G02B21/00

INSPECTION SYSTEM INCLUDING REFERENCE SPECIMEN AND METHOD OF FORMING SEMICONDUCTOR DEVICE

An inspection system includes a main support die configured to receive a target specimen; an auxiliary support die adjacent to the main support die and configured to receive a reference specimen; a cleaning device configured to remove contaminants from the reference specimen; an objective lens unit configured to direct light to main support die from a light source adjacent to the objective lens unit; a spectroscope between the objective lens unit and the light source; a detector adjacent to the objective lens unit; an imaging device between the objective lens unit and the detector; and a computer system in communication with the detector.

DEVICE FOR ANALYZING LARGE-AREA SAMPLE BASED ON IMAGE, DEVICE FOR ANALYZING SAMPLE BASED ON IMAGE BY USING DIFFERENCE IN MEDIUM CHARACTERISTIC, AND METHOD FOR MEASURING AND ANALYZING SAMPLE USING THE SAME
20230215194 · 2023-07-06 · ·

Provided are a device for analyzing a large-area sample based on an image, a device for analyzing a sample based on an image by using a difference in medium characteristic, and a method for measuring and analyzing a sample by using the same. The device for analyzing a large-area sample includes a first sensor array including sensors disposed while being spaced apart from each other in a first direction, a second sensor array including sensors disposed while being spaced apart from each other in the first direction, and spaced apart from the first sensor array in a second direction, and a control unit that obtains image data for a cell included in the sample by using sensing data of the sensor on the sample, in which the sample is interposed between the first sensor array and the second sensor array.

Data Carrier, Reading Method and System Utilizing Super Resolution Techniques
20230214617 · 2023-07-06 ·

The present invention relates to a method of reading out information from a data carrier and to a data carrier utilizing the concept of structured-illumination microscopy or saturated structured-illumination microscopy.

METHOD, COMPUTING UNIT AND SYSTEM FOR DETERMINING A VALUE FOR EACH OF AT LEAST THREE SETTING PARAMETERS BY MEANS OF AN INPUT UNIT IN THE FORM OF A GRAPHICAL USER-INTERFACE

A computer-implemented method for determining a value for at least three setting parameters by means of an input unit in the form of a graphical user interface with an input cursor positionable in an input area is provided. At least two of the at least three setting parameters can be set independently of one another. The method includes determining a position of the input cursor within the input area; determining a coordinate of the position of the input cursor for each particular setting parameter of the at least three setting parameters as a function of a distance in each case of the position of the input cursor from at least one coordinate origin allocated to the particular setting parameter; and determining a value for each particular setting parameter of the at least three setting parameters as a function of the coordinate determined for each particular setting parameter.

FLUID IMMERSION CONTROL FOR INVERTED MICROSCOPY

A fluid immersion control system may use a common electrode along with a plurality of sensor electrodes at a distal portion of an immersion microscope objective to monitor electrical resistance of a fluid as an indication of presence of a fluid layer used for immersion microscopy. The fluid immersion control system may activate replenishment of the fluid when the resistance indicates that a diameter of the microscope objective is not immersed in the fluid.

Composite microscope employing two-photon excitation and stimulated emission depletion techniques

A two-photon stimulated emission depletion composite microscope, comprising a two-photon imaging unit (100) and an STED imaging unit (200), wherein the two-photon imaging unit (100) can be used for a relatively thick sample, and the STED super-resolution imaging unit can be used for a region of interest on a surface of a sample, and the microscope makes light spots generated by an excitation light and a depletion light after being focused by an objective lens (OL) accurately coincide in a three-dimensional distribution. The two-photon stimulated emission depletion composite microscope (10) integrates two functions of STED imaging and two-photon imaging and makes the two types of light spots generated by an excitation light and a depletion light after being focused by an objective lens accurately coincide in a three-dimensional distribution, thereby providing a powerful tool for cutting-edge biomedical research.

Method for detecting a binding of antibodies from a patient sample to double-stranded DNA using Crithidia luciliae cells and fluorescence microscopy

A method and a device are useful for detecting a binding of autoantibodies from a patient sample to double-stranded deoxyribonucleic acid (DNA) using Crithidia luciliae cells by fluorescence microscopy and by digital image processing.

Device and method for measuring central location of single molecule using structured illumination and phase detection

According to the present disclosure, an optical signal emitted from a single molecule is received to measure a central location of the single molecule while changing a phase of a structured illumination having a periodic pattern to measure a phase of a pattern in which a fluorescence intensity is periodically changed in accordance with a distance between the pattern and the single molecule while displacing the periodic pattern by a specific interval to measure the central location of the single molecule, thereby improving an accuracy of the central location of the single molecule with low photons and as a result, the resolution of the image may be enhanced.

USING FLIM FOR BIOPSY BEFORE CHEMICAL FIXATION
20230213448 · 2023-07-06 ·

A method is provided comprising: positioning a slide that includes a concave region that is formed in a top surface of the slide and that can contain an object, such that a focal point of an objective lens of a fluorescence lifetime imaging microscopy (FLIM) device is within an area of the concave region between a bottom surface of the concave region and the top surface of the slide; and using the FLIM device to capture a sequence of wide field images of a portion of the object within a field of view of the objective lens.

Microscopy method and microscope for producing an image of an object

A microscopy method is for producing an electronic image of an object, wherein the object is imaged with an adjustable optical imaging scale on an image detector. The method includes: selecting a parameter for the electronic image, wherein the parameter can be influenced by the optical imaging scale and differs from the image field dimensions, and setting a setpoint value range for the parameter, setting a total imaging scale for the electronic image, wherein adjusting or controlling the parameter of the electronic image is implemented such that, at the same time, the parameter of the electronic image lies in the specified setpoint value range with a tolerance and the set total imaging scale is obtained, wherein the optical imaging scale forms a basis for a manipulated variable of the adjustment or closed-loop control and a digital image magnification is carried out on the basis of the set total imaging scale.