A method for determining a radionuclide concentration of a material is provided. The method comprises placing a detector in a protective structure, wherein the detector is coupled to a single-channel analyzer. The method further comprises inserting the protective structure in a material, wherein the material comprises a radionuclide. The method additionally comprises measuring the moisture content of the material to be analyzed. The method also comprises counting the emitted radiation having a known energy over an interval of time to produce a count per time, wherein the emitted radiation is emitted from the radionuclide and then dividing the count per time by the weight of the material to produce a count per time per weight.

The present invention relates to a method and apparatus for detecting radioactivity. In particular, but not exclusively, the present invention relates to the detection of radioactivity in a target fluid in a fluid communication passageway using a region of scintillator material (130) to provide light responsive to the presence of radioactive material and at least one silicon photomultiplier (SiPM) (150) for providing an output signal responsive to the light provided by the scintillator material.

A radiation detection system may include a mobile device having a flash memory. The device may monitor various characteristics of the flash memory to determine when damage to the flash memory has occurred from radiation exposure. The device may associate damage to the flash memory with a radiation dose, and determine a level of radiation to which the memory, and thus the device, has been exposed. The device also may determine a length of time and locations where the radiation exposure has occurred. If the device determines that the level of radiation exposure exceeds a threshold associated with a safe level of radiation exposure for a human user, the device may generate an alert to the user.

A radiation detection system may include a radiation source, and a surface plasmon resonance (SPR) radiation detector. The SPR radiation detector may include a structure, a surface plasmon support material on portions of the structure and configured to receive radiation from the radiation source that initiates a surface plasmon at an interface between the structure and the surface plasmon support material, and a probing device coupled to the structure and configured to detect the surface plasmon.

Systems, devices and methods for inspecting and imaging of contents of a volume is disclosed. One implementation of the disclosed systems, devices and methods includes an apparatus for inspecting and imaging of contents of a volume of interest which includes a first particle tracking unit of detectors to receive incoming charged particles that transit through an object and to measure position and direction of the charged particles that transit through the object while allowing the charged particles to pass through, and a second particle tracking unit of detectors installed relative to the first particle tracking unit of detectors and to the volume of interest containing the object of inspection so that it is positioned to receive the outgoing charged particles that transit through the first particle tracking unit and transit through the object of inspection and to measure a position and a direction of the outgoing charged particles. The apparatus also includes a processor that processes information from the first and second particle tracking units of detectors to yield an estimate of a spatial map of atomic number and a density of the object. The methods disclosed here include triggering algorithms for signal selection, positional calibration algorithms for locating particle tracking units in absolute three dimensional coordinate space, and three-dimensional tomographic image reconstruction algorithms combining the tracking information from multiple pairs of particle tracking units.

A charged particle counting device, a manufacturing method thereof, and a charged particle counting system are provided. The charged particle counting device includes: a bipolar transistor (10) and a magneto-electric induction coil (20), a gate (101) of the bipolar transistor is electrically connected to an end of the magneto-electric induction coil, and the other end of the magneto-electric induction coil is applied with a constant voltage, when a stream of positively charged particles passes through the magneto-electric induction coil and a first induced voltage generated by the magneto-electric induction coil is greater than a predetermined voltage threshold, a channel of the bipolar transistor is an N-type channel; and when a stream of negatively charged particles passes through the magneto-electric induction coil and a second induced voltage generated by the magneto-electric induction coil is less than the predetermined voltage threshold, the channel of the bipolar transistor is a P-type channel.

A charged particle counting device, a manufacturing method thereof, and a charged particle counting system are provided. The charged particle counting device includes: a bipolar transistor (10) and a magneto-electric induction coil (20), a gate (101) of the bipolar transistor is electrically connected to an end of the magneto-electric induction coil, and the other end of the magneto-electric induction coil is applied with a constant voltage, when a stream of positively charged particles passes through the magneto-electric induction coil and a first induced voltage generated by the magneto-electric induction coil is greater than a predetermined voltage threshold, a channel of the bipolar transistor is an N-type channel; and when a stream of negatively charged particles passes through the magneto-electric induction coil and a second induced voltage generated by the magneto-electric induction coil is less than the predetermined voltage threshold, the channel of the bipolar transistor is a P-type channel.

An imaging panel generates an image based on scintillation light that is obtained from X-rays transmitted through an object. The imaging panel includes, in a terminal area, a terminal-first insulating film that is made of the same material as that of a first insulating film on a TFT, and is separated on a part of a first conductive layer so as to have an opening; a terminal-semiconductor layer is provided above the terminal-first insulating film, and is made of the same material as that of at least a part of semiconductor layers of a photoelectric conversion layer; and a second conductive layer made of the same material as that of a conductive film connected with a photoelectric conversion element, is provided on the terminal-semiconductor layer so as to be in contact with the first conductive layer in the opening.

A system and method for determining a position of a focal spot of an X-ray source may be provided. The system may include a shelter to attenuate X-rays emitted from the focal spot of the X-ray source and an X-ray receiver to receive X-rays. The X-ray receiver may include a plurality of X-ray receiving regions. At least one of the plurality of X-ray receiving regions may X-rays that include attenuated X-rays by the shelter and unattenuated X-rays. The shelter and the X-ray receiver may reside between the X-ray source and an X-ray detector for determining the position of the focal spot.

A system and method for determining a position of a focal spot of an X-ray source may be provided. The system may include a shelter to attenuate X-rays emitted from the focal spot of the X-ray source and an X-ray receiver to receive X-rays. The X-ray receiver may include a plurality of X-ray receiving regions. At least one of the plurality of X-ray receiving regions may X-rays that include attenuated X-rays by the shelter and unattenuated X-rays. The shelter and the X-ray receiver may reside between the X-ray source and an X-ray detector for determining the position of the focal spot.