Patent classifications
G01K13/00
Inspection robot and methods thereof for responding to inspection data in real time
An inspection robot, and methods and a controller thereof are disclosed. An inspection robot may include an inspection chassis including a plurality of inspection sensors and coupled to at least one drive module to drive the robot over an inspection surface. The inspection robot may also include a controller including an inspection data circuit to interpret inspection base data, an inspection processing circuit to determine refined inspection data, and an inspection configuration circuit to determine an inspection response value in response to the refined inspection data. The controller may further include an inspection response circuit to, in response to the inspection response value, provide an inspection command value while the inspection robot is interrogating the inspection surface.
Appliance monitoring sensors
Sensor units that includes a power source, a communication interface, and a sensor coupled to the power source and the communication interface. The sensor is calibrated to connect the power source to the communication interface upon an occurrence of a condition in an appliance. The sensor, thereby, permits the communication interface to transmit data indicating the condition to a computing device. Methods, systems, and apparatus, for monitoring such sensor units.
Appliance monitoring sensors
Sensor units that includes a power source, a communication interface, and a sensor coupled to the power source and the communication interface. The sensor is calibrated to connect the power source to the communication interface upon an occurrence of a condition in an appliance. The sensor, thereby, permits the communication interface to transmit data indicating the condition to a computing device. Methods, systems, and apparatus, for monitoring such sensor units.
Temperature-based adjustments for in-memory matrix multiplication
Techniques for performing in-memory matrix multiplication, taking into account temperature variations in the memory, are disclosed. In one example, the matrix multiplication memory uses ohmic multiplication and current summing to perform the dot products involved in matrix multiplication. One downside to this analog form of multiplication is that temperature affects the accuracy of the results. Thus techniques are provided herein to compensate for the effects of temperature increases on the accuracy of in-memory matrix multiplications. According to the techniques, portions of input matrices are classified as effective or ineffective. Effective portions are mapped to low temperature regions of the in-memory matrix multiplier and ineffective portions are mapped to high temperature regions of the in-memory matrix multiplier. The matrix multiplication is then performed.
Systems and methods for measuring internal transformer temperatures
A system may include a transformer that may convert a first voltage to a second voltage, such that the second voltage is output via a conductor. The system may also include a wireless current sensor that may detect current data associated with current conducting via the conductor and a processor. The processor may receive the current data, determine one or more temperature measurements associated with the transformer based on the current data, and send a signal to a component in response to the one or more temperature measurements exceeding one or more respective threshold values.
Systems and methods for measuring internal transformer temperatures
A system may include a transformer that may convert a first voltage to a second voltage, such that the second voltage is output via a conductor. The system may also include a wireless current sensor that may detect current data associated with current conducting via the conductor and a processor. The processor may receive the current data, determine one or more temperature measurements associated with the transformer based on the current data, and send a signal to a component in response to the one or more temperature measurements exceeding one or more respective threshold values.
DETERMINATION OF A SOLENOID INJECTOR COIL TEMPERATURE
Disclosed is a method for determining a temperature of a solenoid injector including a coil and a needle when the solenoid injector is in a non-injection phase, the method being characterized in that it includes the following steps: powering the solenoid injector coil using an electric generator for a period of time tvoltage strictly shorter than a period of time tlim corresponding to a time for which the coil is under power causing the needle to open; measuring at least one value icoil of the current of the solenoid injector coil using a current measurement sensor when the coil is powered; and determining a temperature of the solenoid injector from the at least one value icoil of the current of the solenoid injector coil.
DETERMINATION OF A SOLENOID INJECTOR COIL TEMPERATURE
Disclosed is a method for determining a temperature of a solenoid injector including a coil and a needle when the solenoid injector is in a non-injection phase, the method being characterized in that it includes the following steps: powering the solenoid injector coil using an electric generator for a period of time tvoltage strictly shorter than a period of time tlim corresponding to a time for which the coil is under power causing the needle to open; measuring at least one value icoil of the current of the solenoid injector coil using a current measurement sensor when the coil is powered; and determining a temperature of the solenoid injector from the at least one value icoil of the current of the solenoid injector coil.
DISPLAY SYSTEM
A display system includes: a transmissive liquid crystal display panel; a light control panel having an active area with a light control area; a temperature detector provided in the liquid crystal display panel and having a detection area with a resistive element; a backlight; and a controller. A display area of the liquid crystal display panel, the active area, and the detection area overlap on an optical path of a projection light. The light control panel is disposed at such an angle that, when the light control area is in a light reflection state, the light control panel reflects external light to a position out of the optical path and different from a position of the liquid crystal display panel. The controller causes the light control area to reflect light when an output indicating that the resistive element has a predetermined temperature or higher is obtained.
Electromechanical relay constructions
Electromechanical relay constructions comprise an external housing, a pair of switchable electrical contacts disposed within the housing, an element for activating the pair of electrical contacts, and a temperature sensing element disposed within the housing adjacent the electrical contracts. The temperature sensing element provides a signal for determining the temperature within the relay housing. The relay may comprise two or more temperature sensing elements disposed within the housing a desired distance from one another. The temperature sensing element may be attached to a member or substrate disposed within the housing, may be attached to an existing internal structure of the housing, or may be attached to one of the contacts. The temperature sensing element may be selected from the group consisting of resistance temperature detectors, negative temperature coefficient thermistors, thermopile sensors, thermocouples, and combinations thereof.