Mass flow sensors, mass flow meters, and methods of making the same are disclosed. A flow sensor may include one sensor tube, a pair of sensor wires wound around the sensor tube, and a covering layer disposed in the surroundings of the sensor tube and the sensor wires. The covering layer includes a first covering layer disposed in contact with the surface of the sensor tube, a second covering layer disposed in contact with the surface of the sensor wires, a third covering layer disposed in a space surrounded by the first covering layer and the second covering layer, and a fourth covering layer disposed so as to cover the whole of the sensor wires wound around the sensor tube. In variations, the covering layer includes one or two organic materials chosen from polyamide-imide and polyimide, and the film thickness of the first covering layer is 10 micrometers or more.

Provided is a conduction inspection device member, wherein cracks and voids are less likely to form in conductive parts, conduction performance is less likely to be impaired even when a conduction test is repeated, and contact marks are less likely to remain in the portion of the member in contact with a member to be tested. Also provided is a conduction inspection device comprising the conduction inspection device member. The conduction inspection device member comprises a substrate 13, through holes 11, and conductive parts 12. The multiple through holes 11 are arranged in the substrate 13, the conductive parts 12 are housed inside the through holes 11, and the conductive parts 12 contain conductive particles 2. The conductive particles 2 each comprise a substrate particle 21 and a conductive layer 22 on the surface of the substrate particle 21. The conductive layer 22 has multiple protrusions 23 on the outer surface thereof.

An interconnect structure is provided which includes: a member having a first end coupled to a test card, and a second end opposite the first end; and a contact tip at the second end of the member, the contact tip to removably attach to another interconnect structure of a device under test, where a modulus of elasticity of the member varies along a length of the member.

A cleaning film designed to remove foreign matter and particulates from working surfaces of cleaning wafers used in semiconductor processes. These processes include wafer sort test for cleaning of probe card pins and FEOL tooling for cleaning during wafer handling equipment and wafer chucks. The debris collected on the cleaning wafer working surfaces is removed by the particle removal film allowing the debris and foreign matter to be discarded. The use of the cleaning film allows the operator to refresh the cleaning wafer without use of an outside vendor and eliminates wet washing and the use of solvents in the cleaning process.

A system comprises: a contactor having a first surface, a second surface, a first hole, a second hole parallel to the first hole, and a third hole parallel to the first hole; a first signal pin held in the first hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor; a first short ground pin held in the second hole of the contactor, extending to at least the second surface of the contactor, and extending within the first surface of the contactor; and a ground pin held in the third hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor.

A system comprises: a contactor having a first surface, a second surface, a first hole, a second hole parallel to the first hole, and a third hole parallel to the first hole; a first signal pin held in the first hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor; a first short ground pin held in the second hole of the contactor, extending to at least the second surface of the contactor, and extending within the first surface of the contactor; and a ground pin held in the third hole of the contactor, extending to at least the second surface of the contactor, and extending to at least the first surface of the contactor.

An embodiment of a magnetic-field sensor includes a magnetic-field sensor arrangement and a magnetic body which has, for example, a non-convex cross-sectional area with regard to a cross-sectional plane running through the magnetic body, the magnetic body having an inhomogeneous magnetization.

An embodiment of a magnetic-field sensor includes a magnetic-field sensor arrangement and a magnetic body which has, for example, a non-convex cross-sectional area with regard to a cross-sectional plane running through the magnetic body, the magnetic body having an inhomogeneous magnetization.

A bias magnetic field sensor is disclosed. In an embodiment, a bias magnetic field sensor includes a magnetic field sensor package having a magnetic body attached to only a single side of the sensor package, wherein the magnetic body is configured to provide a magnetic field, and wherein the sensor package is configured to measure a modulation of the magnetic field by a generator object.

A bias magnetic field sensor is disclosed. In an embodiment, a bias magnetic field sensor includes a magnetic field sensor package having a magnetic body attached to only a single side of the sensor package, wherein the magnetic body is configured to provide a magnetic field, and wherein the sensor package is configured to measure a modulation of the magnetic field by a generator object.