A method for producing a contact spacing converter space transformer) which has electrical contacts that form electrical paths and in which a first contact spacing of the contacts is converted into a comparatively different, second contact spacing of the electrical contacts including producing at least one base part from each of at least some of the electrical contacts. At least a section of the base part is produced from plastic. The method subsequently includes metallization of at least the section of the base part that is produced from plastic.

A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.

A probe calibration device that includes a first offset element having a substantially rectangular first aperture. The probe calibration device includes a tuned pass element disposed adjacent to the first offset element. The tuned pass element has a non-rectangular second aperture. The probe calibration device includes a second offset element disposed adjacent to the tuned pass element and on a side opposite the first offset element. The second offset element has a substantially rectangular third aperture. The probe calibration device includes a backing element disposed adjacent to the second offset element. The first offset element, the tuned pass element, the second offset element and the backing element form a cavity.

The present disclosure provides a light-on detection device and a light-on detection method. The light-on detection device includes a substrate, and a probe block provided with probes and connected to the substrate. The light-on detection device further includes a flattening element configured to apply a force onto a surface of the display panel so as to change the surface of the display panel from a first shape having a first height difference to a second shape having a second height difference less than the first height difference, thereby to enable the probes to perform the light-on detection on the display panel with the second shape.

An anisotropic conductive sheet, in which the arrangement interval of the structure that exhibits conductivity in a planar section is relatively small, comprises an elastic layer having resin as the main component, and a plurality of CNT pillars that are formed from CNT fiber bundles and penetrate the elastic layer in the thickness direction. The electrical inspection head measures electrical characteristics between a plurality of measurement points of a measurement target, and comprises a measurement substrate having a plurality of electrode pads on its surface that opposes the measurement points, and an anisotropic conductive sheet laminated on that surface. The method for manufacturing an anisotropic conductive sheet comprises growing a plurality of CNT pillars formed from CNT fiber bundles by chemical vapor deposition by arranging catalysts on the surface of a growth substrate, and filling the space between the plurality of CNT pillars with a resin composition.

A magnetic sensor includes: a magnetoresistive effect element having a sensitivity axis in a specific direction in which a fixed magnetic layer, a nonmagnetic material layer, and a free magnetic layer are laminated in this order; an antiferromagnetic layer which generates an exchange coupling bias with the free magnetic layer and which aligns the magnetization direction thereof in a predetermined direction provided on the free magnetic layer; and a ferromagnetic layer which generates an exchange coupling bias with the antiferromagnetic layer and which aligns the magnetization direction thereof in a predetermined direction provided on the antiferromagnetic layer. The magnetization direction on the exchange coupling bias in the free magnetic layer is the same direction as that on the exchange coupling bias in the ferromagnetic layer, and the ferromagnetic layer is able to impart a reflux magnetic field having a component along a sensitivity axis to the free magnetic layer.

A magnetic sensor includes: a magnetoresistive effect element having a sensitivity axis in a specific direction in which a fixed magnetic layer, a nonmagnetic material layer, and a free magnetic layer are laminated in this order; an antiferromagnetic layer which generates an exchange coupling bias with the free magnetic layer and which aligns the magnetization direction thereof in a predetermined direction provided on the free magnetic layer; and a ferromagnetic layer which generates an exchange coupling bias with the antiferromagnetic layer and which aligns the magnetization direction thereof in a predetermined direction provided on the antiferromagnetic layer. The magnetization direction on the exchange coupling bias in the free magnetic layer is the same direction as that on the exchange coupling bias in the ferromagnetic layer, and the ferromagnetic layer is able to impart a reflux magnetic field having a component along a sensitivity axis to the free magnetic layer.

A method of providing a metal coating on a substrate (10), and electrically insulating sections/parts of the metal coated substrate from each other. A substrate is provided with an insulating material in the substrate, the insulating first material extending through the thickness of the substrate and protruding above one surface of the substrate. It forms an enclosed section/portion (14) of the substrate. A protective structure (15) is provided on the insulating material such that it covers the entire circumference thereof. The insulating material is selectively etched to create an under-etch (18) under the protective structure. Finally conductive material (19) is deposited to provide a metal coating over the substrate, whereby the under-etch will provide a disruption in the deposited metal coating, thereby electrically insulating the enclosed section from the surrounding substrate.

A vertical probe card having different probes is provided, and includes a first guiding board unit, a second guiding board unit, and a plurality of fence-like probes passing through the first and the second guiding board units. Each of the fence-like probes has a probe length within a range from 5 mm to 8 mm, and includes a fence-like segment, a connection segment, and a testing segment. The fence-like segment includes a penetrating slot having a length greater than 65% of the probe length. The fence-like segment includes two arms respectively arranged at two opposite sides of the penetrating slot and spaced apart from each other by an adjustment distance within a range from 10 m to 120 m. The fence-like probes include a first probe and a second probe, which have a same contact force and are configured to respectively meet different electrical transmission requirements.

A contact probe includes a shell having a first end and an opposed second end. The shell defines an interior chamber therein and a longitudinal axis extending through the first end and the second end. The contact probe further includes a plunger partially received within the interior chamber and extending longitudinally outward of the first end. The plunger includes a tip for electrically connecting the contact probe to an external chip. The contact probe further includes a stepped collar coupled to the shell. The stepped collar includes a first step and a second step. The second step extends about the shell and the first step extends around the plunger longitudinally between the second step and the tip.