Patent classifications
G11C8/00
Memory system for access concentration decrease management and access concentration decrease method
A spatial disturbance that occurs when an access is concentrated in a specific memory area in a volatile semiconductor memory like DRAM is properly solved by a memory controller. The memory controller includes a concentration access detection part generating a concentration access detection signal when an address for accessing a specific memory area among memory areas of volatile semiconductor memory is concentratedly received. In the case that the concentration access detection signal is generated, the memory controller includes a controller for easing or preventing corruption of data which memory cells of the specific memory area and/or memory cells of memory areas adjacent to the specific memory area hold.
Compute near memory with backend memory
Examples herein relate to a memory device comprising an eDRAM memory cell, the eDRAM memory cell can include a write circuit formed at least partially over a storage cell and a read circuit formed at least partially under the storage cell; a compute near memory device bonded to the memory device; a processor; and an interface from the memory device to the processor. In some examples, circuitry is included to provide an output of the memory device to emulate output read rate of an SRAM memory device comprises one or more of: a controller, a multiplexer, or a register. Bonding of a surface of the memory device can be made to a compute near memory device or other circuitry. In some examples, a layer with read circuitry can be bonded to a layer with storage cells. Any layers can be bonded together using techniques described herein.
Latch circuit, memory device and method
A latch circuit includes a latch clock generator configured to generate a latched clock signal based on a clock signal and a first enable signal, and an input latch coupled to the latch clock generator to receive the latched clock signal. The input latch is configured to generate a latched output signal based on the latched clock signal and an input signal. In response to the first enable signal having a disabling logic level, the latch clock generator is configured to set a logic level of the latched clock signal to a corresponding disabling logic level, regardless of the clock signal. The latch clock generator includes a first inverter configured to generate an inverted signal of the first enable signal, and a NAND gate coupled to the first inverter to receive the inverted signal of the first enable signal. The NAND gate is configured to generate the latched clock signal based on the clock signal and the inverted signal of the first enable signal.
Data auto-relocation in an integrated memory assembly
Technology is disclosed for relocating data in a non-volatile storage system. An integrated memory assembly has a control die and a memory die that contains the memory cells. The control die contains control circuitry that relocates data from one set of physical addresses on the memory die to another set of physical addresses on the memory die. This relocation results in a change of a mapping between logical addresses for the data and the physical addresses for the data. The control circuitry may update an L2P table on the memory die after the relocation to map the logical addresses of the data to the second set of physical addresses. The control die may construct a validity bitmap, which specifies whether data at a physical address is valid or invalid. The foregoing reduces data transfer between the integrated memory assembly and a memory controller, which saves time and power.
Word line structures for three-dimensional memory arrays
Methods, systems, and devices for word line structures for three-dimensional memory arrays are described. A memory device may include word line structures that support accessing memory cells arranged in a three-dimensional level architecture. The word line structures may be arranged above a substrate and be separated from each other by respective dielectric layers. Each word line structure may include word line members and a word line plate that is connected to each word line member. Each word line plate may include a contact that may be coupled with a word line decoder operable to bias the word line plate. To couple the word line plate to the word line decoder, the memory device may include first vias that extend through holes in the word line plates and are coupled with second vias that extend from a respective contact through openings in the word line plates above the contact.
Distribution of Electronic Market Data
A system and method are provided that, among other things, can reduce the burden on receiving computers, increase data throughput, reduce system failure, and provide components of a scalable and flexible network architecture. Specifically, the system and method provide a multichannel-multicast network environment for use in dynamically assigning data to channels. This configuration is particularly useful in a trading network environment, as it effectively performs channel reassignments in a way not to disturb the receipt of the underlying data. While the example embodiments described herein pertain to electronic trading, the principles of the present invention may be equally applied in other environments where the advantages presented herein are beneficial.
First in first out memory and memory device
A First In First Out (FIFO) memory includes storage units. Outputs of the storage units are connected to one node. The storage unit includes storage sub-units, a selector, and a drive. An input of the selector is connected to outputs of the storage sub-units. An input of the drive is connected to an output of the selector. Driven by a first pointer signal, the storage sub-units receive storage data. Driven by a second pointer signal, the drive outputs the storage data.
Systems and methods for stabilizing cell threshold voltage
The present disclosure relates to a memory device comprising a plurality of memory cells, each memory cell being programmable to a logic state corresponding to a threshold voltage exhibited by the memory cell in response to an applied voltage, and a logic circuit portion operatively coupled to the plurality of memory cells, wherein the logic circuit portion is configured to scan memory addresses of the memory device, and to generate seasoning pulses to be applied to the addressed pages of the memory device. A related electronic system and related methods are also disclosed.
DRAM memory
A DRAM memory includes: a substrate; a plurality of memory banks arranged in rows and columns on the substrate, each memory bank is divided into three memory blocks in the column direction. Each memory block has a number of memory cells arranged in rows and columns. Dividing each memory bank into three memory blocks in the column direction shortens the length of the memory bank in the row direction, as each memory bank has a certain capacity, so a large drive is no longer required. In addition, the distance from the control circuit and the data transmission circuit to the corresponding memory cell in the memory array in each memory bank will be shorter too, reducing parasitic resistance and parasitic capacitance generated from the data transmission circuit. As a result, the data transmission rate and data transmission accuracy are improved. The overall power consumption is reduced.
Write circuit of memory device
A device includes memory banks, a first pair of write data wirings, a second pair of write data wirings and a global write circuit. The first pair of write data wirings is connected to a first group among the memory banks. The second pair of write data wirings is connected to a second group among the memory banks. In response to a first clock signal, the global write circuit generates a first global write signal and a first complement global write signal transmitted to the first group among the memory banks through the first pair of write data wirings. In response to a second clock signal, the global write circuit generates a second global write signal and a second complement global write signal transmitted to the second group among the memory banks through the second pair of write data wirings.