The disclosure relates to a method for controlling an assembly comprising multiple switchable electrochromic individual panes, to set a transmittance individually in each case for these by a respective electrical actuation signal, wherein respective data of the state at the time of each individual pane are recorded by a control device and a configuration of the respective actuation signal is established in each case for each individual pane on the basis of the state data. The configurations of the actuation signals are thereby made to match one another in such a way that the individual panes have preferably the same transmittance value.

A system and method of measuring a temperature including applying a first set of voltages across a circuit in sequence; detecting a second set of voltages corresponding to the first set of voltages, wherein the second set of voltages includes a first detected voltage, a second detected voltage, and a third detected voltage, wherein the first applied voltage corresponds to the first detected voltage, the second applied voltage corresponds to the second detected voltage, and a third applied voltage corresponds to the third detected voltage; modifying an output of a heater proximate to the diode within the circuit, wherein a combined heat dissipation of the heater and the diode remains constant during operation of the circuit; and determining a temperature proximate to the diode based on the first set of voltages and the second set of voltages.

A vacuum pump includes a control unit that monitors and controls a motor and a magnetic bearing, each being stored in a pump body. A temperature-adjustment function unit measures a temperature of the pump body by at least one temperature sensor disposed in the pump body and controls at least one heater or solenoid controlled valve based on the temperature. The temperature-adjustment function unit includes a first terminal capable of connecting or disconnecting the temperature sensor and a second terminal capable of connecting or disconnecting one of the heater and the solenoid controlled valve. A self-diagnosis unit capable of conducting a self-diagnosis of whether an input signal to the first terminal has been normally inputted or whether the signal has been normally outputted from the second terminal.

In one example in accordance with the present disclosure, a fluid analysis system is described. The fluid analysis system includes a fluidic die. The fluidic die includes a fluid chamber to hold a volume of fluid to be analyzed and an impedance sensor disposed within the fluid chamber. The impedance sensor measures an impedance of the fluid in the fluid chamber. The fluid analysis system also includes an evaluator device electrically coupled to the impedance sensor. The evaluator device determines at least one property of the fluid based on the impedance.

Devices and method for performing temperature measurements in a printhead. In one embodiment, a printhead includes at least one row of jetting channels configured to jet droplets of a print fluid using piezoelectric actuators. A drive circuit includes an input voltage generator that applies a step voltage to a piezoelectric actuator of a jetting channel, and an output voltage detector that detects an output voltage across the piezoelectric actuator over time in response to the step voltage. The drive circuit also includes a temperature detector that determines a voltage response to the step voltage at the piezoelectric actuator based on the output voltage over time, and determines a temperature measurement for the piezoelectric actuator based on the voltage response of the piezoelectric actuator.

Systems, devices and methods are provided herein for measuring a junction temperature of a transistor. A system includes a power inverter configured to supply power to a load, the power inverter including the transistor that is configured to switch between an on-state and an off-state and generate a load current during the on-state; a current sensor configured to measure the load current; a voltage transit slope detection circuit configured to determine a voltage transit slope corresponding to a voltage across the transistor during a turn-off period of the transistor during which the transistor is in the off-state; and a processing unit configured to determine the junction temperature of the transistor based on the measured load current and the determined voltage transit slope.

Aspects of the present disclosure include using particles in phase change materials to track temperature change of an object. The particles may be initially disposed at specific locations within the phase change materials. As the phase change materials transition from the solid state to the fluid state, the particles may move from the initial locations to different locations. The change in locations of the particles may be detected magnetically, electrically, optically, and/or visually. Such change may indicate that the object experienced a temperate above at least one phase transition temperature of the phase change materials.

Techniques regarding determining the temperature of one or more quantum computing devices are provided. For example, one or more embodiments described herein can comprise a system, which can comprise a temperature component that can determine a temperature of a superconducting resonator based on a frequency shift exhibited by the superconducting resonator due to a change in kinetic inductance with a change in temperature.

The battery degradation detection device includes an impedance measurement unit and a degradation detection unit. The impedance measurement unit measures impedances of a battery at a plurality of frequencies. The impedance for at least one of the plurality of frequencies, measured by the impedance measurement unit, has a positive imaginary component. The degradation detection unit detects degradation of the battery on the basis of real components of the impedances at the plurality of frequencies detected by the impedance measurement unit.

Method and apparatus for managing data in a non-volatile memory (NVM) of a storage device, such as a solid-state drive (SSD). An initial temperature is stored associated with the programming of data to memory cells in the NVM. A current temperature associated with the NVM is subsequently measured. At such time that a difference interval between the initial and current temperatures exceeds a selected threshold, a preemptive parametric adjustment operation is applied to the NVM. The operation may include a read voltage calibration, a read voltage increment adjustment, and/or a forced garbage collection operation. The operation results in a new set of read voltage set points for the data suitable for the current temperature, and is carried out independently of any pending read commands associated with the data. The initial temperature can be measured during the programming of the data, or measured during the most recent read voltage calibration operation.