Computer-based computational tools for use in determining spatial charge distributions for biological systems that include one or more biological membranes are provided. At least one of the biological membrane includes at least two regions having different electrical properties, e.g., the biological membrane can include a pore having a higher conductivity than the surrounding bulk membrane. In other cases, the membrane can include non-active and active regions, with conservative fields acting at the non-active regions and a combination of conservative and non-conservative fields acting at the active regions. The non-conservative fields can, for example, originate from differences in ionic concentrations of the type which generate Nernst potential differences across membranes. Using the computer-based computational tools, charge distributions not previously known to exist have been discovered, e.g., ring-shaped charge distributions in the vicinity of an active pore.

Computer-based computational tools for use in determining spatial charge distributions for biological systems that include one or more biological membranes are provided. At least one of the biological membrane includes at least two regions having different electrical properties, e.g., the biological membrane can include a pore having a higher conductivity than the surrounding bulk membrane. In other cases, the membrane can include non-active and active regions, with conservative fields acting at the non-active regions and a combination of conservative and non-conservative fields acting at the active regions. The non-conservative fields can, for example, originate from differences in ionic concentrations of the type which generate Nernst potential differences across membranes. Using the computer-based computational tools, charge distributions not previously known to exist have been discovered, e.g., ring-shaped charge distributions in the vicinity of an active pore.

A fluid sensor for detecting a content change, in particular a liquid front, in a sensor portion of a fluid system, wherein the fluid sensor includes at least one sensor electrode, the sensor electrode having an electrode potential and a capacitive behavior, the sensor electrode thus being capable to store electrical energy in an electrical field formed by the sensor electrode when being charged, causing the electrode potential to change accordingly, a capacitance value of the sensor electrode varies when the content changes, the fluid sensor includes evaluation electronics, the evaluation electronics including a unidirectional electrical device (UED), and an AC source, the AC source is coupled via the UED to the sensor electrode to charge the sensor electrode, and the evaluation electronics include a discharge path coupled to the sensor electrode for discharging the sensor electrode.

A subsea production system for producing fluids from a subsea well in a subsea field. The production system includes a production facility and a production umbilical connecting the subsea well with the production facility. The production system also includes a control system for controlling production from the subsea well. The control system includes a first redundant master control station system (redundant MCS) at a first location, the redundant MCS capable of controlling production from the subsea well. The control system also includes a second redundant MCS at a second location, the second redundant MCS capable of controlling production from the subsea well. The redundant MCSs are synchronized to keep the same electronic data at both locations and to prevent conflicts in control signals from the redundant MCSs.

There is described a device for identifying an asset. The device comprises (a) a piece of material having predetermined physical properties, the piece of material being adapted to be irreversibly attached to the asset, (b) a stimulation and measurement unit attached to the piece of material, the stimulation and measurement unit being adapted to apply a predetermined stimulation to the piece of material and to measure a corresponding response from the piece of material, (c) an analysis unit adapted to analyze the measured response from the piece of material, and (d) a communication unit adapted to output data representative of the analysis of the measured response. There is also described an asset, an identification system and a method of identifying an asset. Furthermore, there is described a computer program.

There is described a device for identifying an asset. The device comprises (a) a piece of material having predetermined physical properties, the piece of material being adapted to be irreversibly attached to the asset, (b) a stimulation and measurement unit attached to the piece of material, the stimulation and measurement unit being adapted to apply a predetermined stimulation to the piece of material and to measure a corresponding response from the piece of material, (c) an analysis unit adapted to analyze the measured response from the piece of material, and (d) a communication unit adapted to output data representative of the analysis of the measured response. There is also described an asset, an identification system and a method of identifying an asset. Furthermore, there is described a computer program.

A sample analyzer comprising: a sample preparing section for preparing first and second measurement sample including reagent and sample; a first detector for detecting a predetermined component in the first measurement sample prepared by the sample preparing section; a second detector for detecting the predetermined component in the second measurement sample prepared by the sample preparing section; and a controller configured for performing operations, comprising: (a) controlling the first detector to detect the predetermined component in the first measurement sample prepared by the sample preparing section; (b) determining the reliability of the result detected by the first detector; (c) controlling the sample preparing section to prepare the second measurement sample from the same sample when the result has been determined to be unreliable; and (d) controlling the second detector to detect the predetermined component in the second measurement sample, is disclosed.

A sample analyzer comprising: a sample preparing section for preparing first and second measurement sample including reagent and sample; a first detector for detecting a predetermined component in the first measurement sample prepared by the sample preparing section; a second detector for detecting the predetermined component in the second measurement sample prepared by the sample preparing section; and a controller configured for performing operations, comprising: (a) controlling the first detector to detect the predetermined component in the first measurement sample prepared by the sample preparing section; (b) determining the reliability of the result detected by the first detector; (c) controlling the sample preparing section to prepare the second measurement sample from the same sample when the result has been determined to be unreliable; and (d) controlling the second detector to detect the predetermined component in the second measurement sample, is disclosed.

The present invention discloses a gas analyzing apparatus and a sampling device. The gas analyzing apparatus includes a sampling device and an ion mobility spectrum analysis device. The sampling device includes a multi-capillary column and a temperature control system. The ion mobility spectrum analysis device is adapted for analyzing a gas leaded-in by the sampling device and includes a reaction cavity for reaction between sample molecules and reaction ions, the cavity having a sampling opening for leading-in of the gas. An outlet end of the multi-capillary column is inserted directly into the cavity of the ion mobility spectrum analysis device through the sampling opening of the ion mobility spectrum analysis device.

A method for evaluating concentration of defect in silicon single crystal substrate, defect being formed by particle beam irradiation in silicon single crystal substrate, including the steps of: measuring a resistivity of silicon single crystal substrate, followed by irradiating silicon single crystal substrate with particle beam, re-measuring resistivity of silicon single crystal substrate after irradiation; determining each carrier concentration in silicon single crystal substrate before and after irradiation on basis of measured results of resistivity before and after particle beam irradiation to calculate rate of change of carrier concentration; and evaluating concentration of VV defect on basis of rate of change of carrier concentration, VV defect being made of a silicon atom vacancy and being formed by particle beam irradiation in silicon single crystal substrate. The method can simply evaluate concentration of VV defect formed in silicon single crystal substrate by particle beam irradiation.