The disclosed embodiments relate to the monitoring and control of additive manufacturing. In particular, a method is shown for removing errors inherent in thermal measurement equipment so that the presence of errors in a product build operation can be identified and acted upon with greater precision. Instead of monitoring a grid of discrete locations on the build plane with a temperature sensor, the intensity, duration and in some cases position of each scan is recorded in order to characterize one or more build operations.

The present invention relates to a device (1) for measuring a magnetic field (B) and/or an electric field (E) comprising:—a measurement cell (3) enclosing a gas that is sensitive to the Zeeman effect and/or to the Stark effect, a polarised light source (7) the wavelength of which is tuned to an absorption line of the gas that is sensitive to the Zeeman effect and/or to the Stark effect,—at least one polarimetry system (11) configured to measure a first parameter corresponding to the rotation by a polarisation angle caused by the passage of the beam (9) through the measurement cell (3) enclosing a gas that is sensitive to the Zeeman effect and/or to the Stark effect,—a system (13) for measuring absorption, configured to measure a second parameter corresponding to the absorption of the beam (9) by the gas that is sensitive to the Zeeman effect and/or to the Stark effect in the measurement cell (3), and a processing unit (15) configured to combine the measurement of the first parameter corresponding to the rotation by the polarisation angle and the absorption measurement in order to extract therefrom a third and/or fourth parameter corresponding respectively to an electric field (E) and/or a magnetic field (B) to be measured.

The present invention relates to a device (1) for measuring a magnetic field (B) and/or an electric field (E) comprising:—a measurement cell (3) enclosing a gas that is sensitive to the Zeeman effect and/or to the Stark effect, a polarised light source (7) the wavelength of which is tuned to an absorption line of the gas that is sensitive to the Zeeman effect and/or to the Stark effect,—at least one polarimetry system (11) configured to measure a first parameter corresponding to the rotation by a polarisation angle caused by the passage of the beam (9) through the measurement cell (3) enclosing a gas that is sensitive to the Zeeman effect and/or to the Stark effect,—a system (13) for measuring absorption, configured to measure a second parameter corresponding to the absorption of the beam (9) by the gas that is sensitive to the Zeeman effect and/or to the Stark effect in the measurement cell (3), and a processing unit (15) configured to combine the measurement of the first parameter corresponding to the rotation by the polarisation angle and the absorption measurement in order to extract therefrom a third and/or fourth parameter corresponding respectively to an electric field (E) and/or a magnetic field (B) to be measured.

Provided is a method of calibrating a microwave radiometer, which eliminates use of liquid nitrogen as a calibration source. The method is applied to a microwave radiometer configured to receive, by a receiver having a primary radiator connected thereto, a radio wave emitted from an object to be measured depending on a temperature of the object to be measured and to measure a brightness temperature of the object to be measured from an output signal of the receiver. In the method, the method a noise temperature T.sub.rx of the receiver appearing on an output side of the receiver is calibrated by observing a plurality of calibration sources having known brightness temperatures. The method includes using a radio wave reflector configured to totally reflect noise radiated from an input side of the receiver as one of the plurality of calibration sources.

The present application discloses, in some embodiments thereof, an apparatus, systems and methods for measuring specimens' displacement or transformation while heating. In some embodiments, the present invention discloses apparatus and methods for determining the transformation temperature or range of temperatures of specimens, such as specimens manufactured from a memory shape alloy.

A highly integrated miniature radiometer chip includes a base board with opposing top and bottom etched metal layers to form interconnect and ground pads, and a cavity to provide space for surface mounted parts that are attached to the bottom of a middle board which mounts directly over the top of the base board. The middle board has radio frequency circuits and semiconductor chips at a top metal layer, and surface mounted parts, and ground and signal pads at a bottom metal layer. Metalized vias extending through the dielectric material connect the top and bottom layers. A top cover includes a feedhorn, a waveguide section, and isolation compartments and channels that overlie the RF circuits on the middle board. A dielectric insert is located inside the feedhorn to enhance the feedhorn performance and seal the radiometer chip from external air, humidity and contaminants.

To provide a measurement data processing device that can improve resolution by applying a correction operation to low-resolution microwave radiometer output data.

A measurement data processing device is capable of improving resolution by multiplying a measurement data group of a microwave radiometer by a weighted vector and adding up the measurement data group. The weighted vector solves an inverse problem based on a mathematical model for forming the sensitivity of an antenna as a Gaussian curved surface. Optimization is applied by repeatedly executing, outside an xy coordinate of a target antenna sensitivity distribution function table, a correction operation for minimizing integrated values of a positive remainder sensitivity function, which is data having a positive value a negative remainder sensitivity function, which is data having a negative value.

An apparatus for measuring a target tissue temperature is provided. The sensor antenna may include an outside and a contact side. A sensor antenna measurement aperture may be disposed on the contact side. The sensor antenna measurement aperture may be configured to generate a first signal. A skin temperature sensor may be disposed on the contact side and configured to generate a second signal. A radiometer may be configured to receive the first signal and the second signal.

A method for measuring thermal diffusivity/conductivity of a microscale sample includes placing a metallic disk atop the sample, and disposing a nanomembrane over the sample and over the metallic disk so that the nanomembrane, so that the metallic disk, the nanomembrane and the sample are in thermal equilibrium with one another. A laser beam is directed to fall onto the nanomembrane over the sample, while a radiation sensor is operated to detect photoluminescent radiation emitted by the nanomembrane in response to the laser beam. A spectral shift in the detected photoluminescent radiation emitted by the nanomembrane is determined, and thermal diffusivity/conductivity is calculated from the determined spectral shift of the photoluminescence.

A method for measuring thermal diffusivity/conductivity of a microscale sample includes placing a metallic disk atop the sample, and disposing a nanomembrane over the sample and over the metallic disk so that the nanomembrane, so that the metallic disk, the nanomembrane and the sample are in thermal equilibrium with one another. A laser beam is directed to fall onto the nanomembrane over the sample, while a radiation sensor is operated to detect photoluminescent radiation emitted by the nanomembrane in response to the laser beam. A spectral shift in the detected photoluminescent radiation emitted by the nanomembrane is determined, and thermal diffusivity/conductivity is calculated from the determined spectral shift of the photoluminescence.