A method of determining a quantum phase of quantum device including performing a plurality of measurements for cosine and sine components of the quantum phase; counting a number of measurements in a vertical axis for the sine component and counting a number of measurements in a horizontal axis for the cosine component; and determining the quantum phase based on a majority of a number of 0 measurements and a number of 1 measurements of the sine component and the cosine component.

A method of determining a quantum phase of quantum device including performing a plurality of measurements for cosine and sine components of the quantum phase; counting a number of measurements in a vertical axis for the sine component and counting a number of measurements in a horizontal axis for the cosine component; and determining the quantum phase based on a majority of a number of 0 measurements and a number of 1 measurements of the sine component and the cosine component.

A security method for monitoring an optical module and a three-dimensional sensor using the same apply electromagnetic induction to the three-dimensional sensor to monitor the optical module and a light source module. Two inductive coils corresponding to each other are arranged on the light source module and the optical module. An alternative current is inputted to one of the inductive coils and another of the inductive coils generates an inductive current. The value of the inductive current is continuously detected. When the value of the inductive current varies, the abnormality of the optical module is determined to shut down the light source module, thereby completing the security mechanism of the three-dimensional sensor.

An electronic component handler that transports an electronic component to a test unit testing electric characteristics of the electronic component and having a socket member provided with a recess in which the electronic component is placed, includes a reference base having a reference surface in which the socket member is disposed, a measuring unit that measures positions in a normal direction of the reference surface with respect to a plurality of points of the socket member, a display unit, and a control unit that displays position information based on the positions of the plurality of points on the display unit.

An electronic component handler that transports an electronic component to a test unit testing electric characteristics of the electronic component and having a socket member provided with a recess in which the electronic component is placed, includes a reference base having a reference surface in which the socket member is disposed, a measuring unit that measures positions in a normal direction of the reference surface with respect to a plurality of points of the socket member, a display unit, and a control unit that displays position information based on the positions of the plurality of points on the display unit.

Systems can include a test and measurement tool configured to generate measurement data, and imaging tool configured to generate image data, and a processor in communication with the imaging tool and the test and measurement tool. The processor can be configured to receive image data from the imaging tool and, if the image data satisfies one or more predetermined conditions, trigger the test and measurement tool to perform one or more corresponding operations. Similarly, the processor can receive measurement data from the test and measurement tool and, if the measurement data satisfies one or more predetermined conditions trigger the imaging tool to perform one or more corresponding operations.

A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.

A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.

The present invention discloses a magnetic probe device. The magnetic probe device includes a magnetic probe body and a signal processing circuit, and an output end of the magnetic probe body is connected with an input end of the signal processing circuit; the signal processing circuit includes a first capacitor, a second capacitor, a Faraday shield and a step-up transformer, and the Faraday shield is fixedly arranged between a primary winding and a secondary winding of the step-up transformer; a center tap is arranged at the primary winding of the step-up transformer, and the center tap is grounded; and a first end of the primary winding is in series connection with the first capacitor, and a second end of the primary winding is in series connection with the second capacitor. The magnetic probe device provided by the present invention can improve the signal-to-noise ratio of a magnetic probe and the measurement accuracy of the magnetic field in plasma.

The present invention discloses a magnetic probe device. The magnetic probe device includes a magnetic probe body and a signal processing circuit, and an output end of the magnetic probe body is connected with an input end of the signal processing circuit; the signal processing circuit includes a first capacitor, a second capacitor, a Faraday shield and a step-up transformer, and the Faraday shield is fixedly arranged between a primary winding and a secondary winding of the step-up transformer; a center tap is arranged at the primary winding of the step-up transformer, and the center tap is grounded; and a first end of the primary winding is in series connection with the first capacitor, and a second end of the primary winding is in series connection with the second capacitor. The magnetic probe device provided by the present invention can improve the signal-to-noise ratio of a magnetic probe and the measurement accuracy of the magnetic field in plasma.