A device for local temperature measurement that is suitable for taking temperature measurements of an immediate vicinity of said device. The device comprises: a cell comprising a heat-conductive base and at least one first material having a predetermined fixed state-change temperature and arranged in said base; a heat-energy transfer device thermally connected to said base and said at least one first material; a local temperature measurement probe received in said base and in thermal contact with said at least one first material, the heat-energy transfer device being suitable for causing a change of state of said first material in order to carry out at least one metrological verification of the local temperature measurement probe. An associated cell and method for use are also provided.

A temperature detection system includes a housing, a thermal imaging system at least partially disposed within the housing, and a data correction system communicatively coupled with the thermal imaging system . The thermal imaging system is configured to capture at least one thermal image of a subject. The data correction system is configured to correct at least one error associated with the at least one thermal image of the subject.

A sensor abnormality determining apparatus is applied to an inverter that includes: a power element; a cooling water circulation path for cooling the power element; a temperature sensor that detects a temperature of the power element; and a water temperature sensor that detects a temperature of the cooling water circulating in the cooling water circulation path. The sensor abnormality determining apparatus includes: an abnormality determining section and a determination temperature setting section. The abnormality determining section determines the temperature sensor is abnormal when a temperature difference between the detected power element temperature and the detected water temperature is larger than a prescribed determination temperature difference. The determination temperature setting section sets the prescribed determination temperature difference to a lower value when the detected power element temperature is lower than the detected water temperature as compared to when the detected power element temperature is higher than the detected water temperature.

A method and apparatus for testing a duct leak detection system of an aircraft is disclosed. A sensor of the duct leak detection system is selected at an interface of the duct leak detection system. An alternating current is sent through the selected sensor and a resistance of the selected sensor is measured using the alternating current. An indicative signal is generated at the interface when the measured resistance of the selected sensor is outside of a specification of the selected sensor.

A method includes post processing a plurality of temperature sensors grouped into a plurality of sets. For each set of the plurality of sets, a post-processing system coupled to corresponding temperature sensors receives a plurality output signals generated by the corresponding temperature sensors. For each set of the plurality of sets, the post-processing system computes values representing proportional to absolute temperature (PTAT) voltages and values representing internal reference voltages based on output signals generated by the corresponding temperature sensors. For each set of the plurality of sets, the post-processing system computes an average of the values representing the PTAT voltages and relative PTAT voltage variation coefficients. For each set of the plurality of sets, the post-processing system computes values representing corrected PTAT voltages using the relative PTAT voltage variation coefficients.

Embodiments of a certification system for use with an environmental monitoring system that may monitor environmental parameters of multiple different environments. The certification system, which includes one or more computing devices, monitors the certification of environmental sensors of the system. When the certification system detects that the certification of a sensor in a first environment satisfies a condition, such as that the certification is to expire within a threshold period of time, the system triggers the distribution of a certified sensor to an operator of the first environment to replace the sensor for which the certification is to expire. For example, the system may trigger the environmental monitoring system to send a newly-certified sensor to the first operator of the first environment.

A temperature sensing assembly includes first and second temperature sensors disposed within an elongate mineral insulated conductive sheath. A junction point of the first temperature sensor is electrically connected to the conductive sheath. The second temperature sensor is electrically isolated from the conductive sheath. Measurements obtained from the electrically isolated temperature sensor can be used to test insulation resistance of the assembly or temperature indications from the electrically isolated temperature sensor can be compared to measurements taken from the electrically connected junction point to take a variety of corrective actions during use of the temperature sensing assembly, such as adjusting the installation of the assembly or applying correction factors to measurements obtained from one of the temperature sensors.

An assembly includes an electrical conductor disposed within an elongate mineral insulated conductive sheath. The electrical conductor is electrically grounded to the conductive sheath. The assembly also includes a test conductor disposed within and electrically isolated from the sheath to provide an indication of the insulation resistance of the assembly.

A temperature measurement system for measuring a temperature of a measured surface includes: 1) a first temperature sensor; and 2) a reference surface including a second temperature sensor integrated therein. The first temperature sensor includes a field of view simultaneously covering both at least a portion of the measured surface and at least a portion of the reference surface, thus is configured for simultaneously taking a first measurement of both the portion of the measured surface and the portion of the reference surface. The first measurement of the reference surface taken by the first temperature sensor is compared to a second measurement taken by the second temperature sensor for use in calibrating the first temperature sensor.

Implementations described herein generally relate to semiconductor manufacturing, and more specifically to a temperature measurement device. In one implementation, the temperature measurement device includes a substrate and a stack of metal layers coupled to the substrate. Each metal layer of the stack of metal layers extends continuously uninterrupted from edge to edge of the substrate. The first metal layer has a lower electrical resistivity than the second metal layers. The electrical resistivity of the stack is based on the electrical resistivity of the first metal layer, which is temperature dependent. Utilizing a known relationship between temperature measurements and resistivity measurements, the temperature measurement device can measure and store temperature information in various substrate processing processes.