Patent classifications
G01N22/00
Sensing using inverse multiple scattering with phaseless measurements
A permittivity sensor, for determining an image of a distribution of permittivity of a material of an object in a scene, comprising an input interface, a hardware processor, and an output interface is provided. The input interface is configured to accept phaseless measurements of propagation of a known incident field through the scene and scattered by the material of the object in the scene. The hardware processor is configured to solve a multi-variable minimization problem over unknown phases of the phaseless measurements and unknown image of the permittivity of the material of the object by minimizing a difference of a nonlinear function of the known incident field and the unknown image with a product of known magnitudes of the phaseless measurements and the unknown phases. Further, the output interface is configured to render the permittivity of the material of the object provided by the solution of the multi-variable minimization problem.
Sensing using inverse multiple scattering with phaseless measurements
A permittivity sensor, for determining an image of a distribution of permittivity of a material of an object in a scene, comprising an input interface, a hardware processor, and an output interface is provided. The input interface is configured to accept phaseless measurements of propagation of a known incident field through the scene and scattered by the material of the object in the scene. The hardware processor is configured to solve a multi-variable minimization problem over unknown phases of the phaseless measurements and unknown image of the permittivity of the material of the object by minimizing a difference of a nonlinear function of the known incident field and the unknown image with a product of known magnitudes of the phaseless measurements and the unknown phases. Further, the output interface is configured to render the permittivity of the material of the object provided by the solution of the multi-variable minimization problem.
Method and system for determining dielectric properties of an object
In one aspect, a system for obtaining dielectric properties of an object is disclosed, which comprises a plurality of transceivers for generating radiation in the microwave or millimeter-wave region of the electromagnetic spectrum. The transceivers are positioned in spatially fixed relationships relative to one another. The system further includes a controller for selectively activating the transceivers for irradiating at least a portion of the object and detecting at least a portion of the radiation reflected from said portion of the object in response to the irradiation, where each of the activated transceivers generates a signal in response to detection of the reflected radiation. The reflected signals are analyzed to determine a plurality of reflectivity coefficients corresponding to different discrete locations of the object, and the reflectivity coefficients are used to determine the complex permittivity of the discrete locations.
Method and system for determining dielectric properties of an object
In one aspect, a system for obtaining dielectric properties of an object is disclosed, which comprises a plurality of transceivers for generating radiation in the microwave or millimeter-wave region of the electromagnetic spectrum. The transceivers are positioned in spatially fixed relationships relative to one another. The system further includes a controller for selectively activating the transceivers for irradiating at least a portion of the object and detecting at least a portion of the radiation reflected from said portion of the object in response to the irradiation, where each of the activated transceivers generates a signal in response to detection of the reflected radiation. The reflected signals are analyzed to determine a plurality of reflectivity coefficients corresponding to different discrete locations of the object, and the reflectivity coefficients are used to determine the complex permittivity of the discrete locations.
Electric light source device and lamp
Disinfection equipment, particularly an electric light source device and lamp. The electric light source device includes a lamp cap, a lamp housing, a connecting fitting, a reflection column and a supporting fitting which are connected in sequence from the top to the bottom and the electric light source device also includes a lamp tube, a net enclosure and a driving power supply provided inside the lamp housing, where the lamp tube includes several tubes which are connected in sequence and are provided around the reflection column, the end of the first tube and that of the last tube are respectively provided with the first electrode and the second electrode which respectively electrically connect to the driving power supply, the lamp housing is provided at one end of the tube with an electrode, and the lamp tube can emit 360° light around the reflection column.
Electric light source device and lamp
Disinfection equipment, particularly an electric light source device and lamp. The electric light source device includes a lamp cap, a lamp housing, a connecting fitting, a reflection column and a supporting fitting which are connected in sequence from the top to the bottom and the electric light source device also includes a lamp tube, a net enclosure and a driving power supply provided inside the lamp housing, where the lamp tube includes several tubes which are connected in sequence and are provided around the reflection column, the end of the first tube and that of the last tube are respectively provided with the first electrode and the second electrode which respectively electrically connect to the driving power supply, the lamp housing is provided at one end of the tube with an electrode, and the lamp tube can emit 360° light around the reflection column.
METHOD AND APPARATUS FOR MEASURING WOOD DENSITY OF LIVE TIMBER
A method and an apparatus were disclosed for measuring wood density of live timber. The method comprising: measuring a diameter of a test part of the live timber at a first height from a ground surface; transmitting and receiving microwave in a preset frequency range in air at a first distance greater than the diameter, measuring a first ratio of a transmitted microwave signal to a first received microwave signal at different frequencies; transmitting microwave in the air at the first height and microwave penetrates the test part, receiving the microwave at the first distance from the microwave transmitting position, measuring a second ratio of a transmitted microwave signal to a second received microwave signal at different frequencies, calculating a dielectric constant and an attenuation constant; calculating the wood density according to a relationship between the wood density and the dielectric constant and the attenuation constant.
MICROWAVE MOISTURE CONTENT SENSOR AND METHOD FOR DERIVING LINEAR REGRESSION CORRELATION BETWEEN MOISTURE CONTENT OF OBJECT AND SIGNAL MEASURED BY MOISTURE CONTENT SENSOR
A microwave coupling moisture content sensor and a method for deriving a linear regression correlation between signal data generated by a microwave moisture content sensor and moisture contents of objects are disclosed. The microwave coupling moisture content sensor includes a microwave resonator and a signal feeding member or a microwave emitting member. An object is placed outside the microwave resonator, and the signal feeding member or the microwave emitting member emits microwaves, which penetrate the object. The resonance frequency and the amplitude of the microwave resonator are measured to obtain the moisture content of the object. Several objects having known moisture contents are detected by the microwave coupling moisture content sensor to obtain corresponding resonance frequency and amplitude. Correlation coefficients of several combinations are calculated, and the combinations having low correlation coefficients are removed, whereby the best linear regression correlation is derived for the measurement of moisture contents of objects.
APPARATUS AND PROCESS FOR ELECTROMAGNETIC IMAGING
A computer-implemented process for electromagnetic imaging, the process including the steps of: accessing scattering data representing at least a two-dimensional array of measurements of electromagnetic wave scattering by internal features of an object, wherein each said measurement represents scattering of electromagnetic waves emitted by a corresponding antenna of an array of antennas disposed about the object as measured by a corresponding antenna of the array of antennas; and processing the scattering data to generate image data representing a spatial distribution of internal features of the object, wherein the generation of the image data does not involve tomographic reconstruction but is in accordance with a weighted mapping to directly map the measurements of electromagnetic wave scattering to a corresponding spatial distribution of electromagnetic wave scattering by the internal features of the object that corresponds to the physical shape of the object to enable the detection, localization, size estimation, shape estimation and classification of one or more features of interest of the object.
MICROFLUIDIC SENSOR CHIP AND MEASURING SYSTEM THEREOF
A microfluidic sensor chip includes a body comprising a substrate and an upper cover, and the upper cover having at least one opening, at least one microfluidic channel formed on the substrate and has a supporting surface, wherein the at least one microfluidic channel communicates with the at least one opening, and a metamaterial layer coated on the supporting surface, wherein the metamaterial layer has a plurality of regions, and each region has a corresponding resonance pattern. The present disclosure further provides a measuring system for microfluidic sensor chip includes a carrying board, a plurality of the microfluidic sensor chips, a transmitter emitting a terahertz wave corresponding to the resonance pattern of one of the microfluidic sensor chips, a receiver receiving a reflected wave corresponding to the terahertz wave, and a processor receiving the reflected wave from the processor, and determining a testing sample characteristic according to the reflected wave.