Patent classifications
G01P13/00
Apparatus and exercising device
According to an example aspect of the present invention, there is provided an apparatus comprising at least one processing core, at least one memory including computer program code, the at least one memory and the computer program code being configured to, with the at least one processing core, cause the apparatus at least to receive a first signal from an exercising device, process the received signal, respond to the received signal by transmitting a second signal to the exercising device, and participate in a pairing process with the exercising device.
CHILD PRESENCE DETECTION IN A CAR
A system for detecting the presence of a person in an automobile includes a computing device and a microelectromechanical system (MEMS) sensor integrated into the automobile and configured to generate sensor data representing movement of the person in the automobile, the MEMS sensor being in operative communication with the computing device. The computing device is configured to process the sensor data from the MEMS sensor to detect the presence of a person in the automobile when the automobile is parked.
CHILD PRESENCE DETECTION IN A CAR
A system for detecting the presence of a person in an automobile includes a computing device and a microelectromechanical system (MEMS) sensor integrated into the automobile and configured to generate sensor data representing movement of the person in the automobile, the MEMS sensor being in operative communication with the computing device. The computing device is configured to process the sensor data from the MEMS sensor to detect the presence of a person in the automobile when the automobile is parked.
METHODS AND SYSTEMS FOR DETECTING WIND SHEAR CONDITIONS IN AN URBAN AIRSPACE
Disclosed are methods, systems, and non-transitory computer-readable media for detecting wind shear conditions in an urban airspace. For instance, the method may include obtaining aircraft information related to an aircraft in the urban airspace, accessing three-dimensional building information corresponding to the airspace, obtaining wind speed and direction data from a plurality of sensors provided about the airspace, and detecting wind shear conditions in at least a portion of the airspace based on the obtained wind speed and direction data. The method may further include determining real-time flight safety parameters in the portion of the airspace based on the wind shear conditions detected in at least the portion of the airspace, analyzing the determined real-time flight safety parameters along a designated flight path through the portion of the airspace to determine whether an unsafe flight condition exists, and transmitting the analysis to the aircraft or a remote operating station.
METHOD FOR ASCERTAINING A STATE OF OPERATING DYNAMICS OF A BICYCLE
A method for ascertaining a state of operating dynamics of a bicycle. The method includes: providing signals regarding an acceleration in at least one spatial direction and regarding a rate of rotation about at least one spatial direction, with the aid of an inertial measuring device; providing speed signals of an incremental encoder; and ascertaining the state of operating dynamics on the basis of an estimation method, in light of the provided signals; the current riding state being ascertained, and in the case of a dead stop of the bicycle as a current, ascertained riding state, substitute speed signals being provided in place of the speed signals of the incremental encoder, in order to estimate the state of operating dynamics for the estimation method.
METHOD FOR ASCERTAINING A STATE OF OPERATING DYNAMICS OF A BICYCLE
A method for ascertaining a state of operating dynamics of a bicycle. The method includes: providing signals regarding an acceleration in at least one spatial direction and regarding a rate of rotation about at least one spatial direction, with the aid of an inertial measuring device; providing speed signals of an incremental encoder; and ascertaining the state of operating dynamics on the basis of an estimation method, in light of the provided signals; the current riding state being ascertained, and in the case of a dead stop of the bicycle as a current, ascertained riding state, substitute speed signals being provided in place of the speed signals of the incremental encoder, in order to estimate the state of operating dynamics for the estimation method.
Processing system for dynamic event verification and sensor selection
Aspects of the disclosure relate to computing platforms that utilize improved techniques for dynamic event verification. A computing platform may receive first source data comprising driving data associated with a vehicle over a time period. Based on the first source data, the computing device may determine that the vehicle experienced an event, resulting in an event output. In response to determining the event output, the computing device may generate a request for second source data associated with the vehicle over the time period. The computing device may receive, from a sensor device, the second source data. Based on a comparison of the first source data to the second source data, the computing platform may determine an event comparison output. The computing platform may determine that the event comparison output exceeds a predetermined comparison threshold, and may send an indication of an event in response.
Processing system for dynamic event verification and sensor selection
Aspects of the disclosure relate to computing platforms that utilize improved techniques for dynamic event verification. A computing platform may receive first source data comprising driving data associated with a vehicle over a time period. Based on the first source data, the computing device may determine that the vehicle experienced an event, resulting in an event output. In response to determining the event output, the computing device may generate a request for second source data associated with the vehicle over the time period. The computing device may receive, from a sensor device, the second source data. Based on a comparison of the first source data to the second source data, the computing platform may determine an event comparison output. The computing platform may determine that the event comparison output exceeds a predetermined comparison threshold, and may send an indication of an event in response.
Methods and systems to measure properties of products on a moving blade in electronic device manufacturing machines
Implementations disclosed describe an optical inspection device comprising a source of light to direct a light beam to a location on a surface of a wafer, the wafer being transported from a processing chamber, wherein the light beam is to generate, a reflected light, an optical sensor to collect a first data representative of a direction of the first reflected light, collect a second data representative of a plurality of values characterizing intensity of the reflected light at a corresponding one of a plurality of wavelengths, and a processing device, in communication with the optical sensor, to determine, using the first data, a position of the surface of the wafer; retrieve calibration data, and determine, using the position of the surface of the wafer, the second data, and the calibration data, a characteristic representative of a quality of the wafer.
Methods and systems to measure properties of products on a moving blade in electronic device manufacturing machines
Implementations disclosed describe an optical inspection device comprising a source of light to direct a light beam to a location on a surface of a wafer, the wafer being transported from a processing chamber, wherein the light beam is to generate, a reflected light, an optical sensor to collect a first data representative of a direction of the first reflected light, collect a second data representative of a plurality of values characterizing intensity of the reflected light at a corresponding one of a plurality of wavelengths, and a processing device, in communication with the optical sensor, to determine, using the first data, a position of the surface of the wafer; retrieve calibration data, and determine, using the position of the surface of the wafer, the second data, and the calibration data, a characteristic representative of a quality of the wafer.