G01J4/00

Stress engineering of transparent materials

A method and system for stress engineering of a transparent material can include an imaging system that can visualize a spatial distribution of an internal stress in a transparent material, an actuator system that can induce stress in the transparent material, the actuator system comprising one or more actuator elements, and a feedback system that can communicate with the imaging system and the actuator system, and which can guide an internal stress distribution in the transparent material toward a preferred final state.

IMAGING METHOD AND PROGRAM

An imaging method of imaging a subject through a multispectral camera including a processor, includes: causing the processor to perform: a data acquisition step of acquiring first spectral data of a first subject, second spectral data of a second subject, and third spectral data of a third subject; a wavelength selection step of selecting a plurality of wavelengths from a wavelength region of the acquired first to third spectral data, the wavelength selection step being for determining, as a computational amount, a difference or a ratio between feature amounts of two pieces of spectral data, from among the first spectral data, the second spectral data, and the third spectral data, and obtaining computational amounts to select the plurality of wavelengths; and an imaging step of imaging a subject including at least one of the first subject, the second subject, or the third subject at the plurality of wavelengths.

Display device and optical inspection method for the same

A display device includes: a substrate; a display element layer disposed on the substrate, where the display element layer includes a light emitting element which emits light; a polarizing film disposed on the display element layer, where the polarizing film includes a first polarizer having a first absorption axis extending to a first direction and a first transmission axis extending to a second direction orthogonal to the first direction; and a first layer disposed on one surface of the polarizing film, where the first layer has a first phase difference. Light emitted from the display element layer has a polarizing axis, and an angle between the polarizing axis and one of the first absorption axis and the first transmission axis is in a range of about 25 degrees to about 65 degrees.

Multi-aperture polarization optical systems using beam splitters

An optical system includes: a beam splitter system configured to split an input beam into a plurality of output beams including a first output beam, a second output beam, and a third output beam; a first polarizing filter having a first polarization angle and configured to filter the first output beam to produce a first filtered output beam; a second polarizing filter having a second angle of polarization and configured to filter the second output beam to produce a second filtered output beam; and a third polarizing filter having a third angle of polarization and configured to filter the third output beam to produce a third filtered output beam, the first, second, and third angles of polarization being different from one another.

Method of determining refractive indices and surface properties of prism shaped material

Methodology of characterizing surface properties and determining refractive index and extinction coefficient of a prism shaped material, including simultaneously for a multiplicity of wavelengths, using an easy to practice technique.

POLARIZATION ANALYSIS APPARATUS AND CONTROL METHOD OF POLARIZATION ANALYSIS APPARATUS
20190302023 · 2019-10-03 ·

A polarization analysis apparatus includes: a light source that radiates light to a sample; a liquid crystal panel that outputs polarized light in a specific direction from light radiated from an excited state sample; an image sensor that measures a luminance of polarized light; and a controller that controls the liquid crystal panel and the image sensor. The controller calculates a reference voltage of a rectangular wave; calculates a corrected reference voltage by correcting the reference voltage in the rectangular wave where an absolute value of the reference voltage changes in response to a phase change; applies the reference voltage and the corrected reference voltage to the liquid crystal panel; operates the image sensor in accordance with a light exposure time to measure luminance of polarized light; and calculates a degree of polarization of the sample based on results of the measurement.

POLARIZATION ANALYSIS APPARATUS AND CONTROL METHOD OF POLARIZATION ANALYSIS APPARATUS
20190302023 · 2019-10-03 ·

A polarization analysis apparatus includes: a light source that radiates light to a sample; a liquid crystal panel that outputs polarized light in a specific direction from light radiated from an excited state sample; an image sensor that measures a luminance of polarized light; and a controller that controls the liquid crystal panel and the image sensor. The controller calculates a reference voltage of a rectangular wave; calculates a corrected reference voltage by correcting the reference voltage in the rectangular wave where an absolute value of the reference voltage changes in response to a phase change; applies the reference voltage and the corrected reference voltage to the liquid crystal panel; operates the image sensor in accordance with a light exposure time to measure luminance of polarized light; and calculates a degree of polarization of the sample based on results of the measurement.

Random wavelength meter

An optical system comprising a randomizer that has a plurality of randomly positioned scatterers for scattering and thereby randomizing light to generate a speckle pattern and a detector for detecting the speckle pattern to determine at least one property of the light and/or change in at least one property of the light.

Random wavelength meter

An optical system comprising a randomizer that has a plurality of randomly positioned scatterers for scattering and thereby randomizing light to generate a speckle pattern and a detector for detecting the speckle pattern to determine at least one property of the light and/or change in at least one property of the light.

SPATIAL FILTERING APPARATUS AND METHOD OF SPATIAL FILTERING USING THE SAME

A spatial filtering apparatus includes a composite filter including first filter patterns respectively having a first phase profile, and second filter patterns respectively having a second phase profile, wherein the first filter patterns and the second filter patterns overlap with each other, wherein first light in a first polarization direction that is emitted on the composite filter is first spatially filtered by the first filter patterns, and wherein second light in a second polarization direction that is emitted on the composite filter is second spatially filtered by the second filter patterns.