Self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers. The wafer carrier system may include a housing configured for transport within the automated material handling system. A support is configured to support a semiconductor wafer within a housing. A metrology system is disposed within the housing. The metrology system is operable to measure at least one characteristic of the wafer. The metrology system may include a sensing unit and a computing unit operably connected to the sensing unit.

Self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers. The wafer carrier system may include a housing configured for transport within the automated material handling system. A support is configured to support a semiconductor wafer within a housing. A metrology system is disposed within the housing. The metrology system is operable to measure at least one characteristic of the wafer. The metrology system may include a sensing unit and a computing unit operably connected to the sensing unit.

The present disclosure provides a touch structure, a test method thereof, a touch panel and a display apparatus. In the touch structure, by taking touch driving electrodes as an example, a plurality of third leads which are insulated from each other and are in one-to-one correspondence with various touch driving electrodes are additionally provided, wherein each of the third leads has one terminal electrically connected to a corresponding touch driving electrode and the other terminal serving as a test point for testing whether there is an open circuit on the corresponding touch driving electrode and the corresponding first lead. In this way, two probes may be placed at a test point in a third lead and a first wiring terminal in a binding area respectively when an open circuit test is conducted on each of the touch driving electrodes and a corresponding first lead.

The present disclosure provides a touch structure, a test method thereof, a touch panel and a display apparatus. In the touch structure, by taking touch driving electrodes as an example, a plurality of third leads which are insulated from each other and are in one-to-one correspondence with various touch driving electrodes are additionally provided, wherein each of the third leads has one terminal electrically connected to a corresponding touch driving electrode and the other terminal serving as a test point for testing whether there is an open circuit on the corresponding touch driving electrode and the corresponding first lead. In this way, two probes may be placed at a test point in a third lead and a first wiring terminal in a binding area respectively when an open circuit test is conducted on each of the touch driving electrodes and a corresponding first lead.

A fuel source (100), a fluid gauge adapter (300), a fuel cell system (200) and an associated method. The fuel source (100) has a gauge (104) comprising an electronic multi-stable display (106). The fuel cell system (200) and method relate to receiving fuel from the fuel source (100), determining (212) a fuel consumption of the fuel cell system (200), calculating (214) a substance level of the fuel source in accordance with the fuel consumption and updating (216) an electronic multi-stable display of the fluid gauge of the fuel source in accordance with the substance level.

A control system and data acquisition system for an electrical capacitance tomography sensor comprised of a sensor having a plurality of electrodes, where each electrode is further comprised of a plurality of capacitance segments. Each of the capacitance segments of each electrode can be individually addressed to focus the electric field intensity or sensitivity to desired regions of the electrodes and the sensor.

An excitation signal is produced on a plate of an unknown capacitor and on a plate of a known capacitor. The excitation signal is amplified over time to produce a first output signal, with gain that is proportional to capacitance of the unknown capacitor. The excitation signal is also amplified over time to produce a second output signal, with gain that is proportional to capacitance of the known capacitor. Capacitance of the unknown capacitor is computed using a mathematical function of the first and second output signals and the capacitance of the known capacitor, while being insensitive to amplitude of the excitation signal. Other embodiments are also described and claimed.

An excitation signal is produced on a plate of an unknown capacitor and on a plate of a known capacitor. The excitation signal is amplified over time to produce a first output signal, with gain that is proportional to capacitance of the unknown capacitor. The excitation signal is also amplified over time to produce a second output signal, with gain that is proportional to capacitance of the known capacitor. Capacitance of the unknown capacitor is computed using a mathematical function of the first and second output signals and the capacitance of the known capacitor, while being insensitive to amplitude of the excitation signal. Other embodiments are also described and claimed.

A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.

A self-contained metrology wafer carrier systems and methods of measuring one or more characteristics of semiconductor wafers are provided. A wafer carrier system includes, for instance, a housing configured for transport within the automated material handling system, the housing having a support configured to support a semiconductor wafer in the housing, and a metrology system disposed within the housing, the metrology system operable to measure at least one characteristic of the wafer, the metrology system comprising a sensing unit and a computing unit operably connected to the sensing unit. Also provided are methods of measuring one or more characteristics of a semiconductor wafer within the wafer carrier systems of the present disclosure.