Patent classifications
G01N3/00
Proximal degas driven microfluidic actuation
An apparatus with a self-contained, tunable, microfluidic pumping system that utilizes the high air permeability of the matrix material to actuate fluid flow in a network of fluidic microchannels and microstructures is provided. The pumping relies upon partial evacuation of degas/vacuum channels that are located next to the fluid channels to degas air from the fluid channels or structures producing a reduction of pressure in the fluidic channel leading to the flow of fluid from an inlet at atmospheric pressure through the device. The solution is isolated from the pumping apparatus since the liquid does not pass through the diffusion barriers. The apparatus and method can also provide bubble-free microfluidic pumping, without any auxiliary equipment or device pre-treatment, and can fill dead-end channels and chambers, providing a powerful liquid handling tool for a broad range of applications.
Method and apparatus for testing gel-based lost circulation materials
A compression test rig apparatus for determining a mechanical characterization of a gel-based LCM test sample comprising an LCM test cell configured to contain the gel-based LCM test sample, the LCM test cell comprising a cylinder wall defining a cell space volume configured to hold the gel-based LCM test sample, and a floor defining an extrusion hole configured to extrude the gel-based LCM test sample to create an extruded gel; an extruded gel collector configured to receive the extruded gel from the extrusion hole as an extruded gel volume; a perforated disc comprising perforations, wherein the perforated disc is configured to allow the gel-based LCM test sample to pass through the perforations; and a flat foot disc piston in flush contact with the cylinder wall, the flat foot disc piston configured to compress the gel-based LCM test sample at a displacement speed to produce compression data.
ROTATING ELECTRIC MACHINE TEST METHOD, ROTATING ELECTRIC MACHINE TEST DEVICE, AND ROTATING ELECTRIC MACHINE
A rotating electric machine includes a stator and a rotor. An imaging device images a test target portion which is a part of the rotor, to generate image data of the test target portion, and transmits the generated image data to an image processing device. The image processing device generates strain change information representing change in the strain distribution in the test target portion by digital image correlation on the basis of the test image data generated by the imaging device. The state of the rotor is tested using the generated strain change information.
ROTATING ELECTRIC MACHINE TEST METHOD, ROTATING ELECTRIC MACHINE TEST DEVICE, AND ROTATING ELECTRIC MACHINE
A rotating electric machine includes a stator and a rotor. An imaging device images a test target portion which is a part of the rotor, to generate image data of the test target portion, and transmits the generated image data to an image processing device. The image processing device generates strain change information representing change in the strain distribution in the test target portion by digital image correlation on the basis of the test image data generated by the imaging device. The state of the rotor is tested using the generated strain change information.
METHOD FOR TEST DATA REDUCTION OF COMPOSITE INTRALAMINAR FAILURE MODE
A method to utilize the results from a series of FEM models to develop a master derivative of compliance curve. The use of the unique master curve resolves the test data variability issue caused by fitting the compliance curve individually. The analytically derived derivative of compliance curve eliminates the needs to take the derivative of compliance and therefore the derivative computation error no longer exists. By applying the existing solution and the solution as disclosed and claimed herein to the same set of the raw test data, it is found that data scatter is significantly reduced.
Cell population analysis
A method of analysis using mass spectrometry and/or ion mobility spectrometry is disclosed comprising: (a) using a first device to generate smoke, aerosol or vapour from a target in vitro or ex vivo cell population; (b) mass analysing and/or ion mobility analysing said smoke, aerosol or vapour, or ions derived therefrom, in order to obtain spectrometric data; and (c) analysing said spectrometric data in order to identify and/or characterise said target cell population or one or more cells and/or compounds present in said target cell population.
Cell population analysis
A method of analysis using mass spectrometry and/or ion mobility spectrometry is disclosed comprising: (a) using a first device to generate smoke, aerosol or vapour from a target in vitro or ex vivo cell population; (b) mass analysing and/or ion mobility analysing said smoke, aerosol or vapour, or ions derived therefrom, in order to obtain spectrometric data; and (c) analysing said spectrometric data in order to identify and/or characterise said target cell population or one or more cells and/or compounds present in said target cell population.
Test arrangement for the crash simulation of motor vehicles
The present invention relates to a test arrangement for the crash simulation of motor vehicles, said test arrangement having a first carriage, which is movable substantially horizontally along a longitudinal axis, and a second carriage, which is movable along the longitudinal axis together with the first carriage, wherein the second carriage is attached to the first carriage in such an articulated manner that the second carriage is movable with respect to the first carriage. In order to be able to simulate actual accident conditions better, in the test arrangement according to the invention, in addition to at least one first actuating element and at least one second actuating element, there is also provided at least one third actuating element, which is configured to accelerate the second carriage in a horizontal direction substantially perpendicular to the longitudinal axis.
System and method for forming a semiconductor device
A system and method for forming a semiconductor device is provided. The system may measure characteristics of the substrate to determine an amount of induced stress on the substrate. The measured characteristics may include warpage, reflectivity and/or crack information about the substrate. The induced stress may be determined, at least in part, based on the measured characteristics. The system may compare the induced stress on the substrate to a maximum intrinsic strength of the substrate and adjust an anneal for the substrate based on the comparison. The adjustment may reduce or limit breakage of the substrate during the anneal. The system may control at least one of a peak anneal temperature and a maximum anneal duration for an anneal unit, which may perform an anneal on the substrate. The measurements and control may be performed ex-situ or in-situ with the anneal.
Force measuring system with dual sensor
For measuring tensile and/or compressive loads force measuring systems are provided for measuring a tensile and/or compressive load of a structure have a first force measuring sensor assigned to the structure, and a second force measuring sensor assigned to the structure. To provide a force measuring system that enables high measuring accuracy, the first and the second force measuring sensor differ in such a way, that the first force measuring sensor is designed to measure a nominal load range, and the second force measuring sensor is designed to measure a sub-range of the nominal load range.