A system for testing is provided. The system includes an electronic circuit and an automatic testing equipment (ATE). The electronic circuit includes a voltage monitor including a resistive divider receiving at its voltage input an input voltage and coupled at its output to an input of a comparator. A reference input of the comparator is coupled to a generator supplying a reference voltage setting one or more thresholds of the comparator. The electronic circuit includes a Built In Self Test Module coupled to the ATE and to the inputs and output of the comparator. The BIST module is being configured upon receiving respective commands from the ATE to test a reaction time of the comparator and an offset of the comparator. The ATE performs a respective test of the ratio of the resistor divider by a first voltage measurement and a test of the reference voltage provided by the generator.

A multiple operating-mode comparator system can be useful for high bandwidth and low power automated testing. The system can include a gain stage configured to drive a high impedance input of a comparator output stage, wherein the gain stage includes a differential switching stage coupled to an adjustable impedance circuit, and an impedance magnitude characteristic of the adjustable impedance circuit corresponds to a bandwidth characteristic of the gain stage. The comparator output stage can include a buffer circuit coupled to a low impedance comparator output node. The buffer circuit can provide a reference voltage for a switched output signal at the output node in a higher speed mode, and the buffer circuit can provide the switched output signal at the output node in a lower power mode.

A sensor apparatus comprises an electrically conductive chip carrier comprising a busbar, a first connection and a second connection, and a differential magnetic field sensor chip which is arranged on the chip carrier and has two sensor elements. The form of the busbar is such that a measurement current path running from the first connection to the second connection through the busbar comprises a main current path and a bypass current path, wherein the main current path and the bypass current path run parallel to one another, and a bypass current flowing through the bypass current path is less than a main current flowing through the main current path. The magnetic field sensor chip is configured to capture a magnetic field induced by the bypass current.

The disclosure relates to a life prediction system for a fan of a lamp. The system comprises a fan signal detecting module to detect at least one working parameter of the fan; and a micro control unit to receive the working current signal, the environment temperature signal and the working rotation speed signal of the fan. The detecting module comprises a current detecting unit to detect a working current of the fan and output a working current signal; a temperature detecting unit to detect a working environment temperature of the fan and output an environment temperature signal; and a rotation speed detecting unit to detect and output a working rotation speed signal of the fan. The micro control unit calculates a predicted residual life of the fan based on the received working current signal, the environment temperature signal, the working rotation speed signal, through the life model of the fan.

A current transformer (CT) for the purpose of, for example, current measurement, that uses a power line as a first coil and a second coil for measurement purposes, is further equipped with a third coil. Circuitry connected to the third coil is adapted to measure a signal therefrom. The measured signal from the third coil is compared to a signal measured from the second coil and based on the results, internal CT parameters are determined allowing calibration of actual results to expected results thereby providing an improved accuracy. This is especially desirable when using the CT for measurement of the like of current or phase of the primary coil when measurements are adjusted using the newly determined calibration parameters.

A system and method for monitoring a device includes a temperature sensor, a processing unit, and an output unit. The temperature sensor acquires a temperature measurement during a heat-up phase of a component and provides a temperature measurement to the processing unit, which selects a simulated transient temperature distribution of the simulated component of the simulated device from a plurality of simulated transient temperature distributions of the simulated component of the simulated device. The selection comprises a comparison of the at least one temperature measurement with the plurality of simulated transient temperature distributions at an equivalent time point in the simulated heat-up to a time point at which the temperature measurement was acquired. When a hot spot is developing an output unit outputs an indication of a fault associated with the component.

A device for bioimpedance determining is provided. The device includes contact electrodes for contacting with one part of the user's body and for contacting with another part of the user's body, an alternating current source, a current measurement circuit, a voltage measurement circuit in the region of one of the contact electrodes for contacting with one part of the user's body, and in the region of one of the contact electrodes for contacting with another part of the user's body, a switch connected to the alternating current (AC) source and to the current measurement circuit and configured to form a first and a second current measurement paths so that the current flows through the user's body from one part of the body to another part of the body, and a control unit configured to determine the user's bioimpedance based on the measured current and voltage values.

A magnetic core for a current sensor is provided. The magnetic core comprises a first and a second core part, each of which is formed from a stack made up of a plurality of sheet metal layers. The second core part has a first end piece structured such that some of the sheet metal layers are longer and protrude beyond the remaining, shorter sheet metal layers. The first core part has a second end piece which is structured inversely to the first end piece of the second core part. The first core part and the second core part are joined together at a connection point such that the longer sheet metal layers of the first end piece and the second end piece overlap at the connection point, wherein the overlap takes place at a number of interfaces that is at least two less than the number of sheet metal layers.

A measurement circuit comprises an input terminal to receive a current signal, a first circuit branch coupled to the first terminal and including one or more circuit elements to receive a portion of the current signal, a second circuit branch coupled to the first terminal and including one or more additional circuit elements to receive another portion of the current signal, a nonlinear circuit element coupling the first circuit branch to the second circuit branch, and a quantization circuit configured to produce an input current measurement of current in the first and second circuit branches, and to include current in the second circuit branch in the input current measurement according to a magnitude of the input current signal.

A sensor circuit may comprise or otherwise be connected to a transformer. The transformer may comprise a primary winding and a secondary winding. The primary winding may be configurable and/or connectable to sense a current flow in the primary winding. A configurable circuit with an output may be connected to the input of a comparator circuit. The output of the comparator circuit and one or both of the input of the configurable circuit or the output of the configurable circuit may connect across the secondary winding.