An object is to provide an optical pulse test method and an optical pulse test device with which it is possible to measure transmission losses of a basic mode and a first higher-order mode at a connection point at which two-mode optical fibers are connected in series, without switching the mode of input test light. An optical pulse test device according to the present invention inputs a test optical pulse in a basic mode (or a first higher-order mode) from one end of an optical fiber under test, the test optical pulse having such a wavelength that the test optical pulse can propagate in the basic mode and the first higher-order mode, measures intensity distributions of a basic mode component and a first higher-order mode component of return light of the test optical pulse relative to the distance from the one end, finds, from the intensity distributions, losses of the basic mode component and the first higher-order mode component of the return light at a desired connection point of the optical fiber under test, and calculates transmission losses of the basic mode and the first higher-order mode at the connection point based on expressions (8) (or expressions (9)).

A time domain reflectometry measurement apparatus and method is provided. Measurement data of a time domain reflectometry measurement are analyzed with respect to previously acquired empirical measurement data of error-free or faulty devices with known failures. In this way, failures can be identified in the device under test without the need of opening the device.

A structure for, and method of, forming a first optoelectronic circuitry that generates an optical signal, a second optoelectronic circuitry that receives an optical signal, and a loopback waveguide that connects the output from the first optoelectronic circuitry to the second optoelectronic circuitry on an interposer substrate are described. The connected circuits, together comprising a photonic integrated circuit, are electrically tested using electrical signals that are provided via probing contact pads on the PIC die. Electrical activation of the optoelectrical sending devices and the subsequent detection and measurement of the optical signals in the receiving devices, in embodiments, provides information on the operability or functionality of the PIC on the die at the wafer level, prior to die separation or singulation, using the electrical and optical components of the PIC circuit.

A system for estimating an imbalance between electrical-optical responses of an in-phase (I) channel and a quadrature (Q) channel in an optical amplitude and phase modulator (optical IQ modulator) includes an optical detector (PD), an analog-digital converter (ADC), and an imbalance operation unit that estimates an imbalance between electrical-optical responses of an I channel and a Q channel in the optical IQ modulator, wherein the imbalance operation unit includes an input signal information receiving unit that receives information regarding a first modulation signal, and an intensity information receiving unit that receives intensity information of the digitalized output signal from the ADC, and the imbalance operation unit estimates an imbalance between electrical-optical responses of an I channel and a Q channel in the optical IQ modulator using information regarding a first modulation signal and intensity information of the digitalized output signal.

An optical circuit inspection probe includes a piezoelectric element and a gel-like medium layer provided at an end of the piezoelectric element to absorb light and convert the light into a sound wave. The piezoelectric element may be formed of piezoelectric ceramics such as Pb (Zr.Math.Ti)O.sub.3 (PZT). The piezoelectric element has, for example, a cylindrical shape. The medium layer is formed of a hydrogel. The hydrogel may include, for example, polydimethylsiloxane (PDMS). Further, the medium layer may contain carbon.

Disclosed in embodiments of the present invention are a synchronous control method and system for a laser test of an optical engine. The operation of a laser can be driven by the synchronous control system. When a test of a data point is finished and the optical engine stops for optical window cleaning, the laser may still maintain stable operation under the driving of the synchronous control system, experiments may be directly carried out next time, and thus, laser test efficiency of the optical engine can be improved. Moreover, the synchronous control system is adopted to independently drive the laser to achieve energy stability before experiments, preventing an influence of long-term operation on the performance of the optical engine, and improving test accuracy.

Methods of determining a polygon ablation pattern for use in mitigating one or more defects in an optical device are described. A method comprises identifying spatial coordinates of one or more defects areas in a first image of the optical device taken when tinted, defining a region of interest around at least one defect area of the one or more defect areas, and determining a polygon boundary around the at least one defect area in the region of interest to define the polygon ablation pattern.

A fiber-optic interconnection stabilization apparatus for a measurement system is provided. The apparatus may comprise a main body comprising an enclosure and two openings. The enclosure may encase a fiber-optic cable within the main body in an organized manner. The two openings may fit connecting ends of the fiber-optic cable such that the connecting ends of may be exposed in order to connect two modular components of a measurement system and form a closed measurement loop. The main body, when in a closed configuration, may stabilizes the fiber-optic cable encased within from external conditions, such as mechanical, thermal, or other environmental conditions that may affect measurements.

An apparatus, system and method for testing a micro-optical component system. The apparatus, system and method may include a receiver for receiving the micro optical component system; a light source; and a coupler for passing aspects of light from the light source through the micro optical component system to a termination, and for passing remaining aspects from the light source back reflected from the micro optical component system to a power meter. A reading at the power meter of the back reflection may correspond to a diagnosis of the micro optical component system.

The present disclosure provides a method, an apparatus and a system for determining a light-leakage degree of a display panel, and a test fixture, and relates to the field of display technologies. When a light-leakage detection device detected that the plurality of sub-regions includes at least one light-leakage sub-region, the light-leakage detection device can determine a light-leakage degree of the display panel based on an average of brightness values of the plurality of sub-regions and a brightness value of the light-leakage sub-region. Compared with a way that an inspector manually determines a light-leakage degree, the light-leakage detection device can automatically determine the light-leakage degree of the display panel based on brightness values of the sub-regions by the method according to the embodiment of the present disclosure, thereby effectively improving the reliability and accuracy of the light-leakage degree of the display panel as determined.