A wafer test machine is disclosed. The wafer test machine comprises a main body having a chamber defined therein, wherein a probe card is disposed at an upper portion of the chamber; a chuck for fixing a wafer in the chamber; a moving unit for moving the chuck in the chamber, thus making a contact between the probe card and the wafer; and a laser cleaning apparatus for cleaning the probe card in the chamber using a laser beam, when the probe card does not contact the wafer.

An embodiment of a nuclear magnetic resonance (NMR) apparatus for estimating properties of an earth formation includes an NMR measurement device including a transmitting assembly configured to emit a pulse sequence and a receiving assembly configured to detect an echo train based on the pulse sequence, and a processor. The processor is configured to perform receiving input parameters including an axial speed of the NMR measurement device and a T.sub.1 value associated with a selected formation fluid, analyzing polarization data associated with the T.sub.1 value, the polarization data describing a dependency between polarization and axial speed, determining a wait time for the pulse sequence based on the polarization data, applying the pulse sequence with the determined wait time to the transmitting assembly, and estimating a property of the earth formation based on the echo train detected by the receiving assembly in response to the pulse sequence.

A measurement apparatus comprising a controller configured to control functions of said measurement apparatus in response to retrieved user motion data (UMD) of at least one associated user of said measurement apparatus.

A current sensor includes a first current pathway, a first magnetic sensor arranged near the first current pathway, a second magnetic sensor arranged opposite the first magnetic sensor with the first current pathway in between, a second current pathway, a third magnetic sensor arranged near the second current pathway, a fourth magnetic sensor arranged opposite the third magnetic sensor with the second current pathway in between, and a signal processor that generates a signal based on a quantity of the first measured current from output of the first magnetic sensor and output of the second magnetic sensor, and also generates a signal based on a quantity of the second measured current from output of the third magnetic sensor and output of the fourth magnetic sensor.

In some embodiments, a magnetometer mounting apparatus and system may reduce noise and magnetic flux interference by mounting the magnetometer inside a cavity in a collar that fits around a tool insert. The cavity may be sealed with a hatch cover/outsert. Another embodiment mounts a plurality of magnetometers around the periphery of a mounting ring that is coupled to the insert. Yet another embodiment mounts the magnetometers in a gap sub in the BHA. Still another embodiment longitudinally mounts the magnetometers on the insert such that a diagonal distance between two magnetometers is the greatest possible on the insert.

In some embodiments, a magnetometer mounting apparatus and system may reduce noise and magnetic flux interference by mounting the magnetometer inside a cavity in a collar that fits around a tool insert. The cavity may be sealed with a hatch cover/outsert. Another embodiment mounts a plurality of magnetometers around the periphery of a mounting ring that is coupled to the insert. Yet another embodiment mounts the magnetometers in a gap sub in the BHA. Still another embodiment longitudinally mounts the magnetometers on the insert such that a diagonal distance between two magnetometers is the greatest possible on the insert.

To accurately predict a sensor value even in the case where external force is received. A control apparatus according to the present disclosure includes: a prediction section (260) configured to, in an actuator including a torque sensor that detects torque generated at a driving shaft, and an encoder that detects a rotational angle of the driving shaft, predict a detection value of the encoder on a basis of a detection value of the torque sensor, or predict the detection value of the torque sensor on a basis of the detection value of the encoder; and a trouble determination section (266) configured to compare a prediction value predicted by the prediction section with an actually measured value of the torque sensor or the encoder to perform trouble determination on the torque sensor or the encoder.

In an EPI acquisition sequence for magnetic resonance signals k-space is scanned along sets of lines in k-space along opposite propagation directions, e.g. odd and even lines in k-space. Phase errors that occur due to the opposite propagation directions are corrected for in a SENSE-type parallel imaging reconstruction. The phase error distribution in image space may be initially estimated, calculated form the phase difference between images reconstructed from magnetic resonance signals acquired from the respective sets of k-space lines, or from an earlier dynamic.

In an EPI acquisition sequence for magnetic resonance signals k-space is scanned along sets of lines in k-space along opposite propagation directions, e.g. odd and even lines in k-space. Phase errors that occur due to the opposite propagation directions are corrected for in a SENSE-type parallel imaging reconstruction. The phase error distribution in image space may be initially estimated, calculated form the phase difference between images reconstructed from magnetic resonance signals acquired from the respective sets of k-space lines, or from an earlier dynamic.

A power monitoring system includes a plurality of current sensors suitable to sense respective changing electrical current within a respective conductor to a respective load and a conductor sensing a respective voltage potential provided to the respective load. A power monitors determines a type of circuit based upon a signal from at least one of the current sensors and a signal from the conductor, wherein the type of circuit includes at least one of a single phase circuit, a two phase circuit, and a three phase circuit. The power meter configures a set of registers corresponding to the determined type of circuit in a manner such that the configuring is different based upon each of the single phase circuit, two phase circuit, and three phase circuit suitable to provide data corresponding to the determined type of circuit.