A fiber inspection system for inspecting optical-fiber endfaces of a multiple-fiber connector is provided that includes a housing structure, a mating interface fixed relative to the housing structure for interfacing with the multiple-fiber connector, and an imaging assembly. The imaging assembly is enclosed in the housing structure and defines an inspection plane and an image plane, at least a plurality of the optical-fiber endfaces being disposed on the inspection plane, to within a focusing range, when the multiple-fiber connector is mated to the mating interface. The imaging assembly also defines an imaging axis between an inspection point on the inspection plane and a detection point on the image plane, and includes an alignment module disposed between the inspection plane and the image plane and controllable to move the inspection point across the inspection plane for selectively inspecting one or more of the optical-fiber endfaces.

The present disclosure has an object to provide a technique for enabling a communication state to be confirmed not in a communication building but in a work site, and to provide a technique for enabling correct splicing between optical cables to be confirmed before fusion splicing. The present disclosure is a communication apparatus identification device 4 including an optical fiber bent portion 42 obtained by, when a portion of optical fibers to which communication apparatuses (the OLT 1-2 and the ONU 2) for which appropriateness of connection is to be determined are connected on opposite ends is bent, bending a portion of the optical fibers in a vicinity of a clearance provided between the optical fibers, the clearance having a range in which the communication apparatuses for which appropriateness of connection is to be determined can communicate with each other, and a MAC address analysis unit 43 that analyzes communication light leaked out of the bent portion of the optical fibers in the vicinity of the clearance to acquire identification numbers (MAC addresses) of the communication apparatuses for which appropriateness of connection is to be determined.

In some examples, automatic OTDR-based testing may include determining, based on analysis of a signal that is received from a DUT that is to be monitored, whether the DUT is optically connected. Based on a determination that the DUT is optically connected, a measurement associated with the DUT may be performed.

A system that provides detection, annunciation, mitigation, and alleviation of stress attacks by executing algorithms based on measurement of intensity of light. The system determines to execute algorithms to take programmed action based on potential effects of a detected stress attack. The system can be used, for example, to determine the position of potential attacks to conduits that transport electricity, oil, gas, foodstuffs, water, people, and materials.

Aspects of the subject disclosure may include, for example, determining distinct timing offsets between an input port and output ports of a multiport optical device. An optical signal is injected at an input port of the device to obtain output signals at the output ports, which are injected into downstream fibers. An optical multipath return signal is received via the input port of the device, including a combination of measured events including reflections, backscatter, or both. A number of similar events expected in the number of downstream optical fibers is calculated to obtain an expected multipath signature based on configuration data. Results of the optical multipath return signal are then compared to the expected multipath signature to obtain comparison results. One of the measured events is distinguished from the others based on the first comparison results and the distinct timing offsets. Other embodiments are disclosed.

Methods for determining sensor channel location in distributed sensing of fiber-optic cables are disclosed. In one method, three or more Fiber Bragg-Gratings (FBGs) connected in series by a standard telecommunication fiber and interrogated using an input distributed fiber-optic sensing (DFOS) laser, where the input DFOS laser has a single wavelength. The input DFOS laser operates on a single wavelength that is different than the respective wavelengths of each of the three or more FBGs. The three or more FBGs are interrogated using an input broadband FBG laser. Each FBG reflects a wavelength of laser light that is proportional to the grating size, using an optical time domain reflectometer (OTDR) at the FBG wavelength, the distance to the particular FBG in the optical domain is computed and compared to the physical measurement of the FBG location. The sensor channel locations of the DFOS system are calibrated and constrained using this method.

A method and system for obtaining photonic parameters. The system includes a computer, an optical source, a first and second optical fiber, a Mach-Zehnder Interferometer (MZI) structure, and a detector. The computer includes a processor and memory. The optical source is constructed to emit light of a first optical mode and a second optical mode in response to an instruction by the computer. The first optical fiber receives the first or second optical mode. The MZI structure includes first and second pluralities MZIs and receives the first or second optical mode from the optical fiber. The second optical fiber receives light from the MZI structure. The detector is configured to receive light that propagated through the second optical fiber, generate image data and provide the image data to the computer. The computer obtains a plurality of photonic parameters based on the image data and initial guesses for the plurality of photonic parameters.

In some implementations, an optical component of a microscope may capture an image of a profile of a ferrule and a connector of an optical fiber based on the ferrule being received by a first opening of a first connector adapter of the microscope. A mechanical axis of the ferrule may be orthogonal to an optical path from a camera of the microscope to the ferrule when the ferrule is received by the first opening. One or more processors associated with the microscope may process the image to determine a measurement of a chamfer of the ferrule. The optical component may capture an image of an endface of the ferrule based on the ferrule being received by a second opening of a second connector adapter. The mechanical axis of the ferrule may be axially aligned with the optical path when the ferrule is received by the second opening.

A method for testing optical fibers includes using an optical testing instrument to measure a characteristic, such as clad non-circularity, of an optical fiber at a multiple angles of rotation of an optical fiber around its optical axis. From the measurements data points indicative of measured values of the characteristic at the respective angles of rotation are generated. A model is created of the optical fiber having the characteristic as a variable parameter, and from the model a functional relationship between an expected measured value of the characteristic and the angle of rotation and the variable parameter is generated. By varying the parameter a fit of the functional relationship to the data points is made according to one or more predetermined criteria, such as least-squares fit. The value of the characteristic can be found based on the fit. Instrumental parameters, such as fiber misalignment and cleave angle, can also be ascertained by the method.

A test appliance and a method for testing a mirror, e.g., a mirror of a microlithographic projection exposure apparatus. The test appliance has a computer-generated hologram (CGH), and a test can be carried out on at least a portion of the mirror by way of an interferometric superposition of a test wave that is directed onto the mirror by this computer-generated hologram and a reference wave. Here, the computer-generated hologram (CGH) (120, 320) is designed in such a way that, during operation of the appliance, it provides a first test wave for testing a first portion of the mirror (101, 301) by interferometric superposition with a reference wave in a first position of the mirror (101, 301) and at least a second test wave for testing a second portion of the mirror (101, 301) by interferometric superposition with a reference wave in a second position of the mirror (101, 301).