A system for sensing glucose concentration is provided and includes following components. A light source generates a light beam. The system may include a polarization state generator (PSG) for changing the polarization of the light beam, and then the light beam is emitted to a biological tissue. A polarization state analyzer (PSA) receives the light beam reflected from the biological tissue, and the received light beam is used to calculate Stokes vectors. A Mueller matrix is calculated according to the Stokes vectors. In some embodiments, the system includes an optical coherence tomography (OCT) in which the light beam is sensed by a detector for calculating the Mueller matrix. An optical rotation angle and a depolarization index are calculated in accordance with the differential Mueller matrix formalism. The glucose concentration is calculated in accordance with the optical rotation angle and the depolarization index.

This disclosure provides a method for preparing a precursor of a single dairy-lactone isomer, methods of preparing a single dairy-lactone isomer, and to the organoleptic uses thereof.

Methodology of characterizing pore size distribution in a porous thin film having a surface, or in a surface region of a porous semi-infinite bulk substrate having a surface, involving applying a mathematical model of a sample based on effective medium approaches, such as the Bruggeman effective medium approach.

This disclosure is generally directed to systems for imaging polarization properties of optical-material samples. As one aspect, there is provided a system for precise, simultaneous imaging of both the in-plane and out-of-plane birefringence properties of sample material over a wide range of incidence angles. The spatially resolved imaging approach described here is amenable to determination of a wide range of polarimetric properties, in addition to the in-plane and out-of-plane birefringence measure discussed as a preferred embodiment.

Disclosed are methods and apparatus for measuring and controlling polarization for inspection of a semiconductor sample. The method includes (i) setting up an inspection system in a specific mode of operation, (ii) incrementing a first waveplate of the system through a plurality of rotations while keeping a second waveplate of the system static, (iii) measuring an intensity signal from non-patterned areas of the sample for each rotation of the first waveplate, (iv) incrementing the second waveplate through a plurality of rotations while keeping the first waveplate static (v) measuring an intensity signal from non-patterned areas of the sample for each rotation of the second waveplate, (vi) generating a model of a plurality of polarization and waveplate parameters for the system to simulate the intensity signals that were measured for each rotation of the first and/or second waveplate, and (vii) determining the polarization and waveplate parameters for the system based on the model and a polarization state on photomask plane based on the polarization and waveplate parameters.

A polarimeter system integrated into an optical line system includes a transmitter coupled to a transmit filter communicatively coupled to an output port in an optical line device, wherein the transmitter is configured to generate a polarization probe signal, and wherein a wavelength of the polarization probe signal is configured to operate in-service with traffic-bearing channels on the output port; and a polarimeter receiver coupled to a receive filter communicatively coupled to an input port in the optical line device, wherein the polarimeter receiver is configured to vary arrangement of input light from the filter and to measure various outputs of the varied arrangement to derive measurement of State of Polarization (SOP) of the input light.

A polarimeter system integrated into an optical line system includes a transmitter coupled to a transmit filter communicatively coupled to an output port in an optical line device, wherein the transmitter is configured to generate a polarization probe signal, and wherein a wavelength of the polarization probe signal is configured to operate in-service with traffic-bearing channels on the output port; and a polarimeter receiver coupled to a receive filter communicatively coupled to an input port in the optical line device, wherein the polarimeter receiver is configured to vary arrangement of input light from the filter and to measure various outputs of the varied arrangement to derive measurement of State of Polarization (SOP) of the input light.

In a method for calibrating a polarization axis measuring device, both flat sides of a calibration element in a polarization axis measuring device are irradiated with polarized light, wherein the method involves aligning in each case at least one polarization direction of the light in a first and/or second rotational position with a principal axis in a predefined angular relationship with respect to a polarization axis of the calibration element. Determining the rotational position of an axis of the calibration element is carried out by determining an angle bisector between the first and second rotational positions of the polarization direction of the incident light. The method involves assigning a predefined angle value for the rotational position of the principal axis of the polarization direction for which the latter is in the predefined angular relationship with respect to the axis of the calibration element inserted as intended. Furthermore, the invention relates to a method for determining polarization axes of spectacle lenses, to a calibration element, and to a polarization axis measuring device comprising a calibration element.

A laser radar system capable of active polarization comprises a signal processing unit for sending a control signal; a laser emitting unit for emitting a first laser to a target after receiving the control signal, wherein the laser emitting unit comprises a liquid crystal polarization driver and a liquid crystal polarization component group, and the liquid crystal polarization driver controls a phase delay of the liquid crystal polarization component group to therefore change a polarized state of the first laser; and a laser receiving unit for receiving a second laser reflected off the target and analyzing polarization information of the second laser through the signal processing unit to evaluate surface characteristics of the target.

A polarization diffraction element comprising including a film including a liquid crystalline material having photosensitivity, the film having at least one hologram recorded therein, and thereby having a property as a fork-shaped polarization grating having an anisotropic structure in which an optical axis continuously rotates toward a direction of a grating vector.