A sensor may be automatically calibrated during manufacture by providing a sensor processing unit having an integrated sensor, performing a check to determine if the integrated sensor has been previously calibrated upon a reset. When it has been determined the integrated sensor has not been previously calibrated, an automated calibration pattern may be imparted to the sensor so that a calibration parameter is determined.

A sensor may be automatically calibrated during manufacture by providing a sensor processing unit having an integrated sensor, performing a check to determine if the integrated sensor has been previously calibrated upon a reset. When it has been determined the integrated sensor has not been previously calibrated, an automated calibration pattern may be imparted to the sensor so that a calibration parameter is determined.

Embodiments of the present disclosure include methods, apparatuses, systems, and computer program product for enabling multi-point shunt calibration of a sensor device. Multi-point shunt calibration provides at least a first, second, and third simulated calibration output, each simulated calibration output corresponding to an actual reading value and an expected reading value. The simulated calibration outputs are associated with a predefined output sequence, where each simulated calibration output is separated from an adjacent simulated calibration output by an output step size. Some embodiments are configured for automatically outputting each simulated calibration output for a particular period of time before outputting an adjacent simulated calibration output in the predefined output sequence. The various simulated calibration outputs, actual reading values, and/or expected values may be used in determining calibrated reading values for the sensor device.

Various embodiments are directed to improvements in the design of optical and/or motion sensors and the architecture and implementation of systems that contain such sensors to enable the physical size of such sensors and systems to be dramatically reduced and to enable the implementation of such systems to be dramatically simplified. This has applications in the design and manufacture of electronic devices containing such sensors, with direct impacts to many market segments, including, without limitation, augmented reality, virtual reality, autonomous vehicles, security, and the like.

A capacitive detection device that may include at least one electrode of a capacitive sensor, an alternating voltage source, a device for measuring a complex value of impedance or admittance between the detection electrode and an electrical circuit reference point and a calibration resistor, and a switching device arranged so as to connect the voltage source to the electrode, in the measurement mode, and to connect the voltage source to the calibration resistor and disconnect the voltage source from the electrode, in the calibration mode. The measuring device is arranged so as to measure a first complex value of the calibration resistor, during operation in the calibration mode; to measure a second complex value between the electrode and the electrical circuit reference point during operation in measurement mode, and to correct the second measured complex value according to the first measured complex value.

A capacitive detection device that may include at least one electrode of a capacitive sensor, an alternating voltage source, a device for measuring a complex value of impedance or admittance between the detection electrode and an electrical circuit reference point and a calibration resistor, and a switching device arranged so as to connect the voltage source to the electrode, in the measurement mode, and to connect the voltage source to the calibration resistor and disconnect the voltage source from the electrode, in the calibration mode. The measuring device is arranged so as to measure a first complex value of the calibration resistor, during operation in the calibration mode; to measure a second complex value between the electrode and the electrical circuit reference point during operation in measurement mode, and to correct the second measured complex value according to the first measured complex value.

A method may include receiving, by a calibration circuit, an output of a subsystem comprising the sensor and the analog front end. The method may further include separating the output individually into the sensor offset and the amplifier offset by using inherent properties of separate frequency ranges for the sensor offset and the amplifier offset. The method may also include calibrating, by the calibration circuit, the sensor offset by determining a first calibration value for the sensor offset such that the output approximates zero during an idle-channel condition. The method may additionally include calibrating, by the calibration circuit, the amplifier offset by determining a second calibration value for the amplifier offset such that the output approximates zero during the idle-channel condition.

A method may include receiving, by a calibration circuit, an output of a subsystem comprising the sensor and the analog front end. The method may further include separating the output individually into the sensor offset and the amplifier offset by using inherent properties of separate frequency ranges for the sensor offset and the amplifier offset. The method may also include calibrating, by the calibration circuit, the sensor offset by determining a first calibration value for the sensor offset such that the output approximates zero during an idle-channel condition. The method may additionally include calibrating, by the calibration circuit, the amplifier offset by determining a second calibration value for the amplifier offset such that the output approximates zero during the idle-channel condition.

A method for determining a rotation angle of a magnet includes measuring a 3D magnetic field vector of a magnetic field generated by the magnet, wherein the 3D magnetic field vector describes at least a part of an ellipse in 3D space during a rotational movement of the magnet. The method further includes mapping the measured 3D magnetic field vector to a 2D vector based on a compensation mapping, wherein the compensation mapping is configured to map the ellipse in 3D space to a circle in 2D space. The method further includes determining the rotation angle of the magnet based on the 2D vector.

A method for determining a rotation angle of a magnet includes measuring a 3D magnetic field vector of a magnetic field generated by the magnet, wherein the 3D magnetic field vector describes at least a part of an ellipse in 3D space during a rotational movement of the magnet. The method further includes mapping the measured 3D magnetic field vector to a 2D vector based on a compensation mapping, wherein the compensation mapping is configured to map the ellipse in 3D space to a circle in 2D space. The method further includes determining the rotation angle of the magnet based on the 2D vector.