Patent classifications
G03H5/00
Wideband microstrip antennas and antenna arrays
There is provided a wideband patch antenna and an antenna array. The antenna includes a dielectric substrate of a rectangle shape, a radiation patch formed on a top surface of the dielectric substrate, a coupling patch formed on the top surface of the dielectric substrate and extending from a side of the dielectric substrate to a position from the radiation patch by a distance, a metal support arranged on the lower surface of the dielectric substrate and extending from the edge of the lower surface of the dielectric substrate downward to the ground, a layer of air having a predetermined thickness being formed between the lower surface of the dielectric substrate and the ground. According to the embodiments, it is possible to improve the directivity of the wideband microstrip antenna while maintaining its small size.
Systems and methods for performing self-interference incoherent digital holography
In one embodiment, a self-interference incoherent digital holography system including a light sensor and a diffractive filter configured to receive light from an object to be holographically imaged and generate holographic interference patterns on the light sensor. A self-interference incoherent digital holography system comprising: a light sensor; and a diffractive filter configured to receive light from an object to be holographically imaged and generate holographic interference patterns on the sensor.
Systems and methods for performing self-interference incoherent digital holography
In one embodiment, a self-interference incoherent digital holography system including a light sensor and a diffractive filter configured to receive light from an object to be holographically imaged and generate holographic interference patterns on the light sensor. A self-interference incoherent digital holography system comprising: a light sensor; and a diffractive filter configured to receive light from an object to be holographically imaged and generate holographic interference patterns on the sensor.
SAMPLE HOLDING MECHANISM, MANUFACTURING METHOD FOR SAME, AND CHARGED PARTICLE BEAM DEVICE
Continuous and automatic acquisition of electron beam holograms is made possible by using a sample holding mechanism that includes a sample end region that has a linear shape that is suited for electron beam holography, separates a thin-film rectangular window with an extreme-thin support film that supports a sample being disposed and a rectangular hole that has a linear-shaped edge and through which a reference wave is transmitted from each other, and configures a part of a layer that is thicker than the support film.
SAMPLE HOLDING MECHANISM, MANUFACTURING METHOD FOR SAME, AND CHARGED PARTICLE BEAM DEVICE
Continuous and automatic acquisition of electron beam holograms is made possible by using a sample holding mechanism that includes a sample end region that has a linear shape that is suited for electron beam holography, separates a thin-film rectangular window with an extreme-thin support film that supports a sample being disposed and a rectangular hole that has a linear-shaped edge and through which a reference wave is transmitted from each other, and configures a part of a layer that is thicker than the support film.
BIFOCAL ELECTRON MICROSCOPE
Methods for using a single electron microscope system for investigating a sample with twin electron beams having different focal lengths include the steps of emitting electrons toward the sample, forming the electrons into a two beams, and then modifying the focal properties of at least one of the two beams such that they have different focal planes. Once the two beams have different focal planes, the first electron beam is focused at the sample, and the second electron beam is focused so that it acts as a TEM beam that is parallel beam when incident on the sample. Emissions resultant from the first electron beam and the TEM beam being incident on the sample can then be detected by a single detector or detector array and used to generate a TEM image.
BIFOCAL ELECTRON MICROSCOPE
Methods for using a single electron microscope system for investigating a sample with twin electron beams having different focal lengths include the steps of emitting electrons toward the sample, forming the electrons into a two beams, and then modifying the focal properties of at least one of the two beams such that they have different focal planes. Once the two beams have different focal planes, the first electron beam is focused at the sample, and the second electron beam is focused so that it acts as a TEM beam that is parallel beam when incident on the sample. Emissions resultant from the first electron beam and the TEM beam being incident on the sample can then be detected by a single detector or detector array and used to generate a TEM image.
Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital imaging system and methods for same that can include an x-ray source for radiographic imaging; a beam shaping assembly, an x-ray grating interferometer including a phase grating and an analyzer grating; and an x-ray detector; where the source grating, the phase grating, and the analyzer grating are detuned and a plurality of uncorrelated reference images are obtained for use in imaging processing with the detuned system.
Large FOV phase contrast imaging based on detuned configuration including acquisition and reconstruction techniques
Embodiments of methods and apparatus are disclosed for obtaining a phase-contrast digital imaging system and methods for same that can include an x-ray source for radiographic imaging; a beam shaping assembly, an x-ray grating interferometer including a phase grating and an analyzer grating; and an x-ray detector; where the source grating, the phase grating, and the analyzer grating are detuned and a plurality of uncorrelated reference images are obtained for use in imaging processing with the detuned system.
INCOHERENT FLUORESCENCE DIGITAL HOLOGRAPHIC MICROSCOPY USING TRANSMISSION LIQUID CRYSTAL LENS
A new optical arrangement that creates high efficiency, high quality Fresnel Incoherent Correlation Holography (FINCH) holograms using transmission liquid crystal GRIN (TLCGRIN) diffractive lenses has been invented. This is in contrast to the universal practice in the field of using a reflective spatial light modulator (SLM) to separate sample and reference beams. Polarization sensitive TLCGRIN lenses enable a straight optical path, have 95% transmission efficiency, are analog devices without pixels and are free of many limitations of reflective SLM devices. An additional advantage is that they create an incoherent holographic system that is achromatic over a wide bandwidth. Two spherical beams created by the combination of a glass and a polarization sensitive TLCGRIN lenses interfere and a hologram is recorded by a digital camera. FINCH configurations which increase signal to noise ratios and imaging speed are also described.