The invention relates to a device (2) and to a method for characterizing an ultrashort laser pulse. Furthermore, the invention relates to use of a self-contained optical assembly in a device (2) for characterizing an ultrashort laser pulse. The device (2) comprises an imaging optical element (4) configured to image the incident laser pulse (6) in a direction of a straight line (L). A first optical element (10) is configured to apply predetermined varying group delay dispersion on the line focused laser pulse. A non-linear optical element (14) is configured to generate a second harmonic laser pulse (30). An optical grating (20) generates a diffraction of the second harmonic laser pulse, which is imaged on a flat sensor (24). A processing unit (36) determines a best fit for the captured image thereby calculating a frequency spectrum and a spectral phase of the laser pulse.

An apparatus for controlling a frequency analysis processing includes: a memory; and a processor coupled to the memory and configured to execute a fast Fourier transform process that includes performing a fast Fourier transform operation on data of two groups into which sensor data sensed at a first sampling frequency by a sensor is divided, and execute a change process that includes changing, in a case where results of butterfly operations of the fast Fourier transform operation are similar between the two groups, a sampling frequency at which the sensor operates to a second sampling frequency lower than the first sampling frequency.

An apparatus for controlling a frequency analysis processing includes: a memory; and a processor coupled to the memory and configured to execute a fast Fourier transform process that includes performing a fast Fourier transform operation on data of two groups into which sensor data sensed at a first sampling frequency by a sensor is divided, and execute a change process that includes changing, in a case where results of butterfly operations of the fast Fourier transform operation are similar between the two groups, a sampling frequency at which the sensor operates to a second sampling frequency lower than the first sampling frequency.

A measuring apparatus measure the amount of a metal catalyst supported on a sample that has a membrane of a metal catalyst layer containing the metal catalyst. The measuring apparatus includes a terahertz-wave emitting part that emits a terahertz wave in the range of 0.01 to 10 THz to the sample, a transmitted-terahertz-wave detection part that detects the electric field intensity of a transmitted terahertz wave that has passed through the sample, a storage that stores correlation information acquired in advance and indicating the correlation between the amount of the metal catalyst supported and the electric field intensity of the transmitted terahertz wave, and an amount-of-catalyst-supported acquisition module that acquires the amount of the metal catalyst supported on the sample, on the basis of the correlation information and the electric field intensity of the transmitted terahertz wave detected by the transmitted-terahertz-wave detection part.

A measuring apparatus measure the amount of a metal catalyst supported on a sample that has a membrane of a metal catalyst layer containing the metal catalyst. The measuring apparatus includes a terahertz-wave emitting part that emits a terahertz wave in the range of 0.01 to 10 THz to the sample, a transmitted-terahertz-wave detection part that detects the electric field intensity of a transmitted terahertz wave that has passed through the sample, a storage that stores correlation information acquired in advance and indicating the correlation between the amount of the metal catalyst supported and the electric field intensity of the transmitted terahertz wave, and an amount-of-catalyst-supported acquisition module that acquires the amount of the metal catalyst supported on the sample, on the basis of the correlation information and the electric field intensity of the transmitted terahertz wave detected by the transmitted-terahertz-wave detection part.

A superconducting nanowire photon detection array adjusts a number of the array elements, a lens array as an photon alignment system, splits transmitted lights into a plurality of beams, and converges the plurality of beams to a superconducting nanowire detection area; detects a surface of an object by adopting a pulsed laser, transmits different light pulses reflected by the surface of the object through the lens array, and records a round-trip time of each photon; collects the photons detected by each array element, takes the array elements as picture elements, and calculates a gray value of the picture element; and plots a gray-scale image by taking the picture elements as pixel points, calculates a distance between the object and the pixel points, and reconstructs a three-dimensional image of the object and the distance between the object and the pixel points.

A superconducting nanowire photon detection array adjusts a number of the array elements, a lens array as an photon alignment system, splits transmitted lights into a plurality of beams, and converges the plurality of beams to a superconducting nanowire detection area; detects a surface of an object by adopting a pulsed laser, transmits different light pulses reflected by the surface of the object through the lens array, and records a round-trip time of each photon; collects the photons detected by each array element, takes the array elements as picture elements, and calculates a gray value of the picture element; and plots a gray-scale image by taking the picture elements as pixel points, calculates a distance between the object and the pixel points, and reconstructs a three-dimensional image of the object and the distance between the object and the pixel points.

A method and apparatus for characterizing an optical element. The optical element is part of a laser and is mounted on a translation stage to scan the optical element transverse to an intracavity laser beam. A performance characteristic of the laser is recorded as a function of position of the optical element.

A method and apparatus for characterizing an optical element. The optical element is part of a laser and is mounted on a translation stage to scan the optical element transverse to an intracavity laser beam. A performance characteristic of the laser is recorded as a function of position of the optical element.

An electronic device with an auxiliary lighting function and an operation method thereof are provided. The electronic device includes a first body, a display screen, and a light-emitting module. The first body has a first surface. The first surface includes a screen area and a border area. The border area surrounds the screen area. The display screen is disposed in the screen area of the first body. The light-emitting module is disposed in the border area of the first body. The light-emitting module provides an illumination light in at least one first area of the border area, and provides an indicating light in at least one second area of the border area.