G02B21/00

Microscope Apparatus, Sample Refractive Index Measurement Method For Microscope Apparatus, And Sample Refractive Index Measurement Program For Microscope Apparatus
20230236403 · 2023-07-27 ·

A microscope apparatus comprises: an illumination optical system that guides light from a light source to a sample; a detection unit that detects light from the sample; a detection optical system that has an objective lens and guides light from the sample to the detection unit; a mask that allows a portion of light from the sample and light from the light source to pass therethrough, and blocks the other portion; a mask-switching unit that changes mask patterns of the mask; a microscope control unit; and an information-processing device. The microscope control unit controls the mask-switching unit to change mask patterns. The information-processing device obtains information about the amount of movement of the focus position of the optical system including the objective lens when mask patterns are changed, and calculates the refractive index of the sample based on the obtained information about the amount of movement of the focus position.

SURGICAL MICROSCOPE SYSTEM AND MICROSCOPE CAMERA ADAPTER
20230003986 · 2023-01-05 ·

The present disclosure relates to a surgical microscope system and a microscope camera adapter that enable various types of adjustment in a camera adapter connecting the cameras that capture a three-dimensional image, with right and left cameras simultaneously. Of respective right and left lens groups that constitute respective focus lenses, right and left lenses between lenses closest to a side of an objective lens and lenses closest to sides of eye lenses are simultaneously moved by the same distance according to a setting value, by which focus is adjusted. The present invention can be applied to a surgical microscope system.

METHOD AND SYSTEM FOR GENERATING A CHROMATICALLY MODIFIED IMAGE OF COMPONENTS IN A MICROSCOPIC SLIDE
20230005185 · 2023-01-05 · ·

A method (400) and a system (200) for generating a chromatically modified image of one or more components on a microscopic slide (303) is disclosed. In one aspect of the invention, the method includes obtaining the image of the one or more components on the microscopic slide (303). Additionally, the method (400) includes processing the image to identify the one or more components. The method (400) further includes segmenting at least one part of the one or more components identified from the image. Furthermore, the method (400) includes chromatically modifying the at least one part of the one or more components and generating a chromatically modified image of the one or more components.

METHOD, ARRANGEMENT AND MICROSCOPE FOR THREE-DIMENSIONAL IMAGING IN MICROSCOPY USING AN ASYMMETRIC PSF
20230236400 · 2023-07-27 ·

A method, an arrangement for microscopy and a microscope for three-dimensional imaging in microscopy, in which aberrations of a specimen detection radiation coming from a specimen are corrected in a detection beam path by means of a correction element and the corrected specimen detection radiation is captured in a spatially resolved form. The inventions are distinguished by the fact that a best-possible correction setting of the correction element, with which aberrations occurring at the time are reduced as much as possible, is determined; and, on the basis of the best-possible correction setting, a flawed correction setting is determined, a setting with which aberrations occurring lead to an asymmetric point spread function of the specimen detection radiation.

METHOD, ARRANGEMENT AND MICROSCOPE FOR THREE-DIMENSIONAL IMAGING IN MICROSCOPY USING AN ASYMMETRIC PSF
20230236400 · 2023-07-27 ·

A method, an arrangement for microscopy and a microscope for three-dimensional imaging in microscopy, in which aberrations of a specimen detection radiation coming from a specimen are corrected in a detection beam path by means of a correction element and the corrected specimen detection radiation is captured in a spatially resolved form. The inventions are distinguished by the fact that a best-possible correction setting of the correction element, with which aberrations occurring at the time are reduced as much as possible, is determined; and, on the basis of the best-possible correction setting, a flawed correction setting is determined, a setting with which aberrations occurring lead to an asymmetric point spread function of the specimen detection radiation.

SPIM microscope with a sequential light sheet

A SPIM-microscope (Selective Plane Imaging Microscopy) and a method of operating the same having a y-direction illumination light source and a z-direction detection light camera. An x-scanner generates a sequential light sheet by scanning the illumination light beam in the x-direction. An electronic zoom is provided that is adapted to change the scanning length in the x-direction independently of a focal length of the illumination light beam and a size of the light sheet in the y-direction and in the z-direction, wherein the number of image pixels in x-direction is maintained unchanged by the electronic zoom independently of the scanning length in x-direction that has been selected.

Optical distortion correction for imaged samples
11568522 · 2023-01-31 · ·

Techniques are described for dynamically correcting image distortion during imaging of a patterned sample having repeating spots. Different sets of image distortion correction coefficients may be calculated for different regions of a sample during a first imaging cycle of a multicycle imaging run and subsequently applied in real time to image data generated during subsequent cycles. In one implementation, image distortion correction coefficients may be calculated for an image of a patterned sample having repeated spots by: estimating an affine transform of the image; sharpening the image; and iteratively searching for an optimal set of distortion correction coefficients for the sharpened image, where iteratively searching for the optimal set of distortion correction coefficients for the sharpened image includes calculating a mean chastity for spot locations in the image, and where the estimated affine transform is applied during each iteration of the search.

Optical distortion correction for imaged samples
11568522 · 2023-01-31 · ·

Techniques are described for dynamically correcting image distortion during imaging of a patterned sample having repeating spots. Different sets of image distortion correction coefficients may be calculated for different regions of a sample during a first imaging cycle of a multicycle imaging run and subsequently applied in real time to image data generated during subsequent cycles. In one implementation, image distortion correction coefficients may be calculated for an image of a patterned sample having repeated spots by: estimating an affine transform of the image; sharpening the image; and iteratively searching for an optimal set of distortion correction coefficients for the sharpened image, where iteratively searching for the optimal set of distortion correction coefficients for the sharpened image includes calculating a mean chastity for spot locations in the image, and where the estimated affine transform is applied during each iteration of the search.

Apparatus and method for capturing an image

Apparatus and method for capturing an image having a detection beam path for guiding detection radiation from a sample to a detector having a plurality of detector elements. The detector has no more than ten and, preferably, four or five detector elements; and an evaluation unit, which is configured to carry out an evaluation in accordance with the Airyscan method on the image data captured by means of the detector and which generates a high-resolution image.

Microscope system

An acquisition condition is decided for a second image of improved quality. Values x.sub.i resulting from down sampling brightness values of an input first image are accepted by an input layer. A filter is scanned and a convolutional computation performed in a convolutional layer. Outputs z.sub.1 to z.sub.4 of the convolutional layer and a first image acquisition condition v=(v.sub.1, v.sub.2, v.sub.3, v.sub.4) of the first image are accepted by an output layer and a second acquisition condition y is computed by the output layer.