Even when parts having individual differences among identical parts or differences in deterioration speed between parts, or a part that does not have a non-volatile memory such as an EEPROM in a chip of the part itself, are mixed, there is no deterioration diagnosis device that can appropriately diagnose a state of deterioration due to temporal change or the like, because of which a mechanism (correction methodology) for evaluating and correcting deterioration in the precision or performance of an electronic part that has low precision or considerable temporal deterioration, and does not have a correction function, is incorporated in a deterioration diagnosis device, and a deterioration state is diagnosed using incorporated deterioration determination means when using a product after shipping.

An apparatus or method for calibrating a battery emulator is proposed. The battery emulator emulates a plurality of cells connected in series, wherein each emulated cell has taps over which at least one emulated quantity is tapped, wherein the apparatus comprises a switching apparatus via which a calibration standard is switchably connectable with different taps.

A capacitance sensing system can filter noise that presents in a subset of electrodes in the proximity of a sense object (i.e., finger). A capacitance sensing system can include a sense network comprising a plurality of electrodes for generating sense values; a noise listening circuit configured to detect noise on a plurality of the electrodes; and a filtering circuit that enables a filtering for localized noise events when detected noise values are above one level, and disables the filtering for localized noise events when detected noise values are below the one level.

A first coil is wound around a first core, and have one end that is connected to ground and the other end that is connected to one end of a second coil. The second coil is wound around a second core, and has the one end that is connected to the first coil, and the other end that is connected to an excitation unit via a current-limiting resistor. A magnetic flux is generated in the first core by an excitation signal outputted from the excitation unit. Induced electromotive force is generated in the conductor due to the magnetic flux generated in the first core. The direction of the magnetic flux generated in the second core is opposite to the direction of the magnetic flux generated in the first core, and the induced electromotive forces of them generated in the conductor are cancelled each other out.

An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

An optical testing circuit on a wafer includes an optical input configured to receive an optical test signal and photodetectors configured to generate corresponding electrical signals in response to optical processing of the optical test signal through the optical testing circuit. The electrical signals are simultaneously sensed by a probe circuit and then processed. In one process, test data from the electrical signals is simultaneously generated at each step of a sweep in wavelength of the optical test signal and output in response to a step change. In another process, the electrical signals are sequentially selected and the sweep in wavelength of the optical test signal is performed for each selected electrical signal to generate the test data.

A detection calibration circuit includes a first distributor distributing a high frequency input signal, an amplifier amplifying the first high frequency output signal of the first distributor, a second distributor distributing the amplified first high frequency output signal of the first distributor, a reference signal generator outputting a reference signal in accordance with a switchable reference voltage, a switcher selecting a third high frequency output signal of the second distributor or a reference signal of the reference signal generator and outputting the selected signal, a detector detecting the third high frequency output signal of the second distributor or the reference signal of the reference signal generator from the switcher, a sensitivity switcher adjusting a sensitivity for an output signal of the detector, and a calibration control circuit adjusting a detection gain of an input signal of the detector and an input-output sensitivity for an output signal of the detector.

A magnetic field sensor includes at least one magnetic field sensing element configured to generate a measured magnetic field signal responsive to an external magnetic field and to generate a reference magnetic field signal responsive to a reference magnetic field and a calibration circuit configured to divide the measured magnetic field signal by the reference magnetic field signal to generate a calibrated magnetic field signal. The calibrated signal has reduced susceptibility to stress influences.

A calibration board and a timing calibration method thereof are provided. The calibration board for calibrating signal delays of test channels in an automatic test equipment is pluggably disposed in the automatic test equipment and includes calibration groups, a first common node, and a switching module. Each calibration group includes a second common node and conductive pads electrically connecting to the second common node. Each conductive pad selectively and electrically connects to one test channel. The switching module electrically connects to the first common node and each second common node. When a first delay calibration procedure is performed, the connection between the first common node and each second common node is disabled. When a second delay calibration procedure is performed, the connection between the first common node and each second common node is built.

An automatic test system and method are provided. The automatic test system includes at least one formation apparatus and a test fixture. The formation apparatus receives a first control command from a network and executes a test procedure according to the first control command. The test procedure includes a charging mode and a discharging mode. The test fixture is selectively coupled to the formation apparatus. During the test procedure, when the test fixture is coupled to the formation apparatus, the test fixture generates a first measurement result. The test fixture transmits the first measurement result to the formation apparatus via a wireless communication interface of the test fixture.