Patent classifications
G01Q30/00
Metrology devices for rapid specimen setup
An example metrology device can include a first stage including a microelectromechanical (MEMS) device having a probe, and a second stage configured to hold a sample. The metrology device can also include a kinematic coupler for constraining the first stage in a fixed position relative to the second stage. The probe of the MEMS device can be aligned with a portion of the sample when the first stage is constrained in the fixed position relative to the second stage.
Metrology devices for rapid specimen setup
An example metrology device can include a first stage including a microelectromechanical (MEMS) device having a probe, and a second stage configured to hold a sample. The metrology device can also include a kinematic coupler for constraining the first stage in a fixed position relative to the second stage. The probe of the MEMS device can be aligned with a portion of the sample when the first stage is constrained in the fixed position relative to the second stage.
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.
ATOMIC FORCE MICROSCOPY APPARATUS, METHODS, AND APPLICATIONS
Atomic force microscopy apparatus and method that enable observing charge generation transients with nanometer spatial resolution and nanosecond to picosecond time resolution, the timescale relevant for studying photo-generated charges in the world's highest efficiency photovoltaic films. The AFM apparatus includes an AFM, a light source for illumination of a sample operatively coupled to the AFM, a voltage source operatively coupled to the AFM, and a control circuitry operatively coupled to the light source and the voltage source. The AFM apparatus improves the time resolution and enables rapid acquisition of photocapacitance transients in a wide array of solar-energy-harvesting materials.
Microscopic image recognition system and method for detecting protein-based molecule
A microscopic image recognition system for detecting a protein-based molecule by presenting a recognition image is provided. The protein-based molecule has a state of a monomer. The microscopic image recognition system includes an image capturing unit, a monomer tracking module and a texture mask. The image capturing unit is configured to capture an original image of the protein-based molecule. The monomer tracking module is configured to capture a monomer image from the original image based on a predetermined size and a predetermined brightness. The predetermined size and the predetermined brightness correspond to the monomer. The texture mask is configured to perform a two-dimensional masking process on the monomer image to form at least two texture images. The recognition image is formed by superimposing the at least two texture images. A microscopic image recognition method is also provided.
METROLOGY DEVICES FOR RAPID SPECIMEN SETUP
An example metrology device can include a first stage including a microelectromechanical (MEMS) device having a probe, and a second stage configured to hold a sample. The metrology device can also include a kinematic coupler for constraining the first stage in a fixed position relative to the second stage. The probe of the MEMS device can be aligned with a portion of the sample when the first stage is constrained in the fixed position relative to the second stage.
METROLOGY DEVICES FOR RAPID SPECIMEN SETUP
An example metrology device can include a first stage including a microelectromechanical (MEMS) device having a probe, and a second stage configured to hold a sample. The metrology device can also include a kinematic coupler for constraining the first stage in a fixed position relative to the second stage. The probe of the MEMS device can be aligned with a portion of the sample when the first stage is constrained in the fixed position relative to the second stage.
Scanning probe system with multiple probes
A method of operating a scanning probe system that includes a probe support and probes carried by the probe support is disclosed. Each probe includes a cantilever extending from the support to a free end and a tip carried by the free end. The system is operated to perform interaction cycles, each including in an approach phase, moving the support so that the tips move together towards the sample surface; in a detection step, generating a surface signal on detection of an interaction of the tip(s) of a first subset of the probes with the sample surface before the rest of the probes have interacted with the sample; in a response step changing a shape of the cantilever(s) of the first subset in response to the generation of the surface signal; and in a retract phase moving the support so that the tips retract together away from the sample surface.
Scanning probe system with multiple probes
A method of operating a scanning probe system that includes a probe support and probes carried by the probe support is disclosed. Each probe includes a cantilever extending from the support to a free end and a tip carried by the free end. The system is operated to perform interaction cycles, each including in an approach phase, moving the support so that the tips move together towards the sample surface; in a detection step, generating a surface signal on detection of an interaction of the tip(s) of a first subset of the probes with the sample surface before the rest of the probes have interacted with the sample; in a response step changing a shape of the cantilever(s) of the first subset in response to the generation of the surface signal; and in a retract phase moving the support so that the tips retract together away from the sample surface.
MICROSCOPIC IMAGE RECOGNITION SYSTEM AND METHOD FOR DETECTING PROTEIN-BASED MOLECULE
A microscopic image recognition system for detecting a protein-based molecule by presenting a recognition image is provided. The protein-based molecule has a state of a monomer. The microscopic image recognition system includes an image capturing unit, a monomer tracking module and a texture mask. The image capturing unit is configured to capture an original image of the protein-based molecule. The monomer tracking module is configured to capture a monomer image from the original image based on a predetermined size and a predetermined brightness. The predetermined size and the predetermined brightness correspond to the monomer. The texture mask is configured to perform a two-dimensional masking process on the monomer image to form at least two texture images. The recognition image is formed by superimposing the at least two texture images. A microscopic image recognition method is also provided.