There are provided an optical-fiber connector endface inspection microscope system and a method for inspecting an endface of an optical-fiber connector. The inspection microscope device is releasably connectable to an adapter tip configured to interface with the optical-fiber connector to inspect the endface thereof. The adapter tip is one among a plurality of adapter tip types adapted to inspect respective types of optical-fiber connectors. The optical-fiber connector endface inspection microscope system comprises a tip detection system adapted to recognize the type of the adapter tip among the plurality of adapter tip types; and is configured to analyze inspection images to produce an inspection result for the endface, at least partly based on a fiber type corresponding to the recognized adapter tip and/or other information read by the tip detection system.

Disclosed are a long-distance optical fiber detecting method, apparatus, device and system, and a storage medium. The method comprises: in response to a detection request of a target node on a to-be-detected optical fiber, determining a first and second sampling sequence that are formed by respectively propagating, on said optical fiber, a first and second optical signal respectively sent from each end of the optical fiber through an OTDR; determining a total length of the optical fiber; generating a detection result according to the first and second sampling sequence and the total length, and sending the detection result to the target node. By determining the first and second sampling sequence and combining the total length of the optical fiber, a detection result of the to-be-detected optical fiber is generated.

An inspection jig is used for inspection for an inspection target device including a flexible substrate having a flexible base material with external connection terminals formed thereon. The inspection jig is composed of an inspection device and an attraction part. The inspection device has inspection terminals, and the inspection terminals have vacuum attraction holes. The attraction part has an attraction surface. The external connection terminals have first through holes. In inspection, the attraction part is placed on the front surface of the flexible base material so that the first through holes and the vacuum attraction holes overlap each other and the attraction surface covers the first through holes, and the insides of the first through holes and the vacuum attraction holes are made into vacuum, whereby the attraction surface is attracted to the flexible base material and the external connection terminals are attracted to the inspection terminals.

An inspection jig is used for inspection for an inspection target device including a flexible substrate having a flexible base material with external connection terminals formed thereon. The inspection jig is composed of an inspection device and an attraction part. The inspection device has inspection terminals, and the inspection terminals have vacuum attraction holes. The attraction part has an attraction surface. The external connection terminals have first through holes. In inspection, the attraction part is placed on the front surface of the flexible base material so that the first through holes and the vacuum attraction holes overlap each other and the attraction surface covers the first through holes, and the insides of the first through holes and the vacuum attraction holes are made into vacuum, whereby the attraction surface is attracted to the flexible base material and the external connection terminals are attracted to the inspection terminals.

A photonic device and a continuous-wave THz signal generator using such photonic device. The photonic device includes an input waveguide arranged to receive input waves of at least two input frequencies and to generate photons at an output frequency associated with the at least two input frequencies; an output waveguide coupled to the input waveguide and arranged to collect the generated photons at the output frequency; wherein the output waveguide is further arranged to facilitate an amplification of the generated photons as the generated photons propagates along the output waveguide and arranged to output an amplified signal at the output frequency.

In some examples, an optical time-domain reflectometer (OTDR) device may include a laser source to emit a plurality of laser beams. Each laser beam may include a different pulse width. A control unit may analyze, for each laser beam, a backscattered signal from a device under test (DUT). The control unit may generate, for each backscattered signal, a trace along the DUT. Further, the control unit may generate, based on an analysis of each trace along the DUT, a combined trace that identifies optical events detected along the DUT.

The present invention has an object to provide an optical fiber testing method and an optical fiber testing device capable of measuring the delay ratio between the modes at each position of a fiber over a long distance in which a plurality of modes propagate.

An optical fiber testing method and its device according to the present invention, measure the change amount for the wave number k of a Brillouin Frequency Shift ν in stimulated Brillouin scattering generated in the same acoustic mode, with respect to each target propagation mode. Thereby, the ratio of the change amount measured at each propagation mode is acquired as the group delay ratio between the modes.

Aspects of the present disclosure describe monitoring of optical fiber by distributed temperature sensing (DTS) and determining optical fiber degradation and/or abnormal environmental events including landslides, fires, etc., from DTS data.

Provided with: a detecting means to detect a possible light intensity changing frequency of a measuring object; a frequency determining means to determine a light intensity changing frequency with reference to the possible light intensity changing frequency; a resolution determining means to determine a frequency resolution for flicker measuring with reference to the determined light intensity changing frequency; and a flicker measuring means to conduct flicker measuring with the determined frequency resolution. The resolution determining means determines the frequency resolution to be an integral submultiple of the light intensity changing frequency determined by the frequency determining means.

There are provided methods and systems that enable the use of the backscattering pattern produced by an optical fiber in an OTDR trace as a signature (also referred to herein as the “RBS fingerprint”) to recognize an optical fiber. It was found that it may be difficult to obtain repeatable signatures as those are sensitive to the wavelength of the OTDR laser source and the temperature of the fiber. OTDR methods and systems that are adapted to compare the backscattering pattern in a more repeatable manner are therefore provided. Once the repeatability issue is overcome, such signature can be used for identification purposes and enable new applications.