Patent classifications
G01J4/00
Spoof-Resistant Facial Recognition Through Illumination and Imaging Engineering
Disclosed herein systems and methods of performing spoof resistant object recognition. In certain embodiments, a system for object recognition includes: an illumination device configured to illuminate an object; a sensor device, wherein the sensor device receives illumination light reflected off the object which includes polarization information; a processor; memory including programming executable by the processor to: calculate the polarization information from the illumination light; use the polarization information to determine whether the object is a real 3D object. It has been discovered that polarization information may be utilized to determine whether an object is a 3D object or a flat (2D) object. Thus, the polarization information may be utilized to differentiate from an image of a 3D object and a photograph of an object.
INTEGRATED POLARIMETER IN AN OPTICAL LINE SYSTEM
A polarimeter system integrated into an optical line system includes a transmitter coupled to a transmit filter communicatively coupled to an output port in an optical line device, wherein the transmitter is configured to generate a polarization probe signal, and wherein a wavelength of the polarization probe signal is configured to operate in-service with traffic-bearing channels on the output port; and a polarimeter receiver coupled to a receive filter communicatively coupled to an input port in the optical line device, wherein the polarimeter receiver is configured to vary arrangement of input light from the filter and to measure various outputs of the varied arrangement to derive measurement of State of Polarization (SOP) of the input light.
INTEGRATED POLARIMETER IN AN OPTICAL LINE SYSTEM
A polarimeter system integrated into an optical line system includes a transmitter coupled to a transmit filter communicatively coupled to an output port in an optical line device, wherein the transmitter is configured to generate a polarization probe signal, and wherein a wavelength of the polarization probe signal is configured to operate in-service with traffic-bearing channels on the output port; and a polarimeter receiver coupled to a receive filter communicatively coupled to an input port in the optical line device, wherein the polarimeter receiver is configured to vary arrangement of input light from the filter and to measure various outputs of the varied arrangement to derive measurement of State of Polarization (SOP) of the input light.
Unambiguous retardance measurement
This invention is directed to methods of unambiguously measuring the absolute retardance, δ.sub.A of an optical sample. A method for measuring absolute retardance of an optical sample includes directing light comprising a plurality of wavelengths through a polarization state generator source, the optical sample, and a polarization state analyzer, detecting, at an imaging device, retardance measurement light emanating from the optical sample after also passing through the polarization state analyzer at the plurality of wavelengths, determining a measurement retardance associated with the detected retardance measurement light at each of the wavelengths, and determining an absolute retardance associated with the optical sample based on the measurement retardances determined at each of the wavelengths.
Inspection device of display device and inspection method of display device
An inspection device of a display device includes a first illumination unit providing a first incident light to the display device at a first incident angle, a second illumination unit providing a second incident light to the display device at a second incident angle, a third illumination unit providing a third incident light to the display device at a third incident angle, and a defect detector receiving at least one of a first reflection light obtained from the first incident light reflected by the display device at a first reflection angle, a second reflection light obtained from the second incident light reflected by the display device at a second reflection angle, and a third reflection light obtained from the third incident light reflected by the display device at a third reflection angle to detect defects of the display device.
Long wave infrared imaging polarimeter, and method of assembly
A long wave infrared imaging polarimeter (LWIP) is disclosed including a pixilated polarizing array (PPA) in close proximity to a microbolometer focal plane array (MFPA), along with an alignment engine for aligning and bonding the PPA and MFPA and method for assembly.
Spectroscopic apparatus
A light radiating portion radiates light with wavelength λ1 having predetermined absorptivity for an object and light with wavelength λ2 having smaller absorptivity for the object than the wavelength λ1, to a target, so as to scan in 2-dimensional directions. A light receiving portion receives scattered lights reflected by the target based on light with wavelength λ1 and light with wavelength λ2. A measuring portion generates information used for detection of the object at the target, based on difference between the two scattered lights with wavelength λ1 and wavelength λ2 received by the light receiving portion. An output portion outputs whether or not the object is present at the target, by 2-dimensional area information, based on scanning by the light radiating portion and information generated by the measuring portion.
Vibrational circular dichroism infrared spectroscopic imaging microscope
Methods and apparatus for obtaining a vibrational circular dichroism (VCD) image using a discrete frequency infrared (DFIR) microscope are disclosed. The method includes generating a pulsed laser beam comprising a spectral frequency, which may be tunable; modulating the laser beam to generate circularly polarized light; illuminating a sample and collecting, and detecting an optical signal transmitted or transflected from the location of the sample. The detected signal is demodulated at, for example, both the pulse frequency and the sum or difference of the pulse frequency and the modulating frequency to obtain an intensity value that correspond to the absorbance, and a polarization-dependent value that corresponds to the VCD. Other configurations of the apparatus may be employed to measure VCB and VLD.
Optical computing devices with birefringent optical elements
Disclosed are optical computing devices that employ birefringent optical elements configured for use in optical computing devices. One optical computing device includes a polarizer configured to generate at least x polarized light and y polarized light, a birefringent integrated computational element configured to optically interact with a substance and the polarizer, thereby generating optically interacted light, and at least one detector arranged to receive the optically interacted light and generate an output signal corresponding to a characteristic of the substance.
Apparatus for enabling wide-field polarimetry
A polarimetry apparatus comprising a plurality of flexible light conduits each having first and second ends, and a respective polarization modulator associated with each light conduit, wherein each light conduit is configured to receive incident light from a different predetermined region in space via the first end, and deliver said light to a detector unit via the second end, and wherein the polarization modulator is configured to modulate the polarization of the light to enable a partial or complete polarization state of the incident light to be determined by the detector unit for each light conduit.