A semiconductor circuitry includes an oscillator configured to output an oscillation signal whose frequency depends on a first input signal, a counter configured to count a number of cycles of the oscillation signal, first circuitry configured to output a first digital signal based on a first number of cycles counted by the counter within one of a clock cycle of a clock signal, wherein the first input signal is digitally converted into the first digital signal, and a second circuitry configured to output a second digital signal based on a second number of cycles counted by the counter in a period from a reference timing of the clock signal to an input timing of a second input signal within the one of the clock cycle of the clock signal, wherein the period is digitally converted into the second digital signal.

A measuring apparatus includes: a light source device that projects light or light of which intensity is periodically modulated onto a measurement object; a light receiver that receives backscattered light of light projected by the light source device from the measurement object; and a processor comprising hardware, the processor being configured to: measure TOF information of the light projected by the light source device and the backscattered light received by the light receiver; acquire distances from a surface of the measurement object to the light source device and the light receiver; and calculate an internal propagation distance in the measurement object according to the measured TOF information and the acquired distances.

A measuring apparatus includes: a light source device that projects light or light of which intensity is periodically modulated onto a measurement object; a light receiver that receives backscattered light of light projected by the light source device from the measurement object; and a processor comprising hardware, the processor being configured to: measure TOF information of the light projected by the light source device and the backscattered light received by the light receiver; acquire distances from a surface of the measurement object to the light source device and the light receiver; and calculate an internal propagation distance in the measurement object according to the measured TOF information and the acquired distances.

A lidar photosensor amplification circuit may include light sensors; amplifiers corresponding respectively to the light sensors, in a powered-on state, to amplify output signals of the respective light sensors as amplified outputs; and switches corresponding respectively to the amplifiers, where individual switches may be controlled to pass a respective amplified output in a closed state or disconnect the amplified output in an open state. The lidar photosensor amplification circuit may be controlled by a controller according to timing rules that conserve power supplied to photosensor amplification circuit, reduce heat produced by the light sensor board, and do not aggravate cross-talk between sensors. The timing rules include staging an amplifier for a staging time before the corresponding light sensor is to be read, closing a switch after the staging time has passed, and powering down the amplifier and opening the switch after a reading time passes.

A method for designing an optical scanning mirror is provided. The method may include receiving, by a communication interface, a set of design parameters of the scanning mirror. The method may also include simulating scanning mirror oscillation, by at least one processor, based on the set of design parameters using a computer model. In certain aspects, the computer model may include a lookup table that correlates electrostatic force applied to a sample scanning mirror and angular displacement in the sample scanning mirror caused by the electrostatic force. The method may further include generating, by the at least one processor, mirror oscillation data as an output of the computer model for designing the scanning mirror. The mirror oscillation data may include a correlation of drive frequency, angular displacement, and time.

Devices, systems, and methods for management of electrical resources for electric vehicles. A method may include receiving, by a vehicle, sensor data indicative of a first luminosity of a location, and determining that the first luminosity of the location exceeds a luminosity threshold. The method may include determining, based on the first luminosity exceeding the luminosity threshold, a second luminosity to apply to lights of the vehicle while the vehicle is at the location, the second luminosity greater than zero. The method may include applying the second luminosity to the lights while the vehicle is at the location.

Devices, systems, and methods for management of electrical resources for electric vehicles. A method may include receiving, by a vehicle, sensor data indicative of a first luminosity of a location, and determining that the first luminosity of the location exceeds a luminosity threshold. The method may include determining, based on the first luminosity exceeding the luminosity threshold, a second luminosity to apply to lights of the vehicle while the vehicle is at the location, the second luminosity greater than zero. The method may include applying the second luminosity to the lights while the vehicle is at the location.

[Object] To uniformly produce electric fields when performing thinning processing of generating electric fields in only some of a plurality of pixels. [Solution] There is provided an imaging apparatus including: a pair of electric field application electrodes and a pair of electric charge extraction electrodes provided to each of a plurality of pixels; and a voltage application section configured to apply voltage between a first electrode that is one of the pair of electric field application electrodes of a first pixel and a second electrode that is one of the pair of electric field application electrodes of a second pixel when pixel combination is performed, and produce an electric field across the first pixel and the second pixel.

A parameter adjustment device (500) adjusts a parameter relating to control of laser light emitted from a measurement sensor (210) onto an object. A parameter calculator (520) calculates the parameter by applying, to a trained model generated through machine learning using training data sets each including waveform data of an amount of light received by the measurement sensor (210) and data indicating the parameter used to acquire the waveform data, waveform data newly acquired in a new state. The parameter calculated by the parameter calculator (520) enables measurement of the object using the measurement sensor (210) in the new state. A parameter outputter (530) outputs data indicating the parameter calculated by the parameter calculator (520).

Disclosed herein are retroreflective pigments and paints including the retroreflective pigments.