Patent classifications
G01T1/00
Determining functional data of an X-ray detector
A method is described for determining the polarization state of a sensor of an X-ray detector. In the method, the X-ray detector is illuminated with a sequence of light pulses wherein the individual pulses of the light pulse sequence have a different intensity. It is further determined at what intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit. Also described is a method for obtaining and/or setting functional data of a sensor of an X-ray detector and/or of a sensor illumination unit. Furthermore, an X-ray detector is described.
Determining functional data of an X-ray detector
A method is described for determining the polarization state of a sensor of an X-ray detector. In the method, the X-ray detector is illuminated with a sequence of light pulses wherein the individual pulses of the light pulse sequence have a different intensity. It is further determined at what intensity of the light pulses, charge pulses generated by the sensor of the X-ray detector exceed a threshold voltage of a signal detection circuit. Also described is a method for obtaining and/or setting functional data of a sensor of an X-ray detector and/or of a sensor illumination unit. Furthermore, an X-ray detector is described.
Systems and methods for assaying a radioactive gas, and related scintillation cells
A radioactive gas assay system comprises a scintillation cell production assembly, a detector assembly, a computer assembly, and a scintillation cell destruction assembly. The scintillation cell production assembly is configured to produce a scintillation cell comprising a glass scintillator shell containing a volume of radioactive gas. The detector assembly is configured to receive the scintillation cell and to detect photons emitted thereby. The computer assembly is configured to receive data from the detector assembly to automatically calculate an absolute activity of the volume of radioactive gas of the scintillation cell and radiation detection efficiencies of the detector assembly. The scintillation cell destruction assembly is configured to receive the scintillation cell and to rupture the substantially non-porous glass scintillator shell to release the volume of radioactive gas. A method of assaying a radioactive gas, and a scintillation cell are also described.
Elemental Analysis of Organic Samples
A method of imaging analyte elements in an organic sample includes providing the sample as a layer on a substrate and reacting the sample on the substrate to produce one or more volatile products that leave the sample while the one or more elements remain in the sample. A majority of the sample layer by weight is removed from the substrate by the reaction and the remaining sample layer is enriched in the one or more elements which are not spatially disturbed by the reaction. The method including subsequently detecting the one or more elements in the concentrated sample layer using an imaging elemental analyzer.
Elemental Analysis of Organic Samples
A method of imaging analyte elements in an organic sample includes providing the sample as a layer on a substrate and reacting the sample on the substrate to produce one or more volatile products that leave the sample while the one or more elements remain in the sample. A majority of the sample layer by weight is removed from the substrate by the reaction and the remaining sample layer is enriched in the one or more elements which are not spatially disturbed by the reaction. The method including subsequently detecting the one or more elements in the concentrated sample layer using an imaging elemental analyzer.
SPALLING TECHNIQUES FOR MANUFACTURING PHOTODIODES
A photodiode fabricated using spalling techniques, and method for making the same. The photodiode including a substrate, an optical device semiconductor material layer disposed over the substrate, a p-type contact disposed over the optical device semiconductor material layer, an n-type contact disposed over the substrate, and an adhesion layer for rear illumination adhered to the bottom of the substrate. Both the substrate and the optical device semiconductor material layer comprise at least one of GaN, AlGaN or AlN.
Scintillator panel for X-ray talbot imaging apparatus, image detecting panel for X-ray talbot imaging apparatus, and X-ray talbot imaging apparatus
A scintillator panel includes alternately arranged scintillator portions and non-scintillator portions, in which the scintillator portions include a stress-relaxing portion. Preferably, a stress-relaxing portion content in 100% by volume of the scintillator portions is from 2 to 50% by volume.
Radiation survey process
A method for determining a radionuclide concentration of a material is provided. The method comprises placing a detector in a protective structure, wherein the detector is coupled to a single-channel analyzer. The method further comprises inserting the protective structure in a material, wherein the material comprises a radionuclide. The method additionally comprises measuring the moisture content of the material to be analyzed. The method also comprises counting the emitted radiation having a known energy over an interval of time to produce a count per time, wherein the emitted radiation is emitted from the radionuclide and then dividing the count per time by the weight of the material to produce a count per time per weight.
Radiation survey process
A method for determining a radionuclide concentration of a material is provided. The method comprises placing a detector in a protective structure, wherein the detector is coupled to a single-channel analyzer. The method further comprises inserting the protective structure in a material, wherein the material comprises a radionuclide. The method additionally comprises measuring the moisture content of the material to be analyzed. The method also comprises counting the emitted radiation having a known energy over an interval of time to produce a count per time, wherein the emitted radiation is emitted from the radionuclide and then dividing the count per time by the weight of the material to produce a count per time per weight.
Dosimetric control system
A dosimeter with at least one radiation sensor and a rechargeable electrical accumulator, includes a single sensor for sinusoidal X-radiation and for (gamma) radiation, a filter for the radiation sensor, a first amplification stage for the sensor, a circuit for processing the signal received by the sensor, and converting the signal into a dose value or a value that can be interpreted as a dose, a memory module in which the information on the dose received in the fixed period is stored, a circuit for recharging the electrical accumulator and a communications module, a dosimeter monitoring device, which includes at least one base for recharging the dosimeter with a recharging circuit, and a system for communication with the dosimeter.