An apparatus, system and method suitable for detecting X-ray are disclosed. In one example, the apparatus comprises: an X-ray absorption layer and a mask; wherein the mask comprises a first window and a second window, and a portion between the first window and the second window; wherein the first and second windows are not opaque to an incident X-ray; wherein the portion is opaque to the incident X-ray; and wherein the first and second windows are arranged such that charge carriers generated in the X-ray absorption layer by an X-ray photon propagating through the first window and charge carriers generated in the X-ray absorption layer by an X-ray photon propagating through the second window do not spatially overlap.

A simulation apparatus includes: a factor amount converting information storage unit in which factor amount converting information, which is information indicating correspondence between low-fidelity information and high-fidelity information, is stored; a writing pattern information storage unit in which writing pattern information is stored; an ADI simulation unit that performs an ADI simulation using one or more evaluation points, for a writing pattern indicated by the writing pattern information, thereby acquiring one or more factor amounts; a converting unit that acquires high-fidelity information, which is one or more factor amounts, corresponding to the low-fidelity information, which is one or more factor amounts, using the factor amount converting information; and an etching simulation unit that performs an etching simulation using the one or more factor amounts acquired by the converting unit.

In a data processing apparatus, image data are calculated based on photon counts of an X-ray beam transmitted through an object. Based on the image data, X-ray attenuation information is calculated. The attenuation information includes i) inherent information inherently depending on a type or a property of the object, the inherent information being indicated by a quantity of a vector in an n-dimensional coordinate whose dimension is equal in number to the n-piece energy ranges; and ii) associated information being associated with the inherent information and depending on a length of a path along which the X-ray beam passes though the object. From the attenuation information, only the inherent information is produced which is independent of the associated information. Scattering points corresponding to the inherent information are calculated to be mapped in the n-dimensional coordinate or in a coordinate whose dimension is less than the n-dimensional coordinate.

A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.

A system for locating and tracking an object is provided. The system includes a measuring device configured to determine a property of a paving-related material, a locating device configured to determine a location of the measuring device, a tracking system configured to store tracking information associated with the measuring device and one or more properties determined by the measuring device, and a communications system configured to transfer, to a remote device, the location of the measuring device and the tracking information associated with the measuring device.

A hybrid inspection system of the present invention is an inspection system including a first inspection device (1) for inspecting a sample (11) based on X-ray measurement data obtained by irradiating the sample (11) with X-rays, and a second inspection device (2) for inspecting the sample (11) by a measuring method using no X-rays. The X-ray measurement data obtained by the first inspection device or an analysis result of the X-ray measurement data is output to the second inspection device (2). In the second inspection device (2), the structure of the sample (11) is analyzed by using the X-ray measurement data input from the first inspection device (1) or the analysis result of the X-ray measurement data.

Between an X-ray source and a rotating stage 13, a marker member including a flat plate 21 formed with markers M and a support part 22 supporting the flat plate 21 is arranged. The formation positions of the markers M on the flat plate 21 are set to positions that allow the distance between the markers M to be most separated in an area in which both of the markers M are not superimposed on a projection image of a subject within the detection range of an X-ray detector 12 and that is constantly included within the detection range even when an X-ray focal point is moved. Also, the length of the support part 22 is adjusted to a length resulting in a side end of the detection range of the X-ray detector where the flat plate 21 and the markers M are not superimposed on the subject W on a projection image.

The present invention relates to a hard X-ray photoelectron spectroscopy (HAXPES) system comprising an X-ray source providing a beam of photons which is directed through the system so as to excite electrons from an illuminated sample. An X-ray tube is connected to a monochromator vacuum chamber in which a crystal is configured to monochromatize and focus the beam onto an illuminated sample. A hemispherical electron energy analyser is mounted onto the analysis chamber. An air gap is provided between the X-ray tube and the monochromator chamber, which air gap is provided with a first radiation trap to shield the ambient air from the radiation when the air gap is illuminated with X-rays from the source.

The present invention considers bringing a mobile unit closer to the site of interest and conduct the quantification of the tracers by performing the detection methods in situ and in real time at the wellhead, and that can be moved to the site on numerous occasions for the preparation of results during the test where the quantification of tracers is necessary, helping to speed up and reduce times that, until now, have not been achieved with stationary laboratories and that depending on the laboratory can last up to three months providing results.

An integrated process and system for measurement and treatment of toxic gases in deep natural gas. The process comprises: cooling and depressurizing deep natural gas and then drying same; sequentially performing radon, hydrogen sulfide, and mercury measurements on the dried deep natural gas; if it is found after the measurements that the concentrations of mercury, radon, and hydrogen sulfide in the deep natural gas reach standards, delivering the deep natural gas to a gas transmission pipeline; if it is found after the measurements that the concentrations of radon, hydrogen sulfide, and mercury in the deep natural gas are substandard, sequentially performing harmless treatment on radon and partial mercury, hydrogen sulfide, and remaining mercury in the deep natural gas; sequentially performing mercury, radon, and hydrogen sulfide measurements on the deep natural gas having experienced the harmless treatment; if the concentrations of mercury, radon, and hydrogen sulfide in the deep natural gas reach the standards, delivering the deep natural gas having experienced the harmless treatment to the gas transmission pipeline; and if the concentrations of mercury, radon, and hydrogen sulfide in the deep natural gas are substandard, continuing to sequentially perform harmless treatment on radon and partial mercury, hydrogen sulfide, and remaining mercury in the deep natural gas, until the concentrations thereof reach the standards.