Disclosed is a battery pack temperature detection system, comprising: a battery pack disposed with a plurality of temperature monitoring points; a plurality of sampling circuits, wherein each temperature monitoring point is disposed with at least two of the plurality of sampling circuits, and the at least two of the plurality of sampling circuits disposed for one temperature monitoring point are different sampling circuits; and a control module configured to acquire temperature data of each temperature monitoring point by each of the disposed sampling circuits, and determine a current temperature of the battery pack according to the temperature data to determine whether the temperature of the battery pack exceeds a preset value.

The temperature sensor module includes: a temperature sensor element and a signal processing circuit. The signal processing circuit includes: a series-connection resistor which is connected in series to the temperature sensor element; a temperature detection circuit which detects a temperature; a first analog-digital conversion circuit which converts an output signal from the temperature detection circuit into a digital signal; a memory which stores a series-connection resistor data piece about a relationship between a temperature and the resistance value of the series-connection resistor; a digital signal processing circuit which uses the series-connection resistor data piece, to calculate, on the basis of the digital signal indicating the temperature of the signal processing circuit, a digital command signal for keeping the resistance value of the series-connection resistor at a constant value, and outputs the digital command signal; and a digital-analog conversion circuit which outputs the digital command signal to the series-connection resistor.

Certain embodiments of the present technology relate to temperature sensors for using in an implantable medical device, and methods for use therewith. Such a method can include alternating between producing a first base-to-emitter voltage drop (VBE1) and a second base-to-emitter voltage drop (VBE2), and alternating between using a capacitor to store the VBE1, which is complimentary to absolute temperature (CTAT), and using the same capacitor to store a ΔVBE=VBE2−VBE1, which is proportion to absolute temperature (PTAT). The method also includes using a sigma-delta modulator that includes the capacitor to produce a signal having a duty cycle (dc) indicative of the ΔVBE stored using the capacitor, and producing a temperature measurement based on the signal having the duty cycle (dc) indicative of the ΔVBE.

Circuitry generates base-to-emitter voltages (Vbe1, Vbe2) of two BJTs biased at different current densities, a base-to-emitter voltage (Vbe) of a BJT biased so Vbe is complementary to absolute temperature and has a curved non-linearity across temperature, and base-to-emitter voltages (Vbe1_c, Vbe2_c) of two BJTs biased by a temperature independent constant current and a current proportional to absolute temperature so Vbe2_c−Vbe1_c has the same but opposite curved non-linearity across temperature as Vbe. A sampling circuit samples these voltages and provides them to inputs of a loop filter. Filter outputs are quantized to produce a bitstream. The sampling circuit: when the received bit of the bitstream is zero, causes integration of Vbe1−Vbe2 to produce a voltage proportional to absolute temperature (αΔVbe); and when the received bit of the bitstream is one, causes integration of Vbe2_c−Vbe_Vbe1_c to produce a negative voltage complementary to absolute temperature −Vbe_c without non-linearity across temperature.

In an embodiment a method includes providing an analog signal comprising a first value of a temperature of an object, performing an analog-to-digital conversion of the analog signal using a first analog-to-digital converter (ADC) thereby providing a first digital signal representing an initial digital temperature value, performing an analog-to-digital conversion of the analog signal using a second ADC thereby providing a second digital signal representing a digital reference temperature value, regularly providing the analog signal comprising a successive value of the temperature of the object, performing the analog-to-digital conversion of the analog signal using the second ADC thereby providing the second digital signal representing a successive digital temperature value, calculating a digital delta temperature value according to a difference between the successive digital temperature value and the digital reference temperature value and repeating providing the analog signal, performing the analog-to-digital conversion and calculating the digital delta temperature value as long as the digital delta temperature value lies within a predefined range.

A modulation circuit for voltage to duty-cycle conversion is provided. A first input end and a second input end of a comparator are supplied with a first voltage and a second voltage via a first switch and a second switch respectively. An output end of the comparator outputs a comparison result signal. A charging end of a charging capacitor is connected with a charging current source and a grounding reset module, and is connected with the first input end via a third switch, and is connected with the second input end via a fourth switch. When the comparison result signal flips over, a control module controls the grounding reset module to switch an on-off state of a first switch group including the first switch and the fourth switch and a second switch group including the second switch and the third switch.

An apparatus comprises: a first circuitry to charge first and second capacitors to a predetermined voltage level; a second circuitry to discharge the first capacitor through a diode at a first time; a third circuitry to discharge the second capacitor through the diode at a second time, wherein the second time is greater than the first time; a comparator to compare a first voltage of the first capacitor with a second voltage of the second capacitor; and logic to adjust a scaling factor applied to the second voltage according to an output of the comparator.

Structures including non-volatile memory elements and methods of forming such structures. The structure includes a first non-volatile memory element, a second non-volatile memory element, and temperature sensing electronics coupled to the first non-volatile memory element and the second non-volatile memory element.

Methods and devices are provided for circuits. One device includes an adjustment circuit having an adjustable resistor for modifying a resistance value of a resistive device, the adjustment circuit connected to an adjustment terminal of the resistive device. The resistance value of the adjustable resistor changes, when a voltage or charge on the adjustment terminal of the adjustable resistor is changed. The adjustable resistor is a phase change element with an adjusting terminal to which different voltage values are applied for adjusting a conversion device threshold value.

A non-linear converter comprising a non-linear voltage divider having a plurality of resistors representing a non-linear transfer function, an analog multiplexer having analog multiplexer inputs coupled to the non-linear voltage divider and configured to output an analog multiplexer output, the analog multiplexer chooses one of the plurality of resistors based on a logic signal and the non-linear transfer function, an analog comparator having an analog comparator first input configured to receive an analog input voltage, an analog comparator second input configured to receive the analog multiplexer output and the analog comparator configured to output a comparator voltage output and a logic loop coupled to the analog comparator and configured to receive the comparator voltage output and configured to output the logic signal, wherein the logic signal represents a linearized digital word.