Systems, methods and apparatus to program a memory cell to have a threshold voltage to a level representative of one value among more than two predetermined values. A first voltage pulse is driven across the memory cell to cause a predetermined current to go through the memory cell. The first voltage pulse is sufficient to program the memory cell to a level representative of a first value. To program the memory cell to a level representative of a second value, a second voltage pulse, different from the first voltage pulse, is driven across the memory cell within a time period of residual poling in the memory cell caused by the first voltage pulse.

A first command directed to a first package of a plurality of memory packages, wherein the first command is issued to a command processor to be applied to the first package is received. A total number of pending commands directed to the first package satisfies a first threshold criterion is determined. Responsive to determining that the total number of pending commands directed to the first package satisfies the first threshold criterion, whether a second command directed to a second package is requesting transmission is determined. Responsive to the second command directed to the second package is requesting transmission, whether the first command comprises a write command is determined. Responsive to determining that the first command comprises a write command, execute a command directed to the second package.

Methods and systems include memory devices with a memory array comprising a plurality of memory cells. The memory devices include a control circuit operatively coupled to the memory array and configured to receive a read request for data and to apply a first voltage at a first time duration to the memory array based on the read request. The control circuit is additionally configured to count a number of the plurality of memory cells that have switched to an active read state based on the first voltage and to derive a second time duration. The control circuit is further configured to apply a second voltage at the second duration to the memory array. The control circuit is also configured to return the data based at least on bits stored in a first and a second set of the plurality of memory cells.

A neuromorphic device includes a plurality of cell tiles including a cell array including a plurality of memory cells storing a weight of a neural network, a row driver connected to the plurality of memory cells, and cell analog-digital converters connected to the plurality of memory cells and converting cell currents into a plurality of pieces of digital cell data, a reference tile including a plurality of reference cells, a reference row driver connected to the plurality of reference cells, and reference analog-digital converters connected to the plurality of reference cells and converting reference currents read via the plurality of reference column lines into a plurality of pieces of digital reference data, and a comparator circuit configured to compare the plurality of pieces of digital cell data with the plurality of pieces of digital reference data, respectively.

Disclosed are a method of operating a selector device, a method of operating a nonvolatile memory apparatus to which the selector device is applied, an electronic circuit device including the selector device, and a nonvolatile memory apparatus. The method of operating the selector device controls access to a memory element, and includes providing the selector device including a switching layer and first and second electrodes disposed on both surfaces of the switching layer, which includes an insulator and a metal element, and applying a multi-step voltage pulse to the switching layer via the first and second electrodes to adjust a threshold voltage of the selector device, the multi-step voltage pulse including a threshold voltage control pulse and an operating voltage pulse. The operating voltage pulse has a magnitude for turning on the selector device, and the threshold voltage control pulse has a lower magnitude lower than the operating voltage pulse.

A read reference current generator includes a temperature coefficient (TC) controller configured to adjust a temperature coefficient in response to a first control signal and generate a read reference current having an adjusted temperature coefficient, a plurality of replica circuits configured to receive the read reference current and adjust an absolute value of the read reference current with different scale factors to generate a plurality of branch currents, and a plurality of switches configured to control connection of the TC controller and the plurality of replica circuits in response to a second control signal, wherein an equivalent resistance value of each of the plurality of replica circuits corresponds to a multiple of an equivalent resistance value of a data read path, and the data read path includes a selected memory cell and a clamping circuit clamping a voltage level of a selected bit line to a determined value.

A method for writing to a memory is disclosed. The method includes generating a write current that flows to a memory cell of the memory, generating a mirror current that mirrors the write current, and inhibiting application of a write voltage to the memory cell of the memory based on the mirror current. A device that performs the method is also disclosed. A memory that includes the device is also disclosed.

Some embodiments include a memory device and methods of forming the memory device. One such memory device includes a first group of memory cells, each of the memory cells of the first group being formed in a cavity of a first control gate located in one device level of the memory device. The memory device also includes a second group of memory cells, each of the memory cells of the second group being formed in a cavity of a second control gate located in another device level of the memory device. Additional apparatus and methods are described.

A determiner which learns acceleration measurement data which has been obtained by an accelerated aging test and indicates that a facility changes from a normal state to an aged state, and advance label data which is obtained by giving a label to data indicating characteristics of aging in the acceleration measurement data. Measurement data of aging diagnosis is obtained from the facility which is operating, teacher aging degree label data is found from a record of maintenance of the facility, and additional data is obtained from the measurement data and the teacher aging degree label data. When a difference between predicted aging degree label data and teacher aging degree label data is greater than a predetermined value, learning data is selected as additional learning data. The additional learning data is learned to update the determiner.

Methods, systems, and devices for tapered memory cell profiles are described. A tapered profile memory cell may mitigate shorts in adjacent word lines, which may be leveraged for accurately reading a stored value of the memory cell. The memory device may include a self-selecting memory component with a bottom surface and a top surface opposite the bottom surface. In some cases, the self-selecting memory component may taper from the bottom surface to the top surface. In other examples, the self-selecting memory component may taper from the top surface to the bottom surface. The top surface of the self-selecting memory component may be coupled to a top electrode, and the bottom surface of the self-selecting memory component may be coupled to a bottom electrode.