An inspection device comprises: a detecting unit that is connected to a plurality of semiconductor chips having mutually different rates of change of electrical resistance with respect to stress loading direction, and that detects an electrical resistance value of each semiconductor chip from electric current flowing in each semiconductor chip; a first memory unit that is used to hold model data meant for converting an electrical resistance value into a characteristic value indicating at least either temperature, or stress, or strain; a converting unit that converts the electrical resistance value of each semiconductor chip as detected by the detecting unit into the characteristic value using the model data held in the first memory unit; and a second memory unit that is used to store the characteristic value, which is obtained by conversion by the converting unit, as time-series data for each of the plurality of semiconductor chips.

The present disclosure provides a method for automatically optimizing power consumption. The method includes: (S1) a baseboard management controller determines whether system information is correct or not after powered on. If correct, further proceeding the method. If not correct, stopping further proceeding the method. (S2) the baseboard management controller periodically detects the surface temperature and the internal temperature of the essential element with a first loop cycle and determines whether the surface temperature or the internal temperature is higher than a preset temperature. (S3) If the surface temperature or the internal temperature is higher than the preset temperature, performing a PID adjustment to the fan rotation speed according to the surface temperature or the internal temperature of the essential element. If the surface temperature or the inner temperature is not higher than the preset temperature, performing a stepwise adjustment to the fan rotation speed according to current environment temperature.

A magnet temperature estimating device for a motor including a rotor having magnets and configured to output a rotational motive force, and a stator having a plurality of coils opposing the rotor with a gap therebetween, is provided. The device includes a sensor configured to detect an induced voltage induced by rotation of the rotor, and a controller configured to control the motor by supplying power to the plurality of coils in response to an input of a detection signal from the sensor. Gaps adjacent to each magnet in a rotation direction of the rotor are formed in the rotor. The controller estimates a temperature of the magnet based on the induced voltage detected when the magnet opposes any one of the plurality of coils, according to the rotation of the rotor.

A magnet temperature estimating device for a motor provided with a rotor having magnets and configured to output a rotational motive force, and a stator having a plurality of coils opposing the rotor with an aperture therebetween, is provided. The device includes a sensor configured to detect an induced voltage induced by rotation of the rotor, and a controller configured to control the motor by supplying power to the plurality of coils in response to an input of a detection signal from the sensor. The controller estimates a temperature of one of the magnets based on an amplitude of a frequency spectrum corresponding to a given frequency, among frequency components constituting the induced voltage.

A battery includes a battery cell and processing circuitry. The processing circuitry is configured to determine an estimated temperature of the battery cell as a function of various models. The models include a battery cell heat generation model that receives a first input indicative of a battery voltage measurement, a second input indicative of a voltage corresponding to a battery open-circuit voltage (OCV) model, and a third input indicative of a battery current measurement. The models also include a gas gauge and system heat generation model that receives the third input. The models also include a battery and gas gauge heat transfer model that receives a fourth input indicative of a gas gauge temperature measurement.

A device may comprise: a storage for storing a reference output representing an output of an electrical circuit at a reference temperature; one or more processors, configured to: determine a temperature shift based on a comparison of an output of the electrical circuit sensed at a sensing temperature and the reference output; determine a plurality of coefficients of a model of the temperature shift, wherein the model implements one or more functions that associate the plurality of coefficients and a temperature with the temperature shift at the temperature.

The bandgap-less apparatus is a fast settling circuit (e.g., with settling time of less than 40 ns) that can leverage proportional-to-absolute-temperature only (PTAT-only) currents to generate a zero or substantially zero temperature coefficient, or even complementary-to-absolute-temperature (CTAT), reference current or voltage, without the need of a native CTAT component or bandgap diodes. The apparatus subtracts two different PTAT currents so that the resulting current is zero-TC. The resulting current is a reference current. The resulting current can be converted to a reference voltage.

A temperature sensor comprising a light emitter, an electrical circuit for applying a reverse bias voltage across the light emitter and for measuring a reverse current, and means for calculating a temperature from the measured reverse current.

A diagnostic system for a power conversion apparatus including a semiconductor device and performing a switching operation for carrying and interrupting a main current to a main current is disclosed. This system includes a trigger circuit that acquires reference time for the switching operation; and a delay time calculation circuit that acquires first time at which the main current takes a first main current set value and second time at which the main current takes a second main current set value, and that detects numerical data about a difference between the first time and the reference time and numerical data about a difference between the second time and the reference time.

The temperature of inverters and power semiconductor devices is detected at high speed and with high accuracy. The electronic control circuit includes a vector instruction circuit for calculating an efficiency value of an inverter corresponding to a torque instruction value, and a temperature estimation circuit for estimating a temperature of the power semiconductor element based on the efficiency value of the inverter and a duty cycle for driving the power semiconductor element constituting the inverter.