Patent classifications
G01K7/00
METHODS OF MEASURING REAL-TIME JUNCTION TEMPERATURE IN SILICON CARBIDE POWER MOSFET DEVICES USING TURN-ON DELAY, RELATED CIRCUITS, AND COMPUTER PROGRAM PRODUCTS
A method of measuring a junction temperature of a SiC MOSFET can be provided by applying a gate-source voltage to an external gate loop coupled to a gate of the SiC MOSFET, detecting a first time when the gate-source voltage exceeds a first value configured to disable conduction of a current in a drain of the SiC MOSFET, detecting, after the first time, a second time when a voltage across a common source inductance in a package of the SiC MOSFET indicates that the current in the drain is greater than a reference value, defining a time interval from the first time to the second time as a turn on delay time of the SiC MOSFET and determining the junction temperature for the SiC MOSFET using the turn on delay time.
APPARATUS, SYSTEM, AND METHOD FOR TRIMMING ANALOG TEMPERATURE SENSORS
A method for trimming analog temperature sensors. First, raise a temperature of a temperature sensor to a highest temperature of a qualification temperature range. Then, trim the temperature sensor such that a high temperature code generated by the temperature sensor represents an actual temperature reported by the temperature sensor at the highest temperature. Next, lower the temperature of the temperature sensor to a lowest temperature of the qualification temperature range. Determine a slope error between the high temperature code and a low temperature code generated by the temperature sensor at the lowest temperature. Finally, determine a correction function that compensates for the slope error of measured temperature codes generated by the temperature sensor for temperatures across the qualification temperature range.
APPARATUS, SYSTEM, AND METHOD FOR TRIMMING ANALOG TEMPERATURE SENSORS
A method for trimming analog temperature sensors. First, raise a temperature of a temperature sensor to a highest temperature of a qualification temperature range. Then, trim the temperature sensor such that a high temperature code generated by the temperature sensor represents an actual temperature reported by the temperature sensor at the highest temperature. Next, lower the temperature of the temperature sensor to a lowest temperature of the qualification temperature range. Determine a slope error between the high temperature code and a low temperature code generated by the temperature sensor at the lowest temperature. Finally, determine a correction function that compensates for the slope error of measured temperature codes generated by the temperature sensor for temperatures across the qualification temperature range.
SYSTEM AND METHOD FOR CORRELATING PROTON RESONANCE FREQUENCY THERMOMETRY WITH TISSUE TEMPERATURES
Devices and systems used to ablate tissue of a tumor using laser energy are disclosed. The devices and systems include a laser probe and a magnetic resonance (MR) safe temperature probe. The MR safe temperature probe includes an optical sensor. A bone anchor fixture separates the laser probe and the MR safe temperature probe to prevent interference in the MR safe temperature probe data. Proton Resonance Frequency (PRF) thermometry is used to model a temperature of a pixel of an MR image located adjacent the optical sensor. The modeled pixel temperature and the measured temperature are compared and monitored. Exceeding a threshold difference value causes an intervening action to occur.
SYSTEM AND METHOD FOR CORRELATING PROTON RESONANCE FREQUENCY THERMOMETRY WITH TISSUE TEMPERATURES
Devices and systems used to ablate tissue of a tumor using laser energy are disclosed. The devices and systems include a laser probe and a magnetic resonance (MR) safe temperature probe. The MR safe temperature probe includes an optical sensor. A bone anchor fixture separates the laser probe and the MR safe temperature probe to prevent interference in the MR safe temperature probe data. Proton Resonance Frequency (PRF) thermometry is used to model a temperature of a pixel of an MR image located adjacent the optical sensor. The modeled pixel temperature and the measured temperature are compared and monitored. Exceeding a threshold difference value causes an intervening action to occur.
Triboelectric-based cable sensors
Systems and methods for monitoring an environmental parameter. A system includes a sensing cable configured to produce a triboelectric signal along at least one conductor of the cable and an electrostatic voltmeter coupled to the sensing cable and configured to provide an output signal responsive to the triboelectric signal. A conversion module is configured to convert the output signal to one or more parameter values indicative of the environmental parameter, and an interface provides a usable representation of the parameter value. The environmental parameter monitored may exemplarily be temperature monitored by the sensing cable as a thermally expandable/contractible semi-rigid coaxial cable, or the monitored environmental parameter may exemplary be vibration, movement, or force monitored by the sensing cable as a deformable coaxial cable.
Triboelectric-based cable sensors
Systems and methods for monitoring an environmental parameter. A system includes a sensing cable configured to produce a triboelectric signal along at least one conductor of the cable and an electrostatic voltmeter coupled to the sensing cable and configured to provide an output signal responsive to the triboelectric signal. A conversion module is configured to convert the output signal to one or more parameter values indicative of the environmental parameter, and an interface provides a usable representation of the parameter value. The environmental parameter monitored may exemplarily be temperature monitored by the sensing cable as a thermally expandable/contractible semi-rigid coaxial cable, or the monitored environmental parameter may exemplary be vibration, movement, or force monitored by the sensing cable as a deformable coaxial cable.
Error compensation for sheathed sensors
A circuit for determining and/or compensating for a measurement error of a sheathed sensor due to a property of a sheath of that sheathed sensor comprises a first and a second terminal for connecting to a pair of sensor signal leads of a sensor element in a sheathed sensor and a voltage measurement circuit. A switching unit controls switching an electrical connection between a first and a second state. A correction measurement circuit generates a correction signal indicative of that a measured current running from the first terminal through the switching unit. A controller receives the measurement and correction signal in both the first and second state, and calculates an error value indicative of the measurement error and/or a sensor readout value that is corrected for the measurement error by taking the measurement and correction signal into account as obtained in both the first and second state.
Thermal conductivity measuring device, thermal conductivity measuring method and vacuum evaluation device
The object of the invention is to provide a thermal conductivity measuring device that comprises a heat generator arranged in such a way as to come into contact with an object to be measured for thermal conductivity, a heat resistant material arranged in such a way as to come into contact with the heat generator, at least one pair of differential thermocouples for measuring a voltage value caused by the difference in temperature of two points of the heat resistant material, the temperature being generated by allowing heat to flow from the heat generator, and a calculating device for calculating the time rate of change of output voltage of the differential thermocouples and then calculating the thermal conductivity of the object to be measured on the basis of the calculated time rate of change.
Thermal measurement apparatus and methods for anisotropic thermal materials
A system for characterizing thermal properties of thermally anisotropic heterogeneous samples includes a heating element, a first temperature sensing device, a second temperature sensing device, and a computing system. The heating element is positioned at a first location within a sample and heats the sample. The first temperature sensing device outputs data indicative of temperatures of the first location to the computing device. The second temperature sensing device outputs data indicative of temperatures of the second location to the computing device. The computing device computes a thermal conductivity of the sample based upon the temperatures of the first location. The computing device further outputs an indication of a portion of the sample to which the thermal conductivity pertains based upon the second temperatures.