target, and a recognition unit for recognizing the target or the specific portion including the target from an image captured by the imaging unit. The angle control unit controls the emission angle of the light beam so as to emit light beam toward the target or the specific portion including the target recognized by the recognition unit when the tracking of the target is released.

A measurement probe of the present disclosure that scans a surface of a measurement object to measure a three-dimensional shape or the like of the surface of the measurement object includes a first movable portion having a stylus, a second movable portion that is connected to the first movable portion to be movable in a Z direction, a third movable portion that is connected to the second movable portion to be movable in the Z direction, a first position measurer that measures a first position of the first movable portion in the Z direction, a second position measurer that measures a second position of the second movable portion in the Z direction, and a third position measurer that measures a third position of the third movable portion in the Z direction. A first relative position is calculated based on the first position and the second position. A second relative position is calculated based on the first position and the third position. The first relative position of the second movable portion with respect to the first movable portion in the Z direction and the second relative position of the third movable portion with respect to the first movable portion in the Z direction are maintained constant.

A workpiece holder is configured to hold a workpiece and is utilized in a metrology system which includes a sensing configuration for obtaining 3-dimensional surface data for the workpiece. The workpiece holder includes at least three reference features (e.g., spherical reference features extending from sides) that are configured to be sensed by the sensing configuration when the workpiece holder is in different orientations (e.g., as rotated 180 degrees between first and second orientations for presenting front and back sides of the workpiece towards the sensing configuration). A determination of 3-dimensional positions of the reference features for each orientation enables a combining (e.g., in a common coordinate system) of 3-dimensional surface data that is acquired for the workpiece in each orientation. Interchangeable workpiece holding portions may be provided that fit within the workpiece holder for holding workpieces with different characteristics (e.g., having different sizes and/or shapes).

The invention relates to a method and to an assembly (200) for localizing an optical coupling point (11) and to a method for producing a microstructure (100) at the optical coupling point (11). The method for localizing an optical coupling point (11) comprises the following steps: a) providing an optical component (10), which comprises an optical coupling point (11), the optical coupling point having an interaction region (15) lying outside of a volume encompassed by the optical component (10); b) producing optical radiation in a production region (120), the production region (120) overlapping at least partly with the interaction region (15) of the optical coupling point (11), light being applied to a medium (19) located in the production region (120), which light is modified by the medium (19) in such a way that the optical radiation is thereby produced; c) sensing at least part of the produced optical radiation in a sensing region (130), the sensing region (130) overlapping at least partly with the interaction region (15) of the optical coupling point (11), and determining a spatially resolved distribution of the sensed part of the produced optical radiation; and d) determining the localization of the optical coupling point (11) from the determined spatially resolved distribution of the sensed part of the produced optical radiation, the optical radiation being produced or at least the part of the produced optical radiation being sensed through the optical coupling point (11). The optical coupling point (11) can thereby be precisely localized with a relative positioning tolerance of better than 1 μm. Thus, low coupling losses of an optical connection to the optical component (10) can be achieved and microstructures (100) can be precisely placed at the optical coupling point (11).

The present disclosure relates to a semiconductor mark and a forming method thereof. The semiconductor mark comprises: a previous layer mark comprising first patterns and at least one second pattern, the second pattern being located between adjacent first patterns, the first pattern being different from the second pattern in material property. Since the first pattern and the second pattern in the previous layer mark in the semiconductor mark according to the present disclosure are different in material property, during measurement, the first pattern and the second pattern are different in reflectivity for measurement light. Thus, the contrast of images of the first pattern and the second pattern obtained during measurement is improved, the positions and boundaries of the first pattern and the second pattern are clearly determined, and the measurement of the previous layer mark is more accurate.

A high-precision marker, which is easy to manufacture, has a base material layer, a first layer which is laminated onto one surface of the base material layer, and which is observed in a first color, and a second layer which is partially laminated onto the first layer, is observed in a second color different from the first color, and partially conceals the first layer, wherein the first layer is observable in a region in which the second layer is not laminated, and the second layer is formed by a resist material.