A frequency measurement device includes a sampling unit that outputs a voltage sampling value in accordance with a voltage to be sampled and a sampling frequency; an single-cycle DFT angle shift computation unit that computes and outputs a first angle shift in accordance with the voltage sampling value; an multi-cycle DFT angle shift computation unit that computes and outputs a second angle shift in accordance with the voltage sampling value; a selection unit that selects and outputs one of the first and second angle shifts as a selected angle offset; a sampling frequency computation and outputting unit that computes a sampling frequency in accordance with the selected angle offset and outputs the same to the sampling module unit as a new sampling frequency; and a frequency measurement value computation and outputting unit that computes and outputs a frequency measurement value in accordance with the selected angle offset.

Provided is a physical quantity measurement device capable of reducing a frequency analysis error of a gas flow rate as compared with the related art. A physical quantity measurement device 20 includes a flow rate sensor 205 and a signal processing unit 260. The signal processing unit 260 has a buffer 261, an offset adjustment unit 262, a gain calculation unit 263, a correction calculation unit 264, and a frequency analysis unit 265. The buffer 261 stores a flow rate data based on an output signal of the flow rate sensor 205 for a predetermined period. The offset adjustment unit 262 adjusts the zero point of the flow rate waveform. The gain calculation unit 263 calculates a correction gain of the flow rate waveform whose zero point has been adjusted. The correction calculation unit 264 performs the correction by multiplying the flow rate waveform whose zero point has been adjusted by the correction gain. The frequency analysis unit 265 performs a frequency analysis calculation of the corrected flow rate waveform and stores the data obtained by the calculation in the buffer 261. The gain calculation unit 263 calculates the correction gain at which the overflow does not occur in the frequency analysis unit 265.

A semiconductor device includes a clock generator which receives an input clock and generates an output clock, a reference voltage generator which receives the input clock or the output clock, generates a sub-reference voltage in accordance with a frequency of the input clock or a frequency of the output clock, and generates a reference voltage using the sub-reference voltage and a preset error voltage, and a clock detector which receives the output clock, generates a first output voltage in accordance with the output clock, and compares the generated first output voltage with the reference voltage to output an error signal based on the output clock, wherein the preset error voltage is set in accordance with a degree of preset error of the output clock.

A MEMS device may output a signal during operation that may include an in-phase component and a quadrature component. An external signal having a phase that corresponds to the quadrature component may be applied to the MEMS device, such that the MEMS device outputs a signal having a modified in-phase component and a modified quadrature component. A phase error for the MEMS device may be determined based on the modified in-phase component and the modified quadrature component.

A setting of a measurement instrument comprises the providing a reference measurement instrument that uses at least one instrument parameter. A training phase is performed for a particular signal type to be processed by said reference measurement instrument in order to retrieve an optimal setting for said at least one instrument parameter. A lookup table is created for said particular signal type, said lookup table comprising at least said optimal setting for said at least one instrument parameter.

A frequency measurement apparatus includes: a measurement period setting circuit that sets a measurement period based on a reference clock signal; a first counter circuit that counts the number of pulses of the reference clock signal in a period based on an input signal during the measurement period; a second counter circuit that counts the number of pulses of the input signal during the measurement period; a first frequency calculation circuit that calculates a first frequency; a second frequency calculation circuit that calculates a second frequency; and a frequency selection circuit that selects the first frequency or the second frequency as a frequency of the input signal.

A method, system, and computer program product for detecting and monitoring a signal is provided. The method includes detecting an alignment point for a periodic signal segment of a periodic signal generated by an apparatus being monitored for standard functionality In response, the apparatus is activated from a period prior to the alignment point to an end point of the periodic signal segment and a first point of the periodic signal segment is located. Likewise, a second point of an additional periodic signal segment of the periodic signal is located. The periodic signal is normalized based on results of locating the first point and the second point.

Systems and methods may be used to measure a frequency of a power delivery system and/or of a supply signal transmitted to a load. A system may record an input waveform, determine a frequency of the input waveform at a present time based at least in part on the input waveform and a derivative of the input waveform, and control an operation of a power delivery system based at least in part on the determined frequency.

A system (800) for determining frequency spacings to prevent intermodulation distortion signal interference is provided. The system (800) includes a sensor assembly (810) and a meter verification module (820) communicatively coupled to the sensor assembly (810). The meter verification module (820) is configured to determine a frequency of a first signal to be applied to a sensor assembly (810) of a vibratory meter and set a demodulation window about the frequency of the first signal. The meter verification module (800) is also configured to determine a frequency of the second signal to be applied to the sensor assembly such that a frequency of an intermodulation distortion signal generated by the first signal and the second signal is outside the demodulation window.

A system (800) for determining frequency spacings to prevent intermodulation distortion signal interference is provided. The system (800) includes a sensor assembly (810) and a meter verification module (820) communicatively coupled to the sensor assembly (810). The meter verification module (820) is configured to determine a frequency of a first signal to be applied to a sensor assembly (810) of a vibratory meter and set a demodulation window about the frequency of the first signal. The meter verification module (800) is also configured to determine a frequency of the second signal to be applied to the sensor assembly such that a frequency of an intermodulation distortion signal generated by the first signal and the second signal is outside the demodulation window.