An apparatus useful for creating and measuring states of an entangled system, comprising a pair of interacting multi-level systems, each of systems comprising a state |g>; a state |r>, and state |r*>. One or more first electromagnetic fields excite a first transition between the ground state |g> and the state |r> to create an entangled system. One or more second electromagnetic fields are tuned between the state |r> and the intermediate state |r*> so that any population of the systems in |r*> are dark to a subsequent detection of a population in the systems in |g>, providing a means to distinguish the entangled system in the state |g> and the entangled system in the state |r>. In one or more examples, the systems comprise neutral Rydberg atoms.

A method is presented, which includes trapping a charged particle at a first position using an electromagnetic trap and providing a static magnetic field at the first position such that a qubit transition of the charged particle is defined, and providing, using an entangling electrode, an oscillating magnetic field. The oscillating magnetic field present at the first position does not contain a polarisation component which directly couples to the qubit transition. The oscillating magnetic field has a spatial gradient at the first position, of the polarisation component of the oscillating magnetic field which couples the qubit transition to the motion of the charged particle.

A method is presented, which includes trapping a charged particle at a first position using an electromagnetic trap and providing a static magnetic field at the first position such that a qubit transition of the charged particle is defined, and providing, using an entangling electrode, an oscillating magnetic field. The oscillating magnetic field present at the first position does not contain a polarisation component which directly couples to the qubit transition. The oscillating magnetic field has a spatial gradient at the first position, of the polarisation component of the oscillating magnetic field which couples the qubit transition to the motion of the charged particle.

A method for enhancing vacuum tolerance of optical levitation particles includes steps of: (1) turning on a trapping laser to form an optical trap, loading the particles to an effective capture region of the optical trap, and collecting scattered light signals; (2) turning on the preheating laser, and directing a preheating laser beam to the captured particles; (3) adjusting a power of the preheating laser until a particle heating rate is larger than a heat dissipation rate; (4) turning on the vacuum pump, and stopping evacuating when a vacuum degree is greater than a vacuum inflection point of a first reduction of the effective capture region of the optical trap; and (5) turning off the preheating laser when the scattered light signals collected by the photodetector no longer changes. The present invention improves a stable capture probability of the particles in high vacuum environment.

A technique is disclosed for electro-optically inducing a force to fabricated samples and/or devices with laser light. The technique uses the interaction of the oscillating electric field of the laser beam in opposition with the electric field produced by an appropriate electric charge carrier to achieve a net repulsive (or attractive) force on the component holding the electric charge. In one embodiment, force is achieved when the field near the charge carrier is modulated at a subharmonic of the electric field oscillation frequency of the laser and the relative phases of the light field and electric charge carrier field are controlled to provide optimal repulsion/attraction. The effect is scalable by applying the technique to an array of charge carrier fields sequentially as well as using higher power lasers and higher carrier field voltages.

A micro-thrust and micro-impulse application device and method generates micro-thrust to a target by light pressure action from laser reflection. The device comprises a laser, a laser adjustment device, a beam splitter, a shutter, a reflector, and a laser power meter. Laser beam is generated by laser, adjusted by laser adjustment device, and divided into two paths by beam splitter. Laser in one path is measured at laser power meter; power measured determines magnitude for micro-thrust. In another path, it irradiates on the reflector on the target via shutter for generating micro-thrust. Light reflected by the reflector arrives at another laser power meter. Power of two laser paths are measured in real time by two laser power meters, acting micro-thrust is calculated by combining parameters including reflectivity and incident angle of laser irradiating the reflector, and light output power of the laser is adjusted in real time.

A system is disclosed for the examination and inspection of integrated devices such as integrated circuits using 3-D laminography. X-rays are transmitted through the integrated device, and are incident on a photoemissive structure that absorbs x-rays and emits electrons. The electrons emitted by the photoemissive structure are shaped by an electron optical system to form a magnified image of the emitted electrons on a detector. This magnified image is then recorded and processed. In some embodiments, the incidence angle of the x-rays is varied to gather multiple images that allow internal three-dimensional structures of the integrated device to be determined using computed laminography. In some embodiments, the recorded images are compared with reference data to enable inspection for manufacturing quality control.

A system is disclosed for the examination and inspection of integrated devices such as integrated circuits using 3-D laminography. X-rays are transmitted through the integrated device, and are incident on a photoemissive structure that absorbs x-rays and emits electrons. The electrons emitted by the photoemissive structure are shaped by an electron optical system to form a magnified image of the emitted electrons on a detector. This magnified image is then recorded and processed. In some embodiments, the incidence angle of the x-rays is varied to gather multiple images that allow internal three-dimensional structures of the integrated device to be determined using computed laminography. In some embodiments, the recorded images are compared with reference data to enable inspection for manufacturing quality control.

A loading assembly configured for providing atomic objects to an atomic object confinement apparatus is provided. The loading assembly comprises one or more ovens. Each oven (a) comprises a respective oven nozzle and (b) is configured to generate a respective atomic flux of a respective atomic species via the respective oven nozzle. The loading assembly comprises a mirror array and a magnet array configured to, when optical beams are provided to the mirror and magnet assembly, generate a two-dimensional magneto-optical trap (2D MOT). The 2D MOT is configured to generate a substantially collimated atomic beam from the respective atomic fluxes generated by the one or more ovens. The loading assembly further comprises a differential pumping tube defining a beam path. The differential pumping tube is configured to provide the substantially collimated atomic beam via the beam path. The respective oven nozzle of each of the one or more ovens is misaligned with the beam path and the 2D MOT is configured to provide the substantially collimated atomic beam in alignment with the beam path.

A method of performing a computation using a quantum computer includes generating a first laser pulse and a second laser pulse to cause entanglement interaction between a first trapped ion and a second trapped ion of a plurality of trapped ions that are aligned in a first direction, each of the plurality of trapped ions having two frequency- separated states defining a qubit, and applying the generated first laser pulse to the first trapped ion and the generated second laser pulse to the second trapped ion. Generating the first laser pulse and the second laser pulse includes stabilizing the entanglement interaction between the first and second trapped ions against fluctuations in frequencies of collective motional modes of the plurality of trapped ions in a second direction that is perpendicular to the first direction.