An optical fiber characteristics measurement system includes: an optical fiber characteristics measurement device including: an emission port configured to emit probe light; and an incidence and emission port connected to one end of a measurement target optical fiber and configured to emit pump light, stimulated Brillouin scattered light generated within the measurement target optical fiber being incident on the incidence and emission port; a first optical fiber having one end connected to the emission port and configured to guide the probe light to another end of the measurement target optical fiber; and an optical isolator provided between another end of the first optical fiber and the another end of the measurement target optical fiber, and configured to cause the probe light guided by the first optical fiber to be incident on the another end of the measurement target optical fiber.

A device for determining a layer thickness in a multilayer film includes a radiation source configured to generate an electromagnetic primary radiation, a detector configured to detect an electromagnetic secondary radiation emitted by the multilayer film, the secondary radiation being induced by an interaction of the primary radiation with the multilayer film, and a first contact block transparent to the electromagnetic primary radiation and having a first contact surface for creating contact with the multilayer film. The radiation source is arranged on the first contact block in such a way that the electromagnetic primary radiation is guided from the first contact block onto the multilayer film.

A two-dimensional flicker measurement apparatus includes: a first calculation unit that calculates a flicker amount of each of a plurality of measurement regions set on a measurement target based on a photometric quantity obtained by performing photometry in the measurement target at a first sampling frequency; a second calculation unit that calculates a flicker amount of a predetermined measurement region set on the measurement target based on a photometric quantity obtained by performing photometry in the predetermined measurement region at a second sampling frequency; and a correction unit that corrects the flicker amount of each of the plurality of measurement regions calculated by the first calculation unit using a correction coefficient defined by the flicker amount calculated by the second calculation unit and a flicker amount of the predetermined measurement region calculated based on a photometric quantity obtained by performing photometry in the predetermined measurement region at the first sampling frequency.

A two-dimensional flicker measurement apparatus includes: a first calculation unit that calculates a flicker amount of each of a plurality of measurement regions set on a measurement target based on a photometric quantity obtained by performing photometry in the measurement target at a first sampling frequency; a second calculation unit that calculates a flicker amount of a predetermined measurement region set on the measurement target based on a photometric quantity obtained by performing photometry in the predetermined measurement region at a second sampling frequency; and a correction unit that corrects the flicker amount of each of the plurality of measurement regions calculated by the first calculation unit using a correction coefficient defined by the flicker amount calculated by the second calculation unit and a flicker amount of the predetermined measurement region calculated based on a photometric quantity obtained by performing photometry in the predetermined measurement region at the first sampling frequency.

The present invention is to provide a backscattered light amplification device, an optical pulse test apparatus, a backscattered light amplification method, and an optical pulse test method for amplifying a desired propagation mode of Rayleigh backscattered light with a desired gain by stimulated Raman scattering in a fiber under test having the plurality of propagation modes. The backscattered light amplification device according to the present invention is configured to control individually power, incident timing, and pulse width of a pump pulse for each propagation mode when the pump pulse is incident in a plurality of propagation modes after the probe pulse is input to the fiber under test in any propagation mode.

The present disclosure has an object to provide a technique for enabling a communication state to be confirmed not in a communication building but in a work site, and to provide a technique for enabling correct splicing between optical cables to be confirmed before fusion splicing. The present disclosure is a communication apparatus identification device 4 including an optical fiber bent portion 42 obtained by, when a portion of optical fibers to which communication apparatuses (the OLT 1-2 and the ONU 2) for which appropriateness of connection is to be determined are connected on opposite ends is bent, bending a portion of the optical fibers in a vicinity of a clearance provided between the optical fibers, the clearance having a range in which the communication apparatuses for which appropriateness of connection is to be determined can communicate with each other, and a MAC address analysis unit 43 that analyzes communication light leaked out of the bent portion of the optical fibers in the vicinity of the clearance to acquire identification numbers (MAC addresses) of the communication apparatuses for which appropriateness of connection is to be determined.

A stage, electric probes, an optical probe, an electric measurement device, an optical measurement device, and a first positioning mechanism are provided. The stage includes a second positioning mechanism that changes relative positional relationship between the electric probes and an electric connection portion of each of the optical elements. The electric probes electrically connect the electric measurement device and each of the optical elements. The optical probe optically connects the optical measurement device and each of the optical elements. The first positioning mechanism changes relative positional relationship between the optical probe and an optical connection portion of each of the optical elements.

A measurement apparatus for interferometric shape measurement of a test object surface. A test optical unit produces from measurement radiation a test wave for irradiating the surface. A reference element with an optically effective surface interacts with a reference wave also produced from the measurement radiation. An interferogram is produced by superimposing the test wave after interaction with the test object's surface. A holding device holds the reference element and moves the reference element relative to the reference wave in at least two rigid body degrees of freedom so that a peripheral point of the reference element's optically effective surface shifts by at least 0.1% of a diameter of the optically effective surface. The at least two degrees of freedom include a translational degree, directed transversely to a propagation direction of the reference wave and a rotational degree, whose rotational axis aligns substantially parallel to the reference wave's propagation direction.

The invention is directed to the characterization of an optical channel, such as an optical fiber, in an optical network. The method includes calibrating a transmitter by measuring its transmitter and dispersion eye closure (TDEC, in the case of non-return to zero optical (NRZ) optical systems or transmitter and dispersion eye closure quaternary (TDECQ, in the case of 4-level pulse amplitude modulation (PAM4) optical systems). That calibrated transmitter is used to characterize the optical channel being tested by providing a measure of its stressed eye closure (SEC) or stressed eye closure quaternary (SECQ). A loss deficit for the optical channel can be calculated by subtracting the SEC or SECQ value from the maximum TDEC or TDECQ value.

An object of the present disclosure is to detect a microbend in an optical fiber before the light-receiving intensity of a transmission device decreases. The present disclosure relates to a device configured to measure guided acoustic wave Brillouin scattering in a measurement target optical fiber, and detect a microbend in the measurement target optical fiber based on a characteristic around a peak of the guided acoustic wave Brillouin scattering.