Patent classifications
G01P3/00
METHOD AND SYSTEM FOR PROCESSING WAFER
The present disclosure provides a method and a system therefore for processing wafer. The method includes: monitoring a distribution of particles in a chamber while processing the wafer; determining at least one parameter according to the distribution of the particles for configuring at least one device of the chamber; configuring the at least one device of the chamber according to the at least one parameter; and processing another wafer based on a recipe after configuring the at least one device of the chamber.
Athletic performance and technique monitoring
Methods and apparatuses for athletic performance and technique monitoring are disclosed. In one example, a sensor output is received associated with a movement of a user torso during a running motion. The sensor output is analyzed to identify an undesirable torso motion.
Athletic performance and technique monitoring
Methods and apparatuses for athletic performance and technique monitoring are disclosed. In one example, a sensor output is received associated with a movement of a user torso during a running motion. The sensor output is analyzed to identify an undesirable torso motion.
Determining a noise based start of motion of an implement of a work machine
A control may obtain first data related to a plurality of positions of an implement of a work machine during a first time period and may determine, based on the first data, a first noise value related to at least one velocity of the implement for the first time period. The control device may obtain second data related to a plurality of positions of the implement during a second time period and may determine, based on the second data, a second noise value related to at least one velocity of the implement for the second time period. The control device may determine, based on the first noise value and the second noise value, a start of motion of the implement. The control device may cause, based on determining the start of motion of the implement, the implement to be calibrated.
Determining a noise based start of motion of an implement of a work machine
A control may obtain first data related to a plurality of positions of an implement of a work machine during a first time period and may determine, based on the first data, a first noise value related to at least one velocity of the implement for the first time period. The control device may obtain second data related to a plurality of positions of the implement during a second time period and may determine, based on the second data, a second noise value related to at least one velocity of the implement for the second time period. The control device may determine, based on the first noise value and the second noise value, a start of motion of the implement. The control device may cause, based on determining the start of motion of the implement, the implement to be calibrated.
Display panel
An information panel or display panel suitable for mounting onto the top of a vehicle is disclosed. Information such as advertisement can be change automatically. Change of advertisement content is responsive to the speed of the vehicle.
SYSTEMS AND METHODS FOR STUDYING ROTATIONAL HEAD INJURY
The disclosure provides a cranial rotation system, including a subject stage configured to support a subject; a cranial support configured to support a cranium of the subject and rotate relative to the subject stage; subject stage a motor configured to rotate the cranial support about a rotational axis; and a controller configured to operate the motor.
SYSTEMS AND METHODS FOR STUDYING ROTATIONAL HEAD INJURY
The disclosure provides a cranial rotation system, including a subject stage configured to support a subject; a cranial support configured to support a cranium of the subject and rotate relative to the subject stage; subject stage a motor configured to rotate the cranial support about a rotational axis; and a controller configured to operate the motor.
MULTI-MODE MICROWAVE WAVEGUIDE BLADE SENSING SYSTEM
A multi-mode microwave waveguide blade sensing system includes a transceiver, a waveguide, and a probe sensor. The transceiver generates a microwave energy signal having a first waveguide mode and a different second waveguide mode. The waveguide includes a first end that receives the microwave energy signal. The probe sensor includes a proximate end that receives the microwave energy signal from the transceiver and a distal end including an aperture that outputs the microwave energy signal. The probe sensor directs the microwave energy signal at a first direction based on the first waveguide mode and a different second direction different based on the second waveguide mode. The probe sensor receives different levels of reflected microwave energy based at least in part on a location at which the at least one microwave energy signal is reflected from the machine.
MULTI-MODE MICROWAVE WAVEGUIDE BLADE SENSING SYSTEM
A multi-mode microwave waveguide blade sensing system includes a transceiver, a waveguide, and a probe sensor. The transceiver generates a microwave energy signal having a first waveguide mode and a different second waveguide mode. The waveguide includes a first end that receives the microwave energy signal. The probe sensor includes a proximate end that receives the microwave energy signal from the transceiver and a distal end including an aperture that outputs the microwave energy signal. The probe sensor directs the microwave energy signal at a first direction based on the first waveguide mode and a different second direction different based on the second waveguide mode. The probe sensor receives different levels of reflected microwave energy based at least in part on a location at which the at least one microwave energy signal is reflected from the machine.