G01K2217/00

Vacuum pump, temperature adjustment controller used for vacuum pump, inspection tool, and method of diagnosing temperature-adjustment function unit

A vacuum pump includes a control unit that monitors and controls a motor and a magnetic bearing, each being stored in a pump body. A temperature-adjustment function unit measures a temperature of the pump body by at least one temperature sensor disposed in the pump body and controls at least one heater or solenoid controlled valve based on the temperature. The temperature-adjustment function unit includes a first terminal capable of connecting or disconnecting the temperature sensor and a second terminal capable of connecting or disconnecting one of the heater and the solenoid controlled valve. A self-diagnosis unit capable of conducting a self-diagnosis of whether an input signal to the first terminal has been normally inputted or whether the signal has been normally outputted from the second terminal.

Method for estimating junction temperature online on IGBT power module

A method for estimating the junction temperature on-line on an insulated gate bipolar transistor (IGBT) power module, including the following steps. Estimate the junction temperature by the temperature sensitive electrical parameter method, set the space thermal model of the extended state, and apply the Kalman filter to the junction temperature estimation. The temperature sensitive electrical parameter method estimates the junction temperature of the IGBT power module in real time, selects the IGBT conduction voltage drop V.sub.CE(ON) as the temperature sensitive electrical parameter, and provides a V.sub.CE(ON) on-line measuring circuit. The power loss of the diode and IGBT and the estimated value of junction temperature obtained by the temperature sensitive electrical parameter method are taken as the input of the Kalman filter, and measurement noise and process noise are considered to obtain an optimal estimated value of junction temperature.

Method, apparatus, touch chip and electronic device for determining temperature status of touch screen
11543299 · 2023-01-03 · ·

A method, apparatus, touch chip, and electronic device for determining a temperature status of a touch screen. The method for determining a temperature status of a touch screen includes: determining, based on a plurality of sampled characteristic values of each temperature monitoring node in each sampling period, a raw characteristic value of the temperature monitoring node in a the sampling period, the temperature monitoring being selected from a plurality of capacitance nodes in a touch array; and calculating, based on raw characteristic values of all temperature monitoring nodes in each sampling period, a raw characteristic statistic value in each sampling period, and determining the temperature status of the touch screen based on a raw characteristic statistic values in sampling periods.

Temperature measurement system and temperature measurement device

A temperature measurement system for determining a performance of a smoke generating device includes a temperature measuring device. The temperature measuring device includes an elongated carrier and a number of thermal sensors disposed within the elongated carrier. The elongated carrier is configured to be inserted into an elongated chamber of the smoke generating device. Each of the thermal sensors includes a sensing end exposed on an outer surface of the elongated carrier. When the elongated carrier is inserted into the elongated chamber, the sensing ends respectively detect a temperature of a number of heating members of the smoke generating device.

Magnet temperature estimating device for motor and hybrid vehicle provided with the same
11543302 · 2023-01-03 · ·

A magnet temperature estimating device for a motor provided with a rotor having magnets and configured to output a rotational motive force, and a stator having a plurality of coils opposing the rotor with an aperture therebetween, is provided. The device includes a sensor configured to detect an induced voltage induced by rotation of the rotor, and a controller configured to control the motor by supplying power to the plurality of coils in response to an input of a detection signal from the sensor. The controller estimates a temperature of one of the magnets based on an amplitude of a frequency spectrum corresponding to a given frequency, among frequency components constituting the induced voltage.

CONDUCTIVE FILM, METHOD FOR MANUFACTURING CONDUCTIVE FILM, AND TEMPERATURE SENSOR FILM

A conductive film (102) includes: a resin film base (50) having a hard coat layer (6) on one main surface of a resin film (5); an underlying layer (20) on a hard coat layer-formed surface of the resin film base; and a metal thin film (10) on the underlying layer. The underlying layer includes at least one layer of inorganic dielectric thin film. The hard coat layer contains first fine particles having an average primary particle diameter of 10 to 100 nm. In a cross section of the hard coat layer, the proportion of an area occupied by the first fine particles is preferably 10% or more.

APPARATUS AND METHOD FOR IMPLEMENTING VIRTUAL SENSOR IN ELECTRONIC DEVICE
20220397463 · 2022-12-15 ·

Embodiments of the disclosure disclose a method and an apparatus for implementing a virtual sensor (for example, a virtual thermistor) for checking temperature (or heating) of an electronic device by the electronic device. An electronic device according to various embodiments includes a plurality of electronic components mounted into the electronic device, and a processor operatively connected to the electronic components, wherein the processor is configured to classify a prediction area according to predetermined characteristics, configure a virtual thermistor corresponding to the prediction area, based on the classification characteristic of the prediction area, collect information on at least one prediction area, based on the virtual thermistor, and manage heating of the electronic device, based on the collected information. Various embodiments are possible.

TRANSISTOR SHORT CIRCUIT PROTECTION
20220399884 · 2022-12-15 ·

A short circuit detection circuit includes a current terminal, a sense resistor, an amplifier, and a resistor-capacitor ladder. The sense resistor is coupled to the current terminal, and is configured to develop a sense voltage proportional to a current through the current terminal. The amplifier is coupled to the sense resistor, and is configured to generate a scaled current proportional to the sense voltage. The resistor-capacitor ladder is coupled to the amplifier, and is configured to generate a measurement voltage that represents a surface temperature rise due to the current through the current terminal.

Method and system for predictive maintenance of integrated circuits

A system and method for the predictive maintenance of electronic components that includes sensors at at least one position via which present values of system parameters, such as temperature and voltage, and a signal propagation time at the at least one position are determined, where values of the system parameters and the signal propagation time presently determined by the sensors are retrieved by a central monitoring unit, an individual valid limit value is determined for the signal propagation time at each of the at least one position via the central monitoring unit based on the presently determined values of the system parameters, and the presently determined signal propagation time at each of the at least one position is compared with the associated valid limit value, and a notification is sent to a superordinate level, if the signal propagation time exceeds the limit value to trigger replacement of the electronic component.

Methods of measuring real-time junction temperature in silicon carbide power MOSFET devices using turn-on delay, related circuits, and computer program products

A method of measuring a junction temperature of a SiC MOSFET can be provided by applying a gate-source voltage to an external gate loop coupled to a gate of the SiC MOSFET, detecting a first time when the gate-source voltage exceeds a first value configured to disable conduction of a current in a drain of the SiC MOSFET, detecting, after the first time, a second time when a voltage across a common source inductance in a package of the SiC MOSFET indicates that the current in the drain is greater than a reference value, defining a time interval from the first time to the second time as a turn on delay time of the SiC MOSFET and determining the junction temperature for the SiC MOSFET using the turn on delay time.