An apparatus for identifying a material within a sample comprising signal generation circuitry generates a first signal including a first orbital angular momentum (OAM) signature and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and identifies the material within the sample based on a detected second orbital angular momentum caused by an interaction of the first signal with chiral molecules within the sample.

A fluid flow meter can include a sensor capable of transmitting a transmit signal to propagate, at least partially, through a fluid in a pipe and receiving a respective receive signal. The fluid flow meter can include a memory storing computer code instructions and a plurality of pipe type signatures associated with a plurality of pipe types. Each pipe type signature of a respective pipe type of the plurality of pipe types can include one or more characteristics of receive signals associated with that pipe type. The fluid flow meter can also include a processor communicatively coupled to the sensor and to the memory. When executing the computer code instructions, the processor can determine one or more signal features of the receive signal, and identify a pipe type of the pipe based on the one or more signal features of the receive signal and the plurality of pipe type signatures.

An apparatus detects a material within a sample using signal generation circuitry that generates an orbital angular momentum (OAM) twisted light beam having at least one orbital angular momentum applied thereto. The signal generation circuitry applies the at least one OAM twisted light beam to the sample. The OAM twisted light beam includes at least one fractional OAM state, at least one intensity signature and at least one phase signature unique to the material within the sample. A detector receives the OAM twisted light beam after the OAM twisted light beam passes through the sample and detects the material responsive to a presence of a unique combination of the at least one fractional OAM state, the at least one intensity signature and the at least one phase signature.

An apparatus detects a material within a sample using signal generation circuitry that generates an orbital angular momentum (OAM) twisted light beam having at least one orbital angular momentum applied thereto. The signal generation circuitry applies the at least one OAM twisted light beam to the sample. The OAM twisted light beam includes at least one fractional OAM state, at least one intensity signature and at least one phase signature unique to the material within the sample. A detector receives the OAM twisted light beam after the OAM twisted light beam passes through the sample and detects the material responsive to a presence of a unique combination of the at least one fractional OAM state, the at least one intensity signature and the at least one phase signature.

An apparatus for identifying a concentration of a specific material within a first material includes an input for receiving a signal after the signal passes through the first material. The signal has at least one orthogonal function therein and the at least one orthogonal function comprises at least one of an orbital angular momentum function or a Laguerre-Gaussian function. A detector detects the at least one orthogonal function within the signal, determines the concentration of the specific material within the first material based upon the detected at least one orthogonal function and generates an indication responsive to the determination. An output provides for an output of the generated indication.

An apparatus for identifying a concentration of a specific material within a first material includes an input for receiving a signal after the signal passes through the first material. The signal has at least one orthogonal function therein and the at least one orthogonal function comprises at least one of an orbital angular momentum function or a Laguerre-Gaussian function. A detector detects the at least one orthogonal function within the signal, determines the concentration of the specific material within the first material based upon the detected at least one orthogonal function and generates an indication responsive to the determination. An output provides for an output of the generated indication.

An apparatus for detecting a presence of a predetermined material within a sample uses signal generation circuitry for generating a first signal having a first distinct signature including a first eccentricity of a mode intensity, a first shift in a center of the mode intensity and a first rotation of an ellipsoidal intensity output of the mode intensity and applying the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and detects a second distinct signature including a second eccentricity of the mode intensity, a second shift in the center of the mode intensity and a second rotation of the ellipsoidal intensity output of the mode intensity. The detector also determines the presence of the predetermined material within the sample based on the detected second distinct signature within the first signal received from the sample and provides an output of an indication of the presence of the predetermined material responsive to the determination.

An apparatus for detecting a presence of a predetermined material within a sample uses signal generation circuitry for generating a first signal having a first distinct signature including a first eccentricity of a mode intensity, a first shift in a center of the mode intensity and a first rotation of an ellipsoidal intensity output of the mode intensity and applying the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and detects a second distinct signature including a second eccentricity of the mode intensity, a second shift in the center of the mode intensity and a second rotation of the ellipsoidal intensity output of the mode intensity. The detector also determines the presence of the predetermined material within the sample based on the detected second distinct signature within the first signal received from the sample and provides an output of an indication of the presence of the predetermined material responsive to the determination.

The invention features a method of monitoring a clotting process by measuring a signal characteristic of the NMR relaxation of water in a sample undergoing clotting to produce NMR relaxation data and determining from the NMR relaxation data a magnetic resonance parameter of water in the sample characteristic of the clots being formed.

The invention generally relates to methods and devices for synchronization of ion generation with cycling of a discontinuous atmospheric interface. In certain embodiments, the invention provides a system for analyzing a sample that includes a mass spectrometry probe that generates sample ions, a discontinuous atmospheric interface, and a mass analyzer, in which the system is configured such that ion formation is synchronized with cycling of the discontinuous atmospheric interface.