G01G23/00

Automatic Large-Mass-Weight Handling System

An automatic large-mass-weight handling system comprises: a weight picking device (10) configured for picking up and holding a large-mass-weight (75); a driving device (80) for providing a driving power; a weight transferring device (50) comprising a first horizontal rail (52) and a vertical rail (62) assembled to the first horizontal rail (52) in a way of being movable along the first horizontal rail (52), the first horizontal rail (52) extending in a first horizontal direction, the vertical rail (62) extending in a vertical direction perpendicular to the first horizontal direction, and the weight picking device (10) being assembled to the vertical rail (62); and a control unit for controlling the movement of the weight picking device (10); wherein the control unit controls the driving device (80) in a way that the weight picking device (10) is able to be moved automatically in the first horizontal direction and is able to be moved automatically in the vertical direction.

Swivel foot assembly for a force plate or balance plate
11262231 · 2022-03-01 · ·

A swivel foot assembly for a force plate or balance plate is disclosed herein. The swivel foot assembly includes a foot attachment component including a stem portion and a body portion, the stem portion of the foot attachment component configured to be attached to a force plate or balance plate; and a foot base component including a receptacle for receiving the body portion of the foot attachment component, the foot base component configured to be disposed on a support surface. The swivel foot assembly is configured to accommodate an uneven support surface on which a force plate or balance plate is disposed so that a force measurement accuracy of the force plate or balance plate is not adversely affected by stresses resulting from the uneven support surface.

COMBINATION WEIGHING DEVICE
20170305684 · 2017-10-26 · ·

To provide a highly reliable combination weighing device having an object supply chute disposed above a dispersion section, which can prevent foreign matter from being mixed into objects due to the falling of screw members from a support frame supporting the object supply chute. A combination weighing device is provided with a dispersion section, weighing hoppers, a control unit, an object supply chute (150), and a support frame (100). The dispersion section disperses and supplies objects around the dispersion section. The weighing hoppers are arranged around the dispersion section. The control unit performs combination calculation based on weighing values in the weighing hoppers. The object supply chute is placed above the dispersion section and supplies the objects to the dispersion section. The support frame supports the object supply chute. The support frame includes members (111, 113, and 114) as engaged members, hooks as engaging members that engage with the engaged members, and fixing members (140) as non-screw members. The fixing members press the engaging members against the engaged members and fix the engaging members to the engaged members.

MASS MEASUREMENT DEVICE
20170284855 · 2017-10-05 ·

A mass measurement device comprises a force sensor, a hose, a base part, an article-holding part, and a computation unit. The force sensor has a fixed end and a free end, and outputs a sensing signal in accordance with the magnitude of a force in a sensitivity direction. The hose is configured to pass suctioned air through it. The fixed end is fixed to the base part. The article-holding part is fixed to the free end, one end of the hose is connected to the article-holding part, and the article-holding part holds an article by air suction. The computation unit computes the mass of the article based on the sensing signal.

FORCE SENSOR USING DISPLACEMENT AMPLIFICATION MECHANISM AND APPARATUS HAVING THE SAME FOR MEASURING WEIGHT
20170241827 · 2017-08-24 · ·

Disclosed is a force sensor and an apparatus having the sensor for measuring weight. The force sensor and apparatus can enhance detection sensitivity by amplifying a displacement of an elastic body having high strength, thereby measuring weight. The sensor includes: a base; an elastic structure provided as a housing disposed on the base, and downwardly deformed when weight is applied to the elastic structure; an adjusting member coupled to an upper surface of the elastic structure by penetrating the upper surface; a lever disposed below the elastic structure, and amplifying a displacement of the elastic structure transferred via the adjusting member by being in contact with the adjusting member; a sensor disposed above the base, and generating an electric signal indicative of a distance from the sensor to the lever; and a circuit board disposed between an upper surface of the base and a lower surface of the sensor.

APPARATUS AND METHOD TO NEUTRALIZE STATIC ELECTRICITY PRESENT ON THE SURFACE OF CONTAINERS AND/OR CONTAINER-HOLDING TRAYS
20220312576 · 2022-09-29 ·

Apparatus to neutralize static electricity present on the surface of containers (100; 10′) and/or of nests (200; 300) comprising a plurality of seatings (212; 312) according to a positioning matrix (M1) and able to receive, resting on them, an ordered group of said containers (100; 100), wherein the apparatus comprises an extraction member (15) configured to engage at least one part of said ordered group of containers (100; 100′), in order to perform at least one relative lifting movement with respect to the nest (200; 300) so as to at least partly extract the containers (100; 100′) engaged from the respective seatings (212; 312), and at least one ionizing device (19) configured to be relatively mobile with respect to the extracted containers and/or with respect to the nest (200; 300), while said group of containers (100; 100′) extracted is in said raised condition, along a path that develops in the proximity of the containers (100; 100′) extracted and/or in the proximity of said nest (200; 300), so as to ionize the surrounding space and neutralize static electricity present on the surface of the containers (100; 100′) in the raised condition and/or of the nest (200; 300).

APPARATUS AND METHOD TO NEUTRALIZE STATIC ELECTRICITY PRESENT ON THE SURFACE OF CONTAINERS AND/OR CONTAINER-HOLDING TRAYS
20220312576 · 2022-09-29 ·

Apparatus to neutralize static electricity present on the surface of containers (100; 10′) and/or of nests (200; 300) comprising a plurality of seatings (212; 312) according to a positioning matrix (M1) and able to receive, resting on them, an ordered group of said containers (100; 100), wherein the apparatus comprises an extraction member (15) configured to engage at least one part of said ordered group of containers (100; 100′), in order to perform at least one relative lifting movement with respect to the nest (200; 300) so as to at least partly extract the containers (100; 100′) engaged from the respective seatings (212; 312), and at least one ionizing device (19) configured to be relatively mobile with respect to the extracted containers and/or with respect to the nest (200; 300), while said group of containers (100; 100′) extracted is in said raised condition, along a path that develops in the proximity of the containers (100; 100′) extracted and/or in the proximity of said nest (200; 300), so as to ionize the surrounding space and neutralize static electricity present on the surface of the containers (100; 100′) in the raised condition and/or of the nest (200; 300).

METHOD AND APPARATUS FOR CONTROLLING THE TEMPERATURE OF A SEMICONDUCTOR WAFER
20220034708 · 2022-02-03 ·

A semiconductor wafer mass metrology method comprising: controlling the temperature of a semiconductor wafer by: detecting information relating to the temperature of the semiconductor wafer; and controlling cooling or heating of the semiconductor wafer based on the detected information relating to the temperature of the semiconductor wafer; wherein controlling the cooling or heating of the semiconductor wafer comprises controlling a duration of the cooling or heating of the semiconductor wafer; and subsequently loading the semiconductor wafer onto a measurement area of a semiconductor wafer mass metrology apparatus.

Load cell for weight measurement

The invention relates to a load cell for weight measurement with a load beam which has an overload protection. In order to achieve a cost-effective manufacture, it is provided that the overload protection has a bar, running parallel to the center plane of the load beam, which freely engages in a recess on the movable force application side of the load beam, with the result that there is an upper and a lower air gap between the bar and the force application side. In the case of an overload, the upper or the lower air gap is bridged and the force application side comes to rest against the bar, with the result that no further movement of the force application side relative to the stationary side of the load cell is possible.

SIGNAL PROCESSING DEVICE, CONTROL METHOD OF SIGNAL PROCESSING DEVICE, CONTROL PROGRAM AND RECORDING MEDIUM
20170219419 · 2017-08-03 · ·

The present invention reduces the time required by measuring a sensor object more than before. An input unit (10) includes an acquisition portion (11) that acquires a time sequence signal, a filter portion (12) that filters the time sequence signal according to a frequency, a forwarding portion (13) that forwards a filtered signal by frequency to a control device (90) and a filter switching portion (14). The filter switching portion (14) switches whether the filter portion (12) filters the time sequence signal according to a frequency in the process of acquiring the time sequence signal by the acquisition portion (11).