G01V5/00

Combined scanning x-ray generator, composite inspection apparatus, and inspection method for hybrid

Embodiments of the present disclosure disclose a combined scanning X-ray generator, a composite inspection apparatus and an inspection method. The combined scanning X-ray generator includes: a housing; an anode arranged in the housing, the anode including a first end of the anode and a second end of the anode opposite the first end of the anode; a pencil beam radiation source arranged at the first end of the anode and configured to emit a pencil X-ray beam; and a fan beam radiation source arranged at the second end of the anode and configured to emit a fan X-ray beam; wherein the pencil beam radiation source and the fan beam radiation source are operated independently.

PET/MRI insert system

The present disclosure relates to an insert system for performing positron emission tomography (PET) imaging. The insert system can be reversibly installed to an existing system, such that PET functionality can be introduced into the existing system without the need to significantly modify the existing system. The present disclosure also relates to a multi-modality imaging system capable for conducting both PET imaging and magnetic resonance imaging (MRI). The PET and MRI imaging can be performed simultaneously or sequentially, while the performance of neither imaging modality is compromised for the operation of the other imaging modality.

Sample inspection system

There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.

ENCLOSED X-RAY CHOPPER WHEEL
20230106014 · 2023-04-06 ·

A chopper wheel assembly includes a collimator configured to narrow an x-ray beam, a chopper wheel has a planar surface configured to face in a direction of the collimator and a housing configured to receive the chopper wheel. The chopper wheel includes a central axis, a plurality of slits in the planar surface, a first projection extending from the planar surface in a direction of the collimator and a second projection extending from the planar surface in the direction of the collimator. The slits extend in radially-outward direction relative to the central axis. The first projection is located radially outward of the plurality of slits and the second projection is located radially inward of the plurality of slits. Each projection is provided for 360 degrees about the central axis. The housing includes an interior wall including a first groove configured to receive the first projection and a second groove configured to receive the second projection with the chopper wheel received within the housing.

INSPECTION ASSISTANCE APPARATUS, INSPECTION ASSISTANCE METHOD, AND COMPUTER READABLE RECORDING MEDIUM

An inspection assistance apparatus 10 to improve the accuracy of detection of a specific article, comprising a first certainty degree output unit 11 for inputting, to a model, a transmission image obtained by irradiating an article to be inspected with electromagnetic waves, and outputting a first certainty degree indicating that the article is a specific article; and a first determination unit 12 for determining that the article is the specific article in a case where the first certainty degree that has been changed based on an inspection result is equal to or higher than a pre-set first certainty degree threshold, the inspection result being obtained by conducting one or more inspections with respect to the article.

Methods and Systems for Performing On-The-Fly Automatic Calibration Adjustments of X-Ray Inspection Systems
20230147681 · 2023-05-11 ·

The specification discloses methods of adjusting calibration data in an X-ray inspection system. Calibration data is initially generated. X-ray scan images of a cargo container are then acquired. Each of the X-ray scan images are segmented into regions of interest, where the regions of interest volumetrically encompass a known material or a material corresponding to a known HS code. Using the calibration data, first data indicative of Zeff of each of the regions of interest are determined. The first data is compared with second data indicative of known Zeff corresponding to the known materials and/or HS codes. The calibration data is then adjusted to generate a second calibration data if the first and second data differ significantly. The calibration data is replaced by the second calibration data in the memory.

X-ray detectors of high spatial resolution

An apparatus, system and method suitable for detecting X-ray are disclosed. In one example, the apparatus comprises: an X-ray absorption layer and a mask; wherein the mask comprises a first window and a second window, and a portion between the first window and the second window; wherein the first and second windows are not opaque to an incident X-ray; wherein the portion is opaque to the incident X-ray; and wherein the first and second windows are arranged such that charge carriers generated in the X-ray absorption layer by an X-ray photon propagating through the first window and charge carriers generated in the X-ray absorption layer by an X-ray photon propagating through the second window do not spatially overlap.

X-Ray Scanning System with High X-Ray Energy
20230138961 · 2023-05-04 ·

An x-ray scanning system, and corresponding method, includes an x-ray source that produces incident x-ray radiation having end-point x-ray energy, which, in various embodiments, can be greater than about 200 keV, between about 200 keV and about 500 keV, or greater than about 500 keV. The system also includes a disk chopper wheel that can be irradiated by and attenuate the incident x-ray radiation. The disk chopper wheel further defines one or more slits configured to pass the incident x-ray radiation through the disk chopper wheel for scanning a target. In some embodiments, the high end-point x-ray energies with disk chopper wheels are facilitated by forming the incident x-ray radiation as a collimated fan beam and/or orienting the chopper wheel with a wheel plane substantially non-perpendicular to a fan beam plane, increasing effective thickness of a disk chopper wheel to attenuate incident x-rays of higher energies.

Hand-Held Portable Backscatter Inspection System
20230204812 · 2023-06-29 ·

The present specification describes a compact, hand-held probe or device that uses the principle of X-ray backscatter to provide immediate feedback to an operator about the presence of scattering and absorbing materials, items or objects behind concealing barriers irradiated by ionizing radiation, such as X-rays. Feedback is provided in the form of a changing audible tone whereby the pitch or frequency of the tone varies depending on the type of scattering material, item or object. Additionally or alternatively, the operator obtains a visual scan image on a screen by scanning the beam around a suspect area or anomaly.

Muon detector array stations

Methods, systems, and devices are disclosed for inspecting materials in a vehicle or object. In one aspect, a system for muon tomography detection includes a first and second housing structure each including a first array and second array of muon detection sensors, respectively, the first housing structure positioned opposite the second at a fixed height to form a detection region to contain a target object, in which the muon detection sensors measure positions and directions of muons passing through the first array to the detection region and passing from the detection region through the second array; support structures to position the first housing structure at the fixed height; and a processing unit to receive data from the muon detection sensors and analyze scattering behaviors of the muons in materials of the target object to obtain a tomographic profile or spatial distribution of scattering centers within the detection region.