This disclosure includes an imaging system that is configured to image in parallel multiple focal planes in a sample uniquely onto its corresponding detector while simultaneously reducing blur on adjacent image planes. For example, the focal planes can be staggered such that fluorescence detected by a detector for one of the focal planes is not detected, or is detected with significantly reduced intensity, by a detector for another focal plane. This enables the imaging system to increase the volumetric image acquisition rate without requiring a stronger fluorescence signal. Additionally or alternatively, the imaging system may be operated at a slower volumetric image acquisition rate (e.g., that of a conventional microscope) while providing longer exposure times with lower excitation power. This may reduce or delay photo-bleaching (e.g., a photochemical alteration of the dye that causes it to no longer be able to fluoresce), thereby extending the useful life of the sample.

The invention relates to an optical arrangement, particularly for the detection beam path of a multi-spot scanning microscope, comprising a detection plane, in which a detector is positionable, comprising a dispersive device for spectrally splitting detection light. According to the invention, the optical arrangement is characterized in that a distorting optical unit is present for guiding the detection light into the detection plane, said distorting optical unit being arranged downstream of the dispersive device and upstream of a detection plane, and in that a rotating device is present for the relative rotation of a luminous field of the spectrally separated detection light and the distorting optical unit. The invention additionally relates to a multi-spot scanning microscope and a method for operating a microscope.

A system for visualizing a three-dimensional target area of an object with a measuring device which determines a distance of a surgical instrument in a target area with respect to a predetermined structure in the target area, a display unit for representing the views, and a control unit. The control unit controls the display unit such that the display unit is in a first display mode when a determined distance is greater than a predetermined first limit value, and switches from the first display mode into a second display mode when the determined distance changes from being greater than a predetermined second limit value, which is smaller than or equal to the predetermined first limit value, to smaller than the predetermined second limit value.

A microscope includes an illumination unit for illuminating a region of a specimen to generate an illuminated region, an imaging optical unit for magnified imaging of the illuminated region, an image sensor disposed downstream of the imaging optical unit for capturing the magnified image of the illuminated region, a camera for recording an overview region of the specimen without using the imaging optical unit and a control unit for controlling the image sensor and the camera. The overview region includes a part of the illuminated region and a non-illuminated region of the specimen. The control unit actuates the camera to make a recording of the overview region. The control unit actuates the image sensor to cause a recordation of the magnified image of the illuminated region. The control unit generates an overview image based on the recording of the overview region and the recording of the magnified image.

A re-scan microscope for forming an image of a sample is disclosed. The system comprises an illumination optical system for directing, and optionally focusing, illumination light at the sample herewith providing an illumination light spot at the sample. The illumination light spot causes emission light from the sample. The microscope system further comprises a detection optical system for focusing at least part of the emission light onto an imaging plane of an imaging system herewith causing an emission light spot on the imaging plane. The microscope system also comprises a rotatable element for, when rotating, moving the illumination light spot over and/or through the sample and simultaneously moving the emission light spot over said imaging plane of the imaging system. The rotatable element comprises at least two reflective surfaces.

An adapter which controls rotation of a microscope on which a slide is placed and an imaging unit and which easily performs correction of a rotation shift is provided. The adapter includes a first connection member connected to a microscope, a second connection member connected to an imaging unit, a rotation member arranged between the first and second connection members and configured to rotate the second connection member relative to the first connection member using optical axes of the microscope and the imaging unit at a center, a control member configured to be fixed on one of the first and second connection members and control the rotation of the connection member, and a driving member configured to be engaged with the first connection member or the second connection member and change a position of the second connection member relative to the first connection member around the optical axes.

An adapter which controls rotation of a microscope on which a slide is placed and an imaging unit and which easily performs correction of a rotation shift is provided. The adapter includes a first connection member connected to a microscope, a second connection member connected to an imaging unit, a rotation member arranged between the first and second connection members and configured to rotate the second connection member relative to the first connection member using optical axes of the microscope and the imaging unit at a center, a control member configured to be fixed on one of the first and second connection members and control the rotation of the connection member, and a driving member configured to be engaged with the first connection member or the second connection member and change a position of the second connection member relative to the first connection member around the optical axes.

Provided are a fiber bundle image processing method (200) and an apparatus. The method (200) includes: determining pixel information corresponding to a center position of a fiber in a sample image; correcting the determined pixel information; and reconstructing the sample image based on the corrected pixel information to obtain a reconstructed image. The method (200) and apparatus can not only obtain a more ideal fiber-bundle processed image, but also have a smaller calculation amount, and the entire calculation process takes less time.

An arrangement for increasing resolution of a laser scanning microscope has a simplified adjustment and lower susceptibility to errors. The pupil beam from the laser scanning microscope is coupled into a shortened common path interferometer, to make wavefronts of a pupil image mirrored at at least one axis and wavefronts of an unchanged pupil image interfere. The area of a pupil from the pupil beam is split into two complementary portions P and Q producing two partial beams separately supplied to at least one beam deflection means by total-internal reflection along the common path interferometer. The light of the interferometer branches from transmitted light of the one interferometer branch and reflected light of the other interferometer branch is made to interfere at a partly transmissive beam splitter layer to cause constructive interference C and destructive interference D of the wavefronts from the two different portions P and Q of the pupil.

An arrangement for increasing resolution of a laser scanning microscope has a simplified adjustment and lower susceptibility to errors. The pupil beam from the laser scanning microscope is coupled into a shortened common path interferometer, to make wavefronts of a pupil image mirrored at at least one axis and wavefronts of an unchanged pupil image interfere. The area of a pupil from the pupil beam is split into two complementary portions P and Q producing two partial beams separately supplied to at least one beam deflection means by total-internal reflection along the common path interferometer. The light of the interferometer branches from transmitted light of the one interferometer branch and reflected light of the other interferometer branch is made to interfere at a partly transmissive beam splitter layer to cause constructive interference C and destructive interference D of the wavefronts from the two different portions P and Q of the pupil.