A strip-shaped sandwich composite material for producing probe needles, wherein an inner core layer is arranged between two outer cover layers, wherein the inner core layer consists of a palladium alloy comprising at least 30 wt. % palladium or of a platinum alloy comprising at least 30 wt. % platinum, and wherein the two outer cover layers consist of a precipitation-hardened and/or dispersion-hardened copper alloy comprising at least 90 wt. % copper and/or silver alloy comprising at least 70 wt. % silver. The invention also relates to a probe needle, a bonding strip, a probe needle array and a method for producing a composite material.

Probe arrays include spacers attached to the probes that were formed along with the probes. Methods of making probe arrays by (1) forming probes on their sides and possibly as linear arrays or combination subarrays (e.g. as a number of side-to-side joined linear arrays) having probes fixed in array positions by a sacrificial material that is temporarily retained after formation of the probes; (2) assembling the probe units into full array configurations using the spacers attached to the probes or using alternative alignment structures to set the spacing and/or alignment of the probe(s) of one unit with another unit; and (3) fixing the probes in their configurations (e.g. bonding to a substrate and/or engaging the probes with one or more guide plates) wherein the spacers are retained or are removed, in whole or in part, prior to putting the array to use.

Probe arrays include spacers attached to the probes that were formed along with the probes. Methods of making probe arrays by (1) forming probes on their sides and possibly as linear arrays or combination subarrays (e.g. as a number of side-to-side joined linear arrays) having probes fixed in array positions by a sacrificial material that is temporarily retained after formation of the probes; (2) assembling the probe units into full array configurations using the spacers attached to the probes or using alternative alignment structures to set the spacing and/or alignment of the probe(s) of one unit with another unit; and (3) fixing the probes in their configurations (e.g. bonding to a substrate and/or engaging the probes with one or more guide plates) wherein the spacers are retained or are removed, in whole or in part, prior to putting the array to use.

Embodiments are directed to probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat tensional spring segment.

Embodiments are directed to probe structures, arrays, methods of using probes and arrays, and/or methods for making probes and/or arrays wherein the probes include at least one flat tensional spring segment.

A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.

A contact assembly for a testing system for testing integrated circuit devices is disclosed. The contact assembly includes a first blade, a second blade, and an elastomer configured to retain the first blade and the second blade. The first blade and the second blade are electrically conductive. The first blade and the second blade are arranged in a cross configuration so that the first blade and the second blade form a substantially X-shape when assembled. The elastomer is at least columnar in part and non-conductive.

A probe pin includes a body portion; and a top portion and a tip portion connected to respective ends of the body portion. The body portion includes a first side surface and a third side surface facing each other and a second surface and a fourth side surface intersecting the first side surface and the third side surface, respectively, and facing each other, and has a bending portion at least in part. Each of the top portion and the tip portion has a circular cross-section, and the top portion, the body portion and the tip portion are formed as one body.

A probe pin includes a body portion; and a top portion and a tip portion connected to respective ends of the body portion. The body portion includes a first side surface and a third side surface facing each other and a second surface and a fourth side surface intersecting the first side surface and the third side surface, respectively, and facing each other, and has a bending portion at least in part. Each of the top portion and the tip portion has a circular cross-section, and the top portion, the body portion and the tip portion are formed as one body.

A method for attaching two electronics boards, e.g., a testing PCB and a space transformer, comprises rack welding resin prepreg and a mylar film to a testing PCB; laser drilling via holes in the resin prepreg and mylar film such that the holes are aligned on one side of the resin prepreg with connection/capture pads on the testing PCB and aligned (after attachment) on the other side of the resin prepreg with connection capture pads on a space transformer, filling the via holes with sintering paste; applying a pressure treatment to remove air, bubbles, and voids from the sintering paste; removing the mylar film; and using a lamination press cycle to attach a space transformer to the resin prepreg.