Patent classifications
G01K7/00
Systems and methods of measuring temperature in industrial environments
A temperature detector and method of measuring temperature to obtain temperature readings in environments, such as fluids and gasses, by measuring electrical characteristics of the temperature detector that are influenced by the temperature. The temperature detector can be arranged such that a plurality of measurements can be obtained to provide sufficient diversity and redundancy of the measurements for enhanced diagnostics to be performed, such as optimization for fast dynamic response, calibration stability, in-situ response time testability, and in-situ calibration testability.
Temperature sensor, array substrate and display device
Provided are a temperature sensor, an array substrate, and a display device. In the temperature sensor, a low-pass filter is disposed between a ring oscillator and a comparator, so that a square-wave signal output from the ring oscillator passes through the low-pass filter and a high-frequency component in the square-wave signal output from the ring oscillator is directly filtered out by the low-pass filter, thereby improving a signal-to-noise ratio of the ring oscillator and a test accuracy of the temperature sensor.
Temperature sensor, array substrate and display device
Provided are a temperature sensor, an array substrate, and a display device. In the temperature sensor, a low-pass filter is disposed between a ring oscillator and a comparator, so that a square-wave signal output from the ring oscillator passes through the low-pass filter and a high-frequency component in the square-wave signal output from the ring oscillator is directly filtered out by the low-pass filter, thereby improving a signal-to-noise ratio of the ring oscillator and a test accuracy of the temperature sensor.
IR thermometry probe cover
A protective cover for an insertion probe of a medical instrument. The cover contains a flexible tubular body that compliments the probe geometry and a radially disposed flange that surrounds the proximal end of the body. A series of snap-on fasteners removably connect the cover to the instrument. A camming surface is located on the outer face of the flange which coacts with a cam follower that is movably mounted upon the instrument to flex the cover sufficiently to open the fastener and release the cover from the instrument and move the cover axially toward the distal end of the tip.
Electronic calibrating thermometer
A thermometer includes a temperature sensor, a controller configured to receive a signal from the temperature sensor, and an output configured to display a temperature determined by the controller from the signal.
Diverse integrated processing using processors and diverse firmware
A fault detection system includes a sensor configured to measure a physical quantity and generate a measurement of the physical quantity; a first processor configured to receive the measurement, execute a first firmware based on the measurement, and output a first result of the executed first firmware; a second processor configured to receive the measurement from the sensor, execute a second firmware based on the measurement, and output a second result of the executed second firmware, wherein the first firmware and the second firmware provide a same nominal function in a diverse manner for calculating the first result and the second result, respectively, such that the first result and the second result are expected to be within a predetermined margin; and a fault detection circuit configured to detect a fault when the first result and the second result are not within the predetermined margin.
Diverse integrated processing using processors and diverse firmware
A fault detection system includes a sensor configured to measure a physical quantity and generate a measurement of the physical quantity; a first processor configured to receive the measurement, execute a first firmware based on the measurement, and output a first result of the executed first firmware; a second processor configured to receive the measurement from the sensor, execute a second firmware based on the measurement, and output a second result of the executed second firmware, wherein the first firmware and the second firmware provide a same nominal function in a diverse manner for calculating the first result and the second result, respectively, such that the first result and the second result are expected to be within a predetermined margin; and a fault detection circuit configured to detect a fault when the first result and the second result are not within the predetermined margin.
Sensor and method of sensing a value of a parameter
A sensor for sensing a parameter includes a capacitor, a switch and a comparator. The capacitor is configured to be charged or discharged by at least one of a first current signal or a second current signal. The switch is configured to selectively connect or disconnect the first current signal and the capacitor in response to a feedback signal. The comparator is coupled with the capacitor and configured to output an output voltage based on a comparison of a capacitor voltage of the capacitor to a reference voltage. The first current signal is independent of the parameter, and the second current signal is dependent on the parameter. The output voltage defines the feedback signal and is indicative of a value of the parameter detected by the sensor.
Method and apparatus for measuring temperature of semiconductor layer
A method and apparatus are provided to directly and accurately detect a temperature of a semiconductor layer at the time of depositing and film-forming the semiconductor layer. First wavelength laser light having light transmissivity attenuated in a first temperature range and second wavelength laser light having light transmissivity attenuated in a second temperature range are applied to the semiconductor layer. A light receiving unit receives light passing through the semiconductor layer. An attenuation range of the laser light transmissivity is detected when the temperature of the semiconductor layer is increased and the detection light quantity of the first wavelength laser light is attenuated. As the temperature continues to increase and the detection light quantity of the second wavelength laser light exceeds an attenuation start point, the temperature of the semiconductor layer is calculated based on a detection light quantity at a predetermined measurement time and the attenuation range.
Temperature voltage generator
A temperature voltage generator includes a control voltage generation circuit configured to receive a reference voltage and to output a control voltage that changes according to temperature, a temperature voltage generation circuit configured to amplify the control voltage and to output a temperature voltage that changes according to temperature, and a linear compensation circuit connected to the control voltage generation circuit and configured to improve the linearity of the temperature voltage.